In this paper, the impact of Random Telegraph Noise (RTN) on CMOS logic circuits observed in a circuit matrix array is reported. We discuss the behavior of RTN under circuit operation, and reveal that the impact of RT...
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ISBN:
(纸本)9781424491117
In this paper, the impact of Random Telegraph Noise (RTN) on CMOS logic circuits observed in a circuit matrix array is reported. We discuss the behavior of RTN under circuit operation, and reveal that the impact of RTN, which is much smaller than that of within-die variation in a 65nm process, can have a severe effect on the performance of a sequential logic gate under low voltage operation.
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