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检索条件"主题词=constrained-random verification"

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Efficient Sampling of SAT Solutions for Testing 18

Efficient Sampling of SAT Solutions for Testing

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40th ACM/IEEE International Conference on Software Engineering (ICSE)

作者： Dutra, Rafael Laeufer, Kevin Bachrach, Jonathan Sen, Koushik Univ Calif Berkeley Dept EECS Berkeley CA 94720 USA

ISBN: (纸本)9781450356381

In software and hardware testing, generating multiple inputs which satisfy a given set of constraints is an important problem with applications in fuzz testing and stimulus generation. However, it is a challenge to perform the sampling efficiently, while generating a diverse set of inputs which satisfy the constraints. We developed a new algorithm QUICKSAMPLER which requires a small number of solver calls to produce millions of samples which satisfy the constraints with high probability. We evaluate QUICKSAMPLER on large real-world benchmarks and show that it can produce unique valid solutions orders of magnitude faster than other state-of-the-art sampling tools, with a distribution which is reasonably close to uniform in practice.

关键词： sampling stimulus generation constraint-based testing constrained-random verification

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SMTSAMPLER: Efficient Stimulus Generation from Complex SMT Constraints 18

SMTSAMPLER: Efficient Stimulus Generation from Complex SMT C...

引用

37th IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

作者： Dutra, Rafael Bachrach, Jonathan Sen, Koushik Univ Calif Berkeley Dept Elect Engn & Comp Sci Berkeley CA 94720 USA

ISBN: (纸本)9781450359504

Stimulus generation is an essential part of hardware verification, being at the core of widely applied constrained-random verification techniques. However, as verification problems get more and more complex, so do the constraints which must be satisfied. In this context, it is a challenge to efficiently generate random stimuli which can achieve a good coverage of the design space. We developed a new technique SMTSAMPLER which can sample random solutions from Satisfiability Modulo Theories (SMT) formulas with bit-vectors, arrays, and uninterpreted functions. The technique uses a small number of calls to a constraint solver in order to generate up to millions of stimuli. Our evaluation on a large set of complex industrial SMT benchmarks shows that SMTSAMPLER can handle a larger class of SMT problems, outperforming state-of-the-art constraint sampling techniques in the number of samples produced and the coverage of the constraint space.

关键词： constrained-random verification stimulus generation sampling SMT arrays bit-vectors uninterpreted functions

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An Explanation-Based Constraint Debugger

An Explanation-Based Constraint Debugger

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5th International Haifa verification Conference

作者： Rich, Aaron Alexandron, Giora Naveh, Reuven Cadence Design Systems Israel

ISBN: (纸本)9783642192364

Constraints have become a central feature of advanced simulation-based verification. Effective debugging of constraints is an ongoing challenge. In this paper we present Gen Debugger - an innovative GUI-based tool for debugging constraints. Gen Debugger shows how a set of constraints is solved in a step by step flow, allowing the user to easily pick out steps that are key to the buggy behavior. It is unique in that it is designed for dealing with various types of constraint-related problems, not only constraint-conflicts or performance issues. Gen Debugger utilizes principles from the explanation-based debug paradigm [1], in that it displays information justifying each step of the solution. A unique contribution is that it enables the user to easily combine separate explanations of individual steps into a comprehensive full explanation of the constraint-solver's behavior. Gen Debugger was lately released for full production, after an extensive process of evaluation with early access users. Our own experience and our users feedback indicate that Gen Debugger provides highly valuable help in resolving problems found in constraints.

关键词： constrained-random verification Constraint Debugging

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