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16th International-Federation-of-Automatic-Control (IFAC) Conference on Programmable Devices and Embedded Systems PDES

作者： Hudec, Jan Slovak Univ Technol Bratislava Fac Informat & Informat Technol Inst Comp Engn & Appl Informat Bratislava 84216 Slovakia

The paper deals with automatic software based test generation for processors as basic blocks of current complex systems on chip and embedded systems. Testing processors needs continually new test generation methods, algorithms and test application techniques for their verification, manufacture and infield testing and reliable life-time run. The functional tests of processors are mainly generated over an instruction set architecture and processor model description. Such types of tests are serving as additional tests to structural testing or as tests used in verification. They run in similar form and frequency as real programmes. Such tests are categorized as the software-based self tests. A metric for quality evaluation of the software-based tests is obviously provided by code coverage of a processor model. A functional test generation method is based on vhdl model of processors and genetic algorithms with using various evolutionary strategies. The contribution to the SBST methods based on GAs using the latest defined ES was identified. Functionality and effectiveness of the developed methods were evaluated in the implemented system AGenMIX with enhanced function of genetic algorithms computation over three types of RISC processor. (C) 2019, IFAC (International Federation of Automatic Control) Hosting by Elsevier Ltd. All rights reserved.

关键词： Processor functional test generation software-based self test genetic algorithms evolutionary strategies vhdl code coverage fitness function test simulation verification and validation

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Enhancement of Adaptive Software-Based Self Test Generation of Embedded Processors Cores

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IFAC-PapersOnLine 2019年第27期52卷 56-61页

作者： Ján Hudec Institute of Computer Engineering and Applied Informatics Faculty of Informatics and Information Technologies Slovak University of Technology 84216 Bratislava Slovakia

The paper deals with automatic software-based test generation for processors as basic blocks of current complex systems on chip and embedded systems. Testing processors needs continually new test generation methods, algorithms and test application techniques for their verification, manufacture and infield testing and reliable life-time run. The functional tests of processors are mainly generated over an instruction set architecture and processor model description. Such types of tests are serving as additional tests to structural testing or as tests used in verification. They run in similar form and frequency as real programmes. Such tests are categorized as the software-based self tests. A metric for quality evaluation of the software-based tests is obviously provided by code coverage of a processor model. A functional test generation method is based on vhdl model of processors and genetic algorithms with using various evolutionary strategies. The contribution to the SBST methods based on GAs using the latest defined ES was identified. Functionality and effectiveness of the developed methods were evaluated in the implemented system AGenMIX with enhanced function of genetic algorithms computation over three types of RISC processor.

关键词： Processor functional test generation software-based self test genetic algorithms evolutionary strategies vhdl code coverage fitness function test simulation verification validation

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Automatic Software-Based Self Test Generation for Embedded Processors

Automatic Software-Based Self Test Generation for Embedded P...

引用

15th IFAC/IEEE Conference on Programmable Devices and Embedded Systems (PDeS)

作者： Hudec, Jan Slovak Univ Technol Bratislava Inst Comp Engn & Appl Informat Fac Informat & Informat Technol Bratislava 84216 Slovakia

The paper deals with automatic software-based test generation for processors. Processors are basic blocks of current complex systems on chip and embedded systems. Processors testing can be extended by functional tests or using various application programs. Such types of tests are serving as additional tests to structural testing or as tests used in verification. Functional tests (programs) are generated over an instruction set architecture and processor model description. A metric for quality evaluation of the software-based tests is obviously provided by code coverage of a processor model. A new functional test generation method is based on vhdl model of processors and genetic algorithms with using various evolutionary strategies. The contribution to the SBST methods based on GAs using the latest defined ES was identified. Functionality and effectiveness of the developed methods were evaluated in the implemented system AGenMIX over two types of RISC processor. (C) 2018, IFAC (International Federation of Automatic Control) Hosting by Elsevier Ltd. All rights reserved.

关键词： Processor functional testing software based self test genetic algorithms evolutionary strategies vhdl code coverage fitness function

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