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algorithmic Translation correction Mechanisms: An End-to-end algorithmic Implementation of English-Chinese Machine Translation

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EAI ENDORSED TRANSACTIONS ON SCALABLE INFORMATION SYSTEMS 2023年第6期10卷

作者： Shi, Lei Shandong Univ Finance & Econ Sch Foreign Studies Jinan 250014 Shandong Peoples R China

INTRODUCTION: Machine translation is a modern natural language processing research field with important scientific and practical significance. In practice, the variation of languages, the limitation of semantic knowledge, and the lack of parallel language resources limit the development of machine ***: This paper aims to avoid duplicating neural networks during the learning process and improve the ability to generalize complex neural network machine translation models with limited ***: Textual material in the source language was studied, and a suitable textual material representation model was used to express complex, high-level, and abstract semantic information. Then, a more efficient neural network machine translation integration model was developed based on the control of written data and algorithms. RESULTS: Data mining must be applied to complex neural network machine translation systems based on transfer learning to standardize finite neural network ***: Neural network-based embedded machine translation systems based on migration training require a small number of labelled samples to improve the system's permeability. However, this adaptive migration learning region approach can easily lead to over-learning problems in neural network machine translation models, thus avoiding excessive correspondences during the learning process and improving the generalization ability of the translation model with limited neural network resources.

关键词： English translation corpus analysis semantic analysis correction algorithm

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Nonrandom quantization errors in timebases

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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 2001年第4期50卷 888-892页

作者： Stenbakken, GN Liu, D Starzyk, JA Waltrip, BC US Dept Commerce Natl Inst Stand & Technol Technol AdmDiv Elect Elect & Elect Engn Lab Gaithersburg MD 20878 USA Ohio Univ Sch Elect Engn & Comp Sci Athens OH 45701 USA

Timebase distortion causes nonlinear distortion of waveforms measured by sampling instruments. When such instruments are used to measure the rms amplitude of the sampled waveforms, such distortions result in errors in the measured root-mean squared (rms) values. This paper looks at the nature of the errors that result from nonrandom quantization errors in an instrument's timebase circuit. Simulations and measurements on a sampling voltmeter show that the errors in measured rms amplitude have a nonnormal probability distribution, such that the probability of large errors is much greater than would be expected from the usual quantization noise model. A novel timebase compensation method is proposed which makes the measured rms errors normally distributed and reduces their standard deviation by a factor of 25. This compensation method was applied to a sampling voltmeter and the improved accuracy was realized.

关键词： compensation correction algorithm quantization sampling timebase voltmeter

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Preliminary Study of the On-orbit Radiometric Traceability and Artifacts for the VIIRS Longwave Infrared Channels during Blackbody Temperature Changes 25

Preliminary Study of the On-orbit Radiometric Traceability a...

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Conference on Infrared Remote Sensing and Instrumentation XXV

作者： Cao, Changyong Wang, Wenhui Blonski, Slawomir Zhang, Bin NOAA Ctr Satellite Applicat & Res College Pk MD USA ERT Inc Laurel MD USA Univ Maryland CICS College Pk MD USA

ISBN: (纸本)9781510612648;9781510612631

The Visible Infrared Imaging Radiometer Suite (VIIRS) has been continuously observing the Earth with global coverage twice daily in the longwave infrared channels since January 20, 2012. These channels are primarily used for cloud detection, and for retrieving sea surface temperatures globally, as well as a number of other applications. The VIIRS sensor data records (SDR), aka level 1b data, have been shown to be accurate and stable at 0.1K level since the data reached validated maturity on March 18, 2014. However, during the scheduled quarterly warm-up/cool-down of the onboard blackbody calibration source, a calibration bias on the order of 0.1 K is introduced. The bias is further amplified by the sea surface temperature (SST) retrieval algorithm up to 0.3 K which causes an apparent spike in the SST product time series. Our previous study [1] reveals that this bias is likely caused by a fundamental assumption on the radiometric traceability of the VIIRS calibration equation, pertaining to the shape of the calibration curve. In this study, we further analyzed the equation and presented an improved correction algorithm known as Ltrace 2. This algorithm attempts to fundamentally reconcile the calibration curve shape assumption such that the calibration bias can be removed during the WUCD with better performance for all bands. Sample test results are presented to show the improvements using this algorithm.

关键词： S-NPP, VIIRS, warmup/cooldown, thermal emissivity bands longwave infrared sea surface temperature calibration anomaly correction algorithm

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AQUARIUS ENGINEERING PHASE ON-ORBIT T_A CALIBRATION

AQUARIUS ENGINEERING PHASE ON-ORBIT T<sub>A</sub> CALIBRATIO...

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IEEE International Geoscience and Remote Sensing Symposium (IGARSS)

作者： Mims, Amanda Ruf, Christopher Univ Michigan Ann Arbor MI 48109 USA

ISBN: (纸本)9781467311595

Aquarius is a passive microwave radiometer operating at L-band that is designed to measure ocean salinity. Launched in June 2011, the instrument has since been the subject of on-orbit calibration to evaluate its performance and characterize its stability. This study addresses external calibration methods, using observed antenna temperatures to characterize instrument behavior by computing the oceanic global average and vicarious cold statistics. Results indicate that a slow drift in antenna temperature is present throughout the mission, as well as shorter time scale variations. Implementation of a noise diode deflection ratio-based correction algorithm mitigates most of the short term variations but the slow drift remains present in both statistics. It is most apparent using the global average statistic. The drift can be largely removed by adjusting the instrument calibration to force agreement between observed and modeled global averages over long time intervals.

关键词： Aquarius Antenna Temperature microwave radiometers instrument calibration CALIBRATION METHODS Time intervals correction algorithm drift drift Drift TEST AUTHORIZATIONS TA tantalum ocean salinity

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Novel Motion Sensorless Control of Single Phase Brushless DC PM Motor Drive, with experiments

Novel Motion Sensorless Control of Single Phase Brushless DC...

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12th International Conference on Optimization of Electrical and Electronic Equipment

作者： Iepure, Liviu Ioan Boldea, Ion Andreescu, Gheorghe Daniel Iles, Dorin Blaabjerg, Frede Univ Politehn Timisoara Dept Elect Machines & Drives Parvan 2 RO-300223 Timisoara Romania Univ Politehn Timisoara Dept Automat & Appl Informat RO-300223 Timisoara Romania Ebm Papst St Georgen GmbH & Co Kg D-78112 St Georgen Romania Aalborg Univ Inst Energy Technol DK-9220 Aalborg Denmark

ISBN: (纸本)9781424470198

A motion sensorless control for single phase permanent magnet brushless d.c. (PM-BLDC) motor drives, based on flux integration and prior knowledge of the PM flux/position characteristic is proposed here and an adequate correction algorithm is adopted, in order to increase the robustness to noise and to reduce the sensitivity to accuracy of flux linkage estimation. An I-f strategy is used for starting, by prescribing a ramped reference frequency and a constant current, and then the seamless transition to close loop sensorless control takes place. The proposed control system is detailed and validated by simulation and experimental results.

关键词： motor drives Sensorless control control systems brushless fundamental frequencies Noise robustness Permanent magnet synchronous machines correction algorithm single phase flux linkage constant current Prior Learning

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Application research of spectrum measurement technology in thin-film thickness wideband monitoring system

Application research of spectrum measurement technology in t...

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9th International Symposium on Laser Metrology

作者： Han Jun Shang Xiao-yan An Yu-ying Jiang Xu Wang Fang Xidian Univ Sch Tech Phys Xian 710071 Peoples R China Xian Technol Univ Sch Optoelect Engn Xian 710032 Peoples R China Xian Inst Appl Opt Xian 710065 Peoples R China

ISBN: (纸本)9780819473981

The correct monitoring of thin-film thickness is one of the main problems during the course of optical thin-film component manufacture, in recent years, the method which is spectrum intensity measurement of thin-film component for controlling thin-film thickness has been one of the most effective methods. When this method is used, how spectrum intensity is real-time, correctly measured is critical. Compared with the conventional method which is mechanical scanning by stepper motor driving the grating of monochromator and receiving by photoelectrical multiplier tube, in structure, the author combines the grating spectrometer with the linear CCD, which makes the problem of spectrum intensity real-time measurement better solved, the result is satisfied. In this paper, the structure of system affecting the spectrum intensity measurement accuracy is analyzed, By experiment, the relative parameters are determined, the spectrum wavelength is calibrated, root-mean-square error is 0.234nm,which is up to the requirement of monitoring wavelength resolution in the course of thin-film deposition;The algorithm is used for the real-time compensation of spectrum intensity measurement data, which make the effect of CCD photoelectrical response non-uniformity and nonlinear less;By changing the integral time magnitude, the rate of signal to noise of the spectrum signal is improved, it satisfies the requirement of real-time thin film thickness control.

关键词： thin-film thickness spectrum intensity correct measurement systemic structure correction algorithm integral time

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Perspectives on integrated metrology and wafer-level control

Perspectives on integrated metrology and wafer-level control

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IEEE International Symposium on Semiconductor Manufacturing

作者： Lensing, Kevin Stirton, Broc Adv Micro Devices Inc Austin TX USA

ISBN: (纸本)9781424411412

In this paper, we will discuss the critical factors that are driving the implementation progress of integrated metrology (IM) and wafer-level Advanced Process Control (APC). We will describe the potential benefits of IM and the engineering roadblocks that have limited the realization of those benefits. Finally, we will describe AMD's approach to solving the wafer-level control problem by using stand-alone metrology, dynamic wafer sampling, and a bias correction algorithm.

关键词： level control metrology correction algorithm Perspective key factors Integrate wafer level Road Barriers bias calibration

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Analysis of Sampling Error in FTIR

Analysis of Sampling Error in FTIR

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3rd International Conference on Photonics and Image in Agriculture Engineering (PIAGENG) - Image Processing and Photonics for Agricultural Engineering

作者： Kang, Ya Chongqing City Management Coll Dep Engi Management Chongqing 401331 Peoples R China

ISBN: (纸本)9780819495587

In Fourier transform infrared spectrometer (FTIR), the optical path difference of laser metrology is applied to increase spectrum measure precision. However, due to the characteristics of laser single frequency and steady frequency, the uneven speed of moving mirror, circuit delay etc. cause the deviation of sampling point. In this paper, based on the interference theory of spectrometer, according to the Fourier contrary transform and methods of error analysis, the theory model between relative error of spectrum measure and the deviation of sampling point is established. Some simulation computations of the model have been done, the result indicates that, as a theory basis, the model can be applied in analyzing the sampling error of spectrometer and correction algorithm.

关键词： infrared technology spectrum measure Fourier contrary transform sampling error correction algorithm

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Nonrandom quantization errors in timebases

Nonrandom quantization errors in timebases

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Instrumentation and Measurement Technology Conference (IMTC 2000)

ISBN: (纸本)0780358902

关键词： compensation correction algorithm quantization sampling timebase voltmeter

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Study of the Efficiency of the Invariant Protection Against Single-Phase Ground Faults in the Microprocessor Terminals

Study of the Efficiency of the Invariant Protection Against ...

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IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus)

作者： Pelenev, Denis N. Abramovich, Boris N. Sychev, Yury A. Babyr, Kirill V. St Petersburg Min Univ Elect Energy & Electromech Dept St Petersburg Russia

ISBN: (纸本)9781728103396

The article presents the results of the study of the efficiency of the invariant protection against single-phase ground faults in the microprocessor terminal of relay protection and automation of microprocessor protection relay unit (MPRU). Necessity of integration algorithms for adaptive protection against ground faults in the structure of microprocessor-based terminals to ensure the selective identification of damaged connection in the case of circuits using the transient resistance is proved. The structural and functional scheme of invariant protection in the software environment for creation of functioning algorithms of the microprocessor terminal of relay protection and automation is developed. It is detected that the use of adaptive algorithms for correction of input parameters of protection in the available terminals of MPRU allows to increase selectivity and provide invariance of the protection action in case of incomplete single-phase ground faults.

关键词： single-phase ground fault correction algorithm invariance hardware and software complex of invariant protection microprocessor protection relay unit

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