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检索条件"主题词=automatic concurrency bug detection"
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automatic detection of concurrency bugs through Event Ordering Constraints
Automatic Detection of Concurrency Bugs through Event Orderi...
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Design, Automation and Test in Europe Conference and Exhibition (DATE)
作者: Murillo, Luis Gabriel Wawroschek, Simon Castrillon, Jeronimo Leupers, Rainer Ascheid, Gerd Rhein Westfal TH Aachen Inst Commun Technol & Embedded Syst ICE Aachen Germany
Writing correct parallel software for modern multiprocessor systems-on-chip (MPSoCs) is a complicated task. Programmers can rarely anticipate all possible external and internal interactions in complex concurrent syste... 详细信息
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