检索结果-内蒙古大学图书馆

diffraction pattern indexing and the effect of metal ion implantation on kappa-alumina

SURFACE & COATINGS TECHNOLOGY 1997年第1-2期89卷 62-69页

作者： Perry, AJ Geist, DE Tian, AF Treglio, JR Narasimhan, K LOCKHEED MARTIN DENVERCO 80201 VALENITE INC TROYMI 48084

The X-ray diffraction pattern of kappa-Al2O3 in the form of a coating over a Ti(C,N) interlayer has been indexed up to the 204 peak in terms of the hexagonal super-lattice of the orthorhombic unit cell. The lattice parameters have been derived using silicon as standard of reference;some peak overlaps were present. The coating is characterized by low residual stress with a strong shear stress component, and a low strain distribution;this was not quantified. After a dual metal ion implantation with Ti and Ni, the residual stress in the kappa-Al2O3 was entirely removed, and the lattice parameters were measured as a=0.9624 nm and c=O.8908 nm. In addition, the intensity of the diffraction peaks was reduced to about 85% and the strain distribution of the 002, 200 and 201 peaks increased. It is thought that these effects are due to surface amorphization and the development of a dislocation substructure, respectively.

关键词： kappa alumina diffraction pattern ion implantation residual stress X-ray diffraction

来源：评论

学校读者我要写书评

暂无评论

diffraction pattern by rotated conical tracks in solid state nuclear track detectors

引用

OPTICS AND LASER TECHNOLOGY 2016年 80卷 204-208页

作者： Stevanovic, N. Markovic, V. M. Univ Kragujevac Fac Sci R Domanovic 12 Kragujevac 34000 Serbia

The method for determination of diffraction pattern for irregular 3D objects with application on rotated conical tracks in solid state nuclear track detector (SSNTD) wasdescribed in this paper. The model can be applied for different types of the diffraction (Fresnel, Fraunhofer) and arbitrary shapes of the obstacle. By applying the developed model on conical tracks it was fond that diffraction pattern strongly depends from radius, length and rotation angle of the conical tracks. These dependences were investigated in this paper and results can be applied for determination of inner tracks structure via diffraction pattern. (C) 2016 Elsevier Ltd. All rights reserved.

关键词： diffraction pattern Solid state nuclear track detector

来源：评论

学校读者我要写书评

暂无评论

diffraction pattern due to a trapezoidal air cylinder in a dielectric

引用

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS 2000年第2期27卷 140-144页

作者： Lee, TK Kim, SY Ra, JW Hankuk Aviat Univ Dept Avion Engn Deokyang Gu Koyang Kyonggi Do South Korea Korea Inst Sci & Technol Imaging & Media Res Ctr Seoul 130650 South Korea Korea Adv Inst Sci & Technol Dept Elect Engn Yusong Gu Taejon 305701 South Korea

As a theoretical model of frequency-swept cross-borehole radars for locating deeply buried tunnels with asymmetric cross sections, E-polarized scattering by a trapezoidal air cylinder in a dielectric medium is analyzed. The results of simulations performed by employing the boundary-element method illustrate that the null frequencies corresponding to the upper and lower boundaries of the cylinder are different. Also, the physical mechanism for the occurrences of nulls, which depend on the signal frequency and the observation distance, is presented in detail. (C) 2000 John Wiley & Sons, Inc.

关键词： geophysical scattering cross-borehole radar diffraction pattern trapezoidal cylinder tunnel signature

来源：评论

学校读者我要写书评

暂无评论

diffraction pattern by an empty rectangular cylinder in a dielectric

引用

IEICE TRANSACTIONS ON COMMUNICATIONS 2001年第1期E84B卷 124-127页

作者： Lee, TK Kim, SY Ra, JW Hankuk Aviat Univ Deokyang Gu Koyang Kyonggi Do South Korea Korea Inst Sci & Technol Seoul South Korea Korea Adv Inst Sci & Technol Yusong Gu Taejon 305701 South Korea

The capability of frequency-swept cross-borehole radar to detect an empty rectangular cylinder embedded in a. dielectric medium is simulated numerically by employing the boundary element method. The frequency loci providing the strongest double dips in the received signal pattern are plotted as functions of the observation distance and the cross-sectional width. It is found that, regardless of the shape of thf rectangular cross-section, the strongest double dips become double nulls in the near-field region.

关键词： geophysical probing cross-borehole radar diffraction pattern tunnel signature

来源：评论

学校读者我要写书评

暂无评论

diffraction pattern Based Optimization of Lithographic Targets for Improved Printability

Diffraction Pattern Based Optimization of Lithographic Targe...

引用

Conference on Design for Manufacturability through Design-Process Integration VII

作者： Banerjee, Shayak Agarwal, Kanak B. IBM Semicond Res & Dev Corp East Fishkill NY USA

ISBN: (纸本)9780819494665

Conventional resolution enhancement techniques (RET) are becoming increasingly inadequate at addressing the challenges of sub-wavelength lithography. In particular, features show high sensitivity to process variation in low-k(1) lithography. While advanced mask optimization techniques such as process window optical proximity correction (PWOPC) exist to address this, they modify electrical properties of shapes in a way that is incommunicable to the designer. A more design-aware approach for improving printability is to perform retargeting, which is a modification of target layout shapes to improve their process window. Retargeting can be performed rule-based or model-based. The former has fast runtime but is not a scalable technique since rules cannot cover the entire search space of two-dimensional shape configurations, especially with technology scaling. The latter provides more coverage of complex 2-D optical interactions compared to rules, but suffers from high runtime and inability to communicate modified design intent back to the designer. In this paper, we explore an alternative approach to retargeting which overcomes the drawbacks of both these methods. We develop a target optimization method based on knowledge of source and the diffraction pattern of the layout. We demonstrate that target optimization can be performed at fast runtime using just the Fourier transform of the layout. This approach is more scalable than rule-based retargeting, but also allows communication of modified design intent by integration into extraction tools.

关键词： Retargeting OPC hotspot fixing diffraction pattern

来源：评论

学校读者我要写书评

暂无评论

Chromaticity analysis of diffraction pattern of white light under the grating

引用

OPTIK 2020年 208卷 164553-164553页

作者： Zhang, Junhua Su, Runzhou Northeast Forestry Univ Dept Phys Harbin 150040 Peoples R China

From the D65 daylight source, the ten monochromatic lights were evenly selected to be mixed into white light. After grating diffraction, color mixing was performed by using the chromaticity method with the relative intensity as the proportionality factor. The mixed color and its chromaticity parameters at specific diffraction angle positions were obtained to calculate L*, a*, b* and dominant wavelength. The relationship between the parameters of the grating and the chromaticity parameters of the mixed color was studied separately. The results showed that the color of the white light diffraction pattern at the diffraction angle theta = 2 degrees is most significantly affected by d, followed by N. There is well linear correlation between b and L*, a*, b* values;but the effect of b on the color is not obvious. Then the relationship between the light intensity of ten kinds of monochromatic lights and the grating constant according to the grating diffraction intensity equation were drew, and the "rainbow" phenomenon was found. Current method for calculating the average wavelength of mixed colors directly from the "rainbow" graph is verified to be equivalent to the chromaticity method.

关键词： Physical optics Chromaticity White light 1931CIE system CIE1976 L* a* b* color space diffraction grating diffraction pattern Principle of mixed colors

来源：评论

学校读者我要写书评

暂无评论

Simulation and modeling of diffraction pattern of crystallography: a fractal approach

引用

COMPUTATIONAL & APPLIED MATHEMATICS 2020年第2期39卷 1-14页

作者： Hussain, Malik Zawwar Yousaf, Shama Arooj, Tayba Univ Punjab Dept Math Lahore Pakistan

Modeling of diffraction pattern is prerequisite to analyze and explore hidden characteristic of crystals, minerals, proteins and waves. Demonstration of diffraction pattern is a challenging task as it exhibits non-linear structure that makes their representation complex. The main objective, here, is to present simple and efficient scheme to draw heterogeneous diffractive pattern. The proposed approach yields fast and reliable description of diffraction pattern. This approach has been applied to two different materials namely nickel ferrite (NiFe2O4) and iron oxide (Fe3O4). The recurrent fractal interpolation scheme with variable scaling factors projects and simulates the diffraction pattern more efficiently. The presented work shows that the proposed algorithm is reliable and competitive in simulation and modeling of diffraction pattern.

关键词： diffraction pattern Crystallography XRD Fractal methodology

来源：评论

学校读者我要写书评

暂无评论

Forward diffraction pattern by cylindrical cavity in lossy medium

引用

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS 1999年第5期22卷 335-340页

作者： Kang, JS Ra, JW Korea Res Inst Stand & Sci Electromagnet Grp Div Electromagnet Metrol Taejon 305600 South Korea Korea Adv Inst Sci & Technol Dept Elect Engn Taejon 305701 South Korea

The diffraction pattern of the total field scattered by a cylindrical cavity excited by the electric line source in a lossy medium is analyzed in the forward region for a wavelength comparable to the radius of the cavity. It is shown hat double nulls and strong double dips, which may be useful in identifying the underground cavity, exist in the forward diffraction pattern, and their dependences on the position of the source and the field points and the medium parameters are analyzed by using the forward scattering width normalized by the measurement distance. (C) 1999 John Wiley & Sons, Inc.

关键词： cylindrical cavity diffraction pattern double nulls and dips

来源：评论

学校读者我要写书评

暂无评论

Curvature of a line defined as a discrete set of points, and diffraction pattern processing for laser ektacytometry of red blood cells

引用

JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER 2019年 235卷 272-277页

作者： Nikitin, S. Yu Ustinov, V. D. Shishkin, S. D. Lomonosov Moscow State Univ Phys Fac Moscow Russia Lomonosov Moscow State Univ Fac Computat Math & Cybernet Moscow Russia

The problem of measuring the erythrocyte deformability by laser diffractometry in a shear flow (ektacytometry) is considered. A procedure for processing diffraction patterns is proposed, which makes it possible to measure the curvature of the isointensity lines with high accuracy. The procedure involves finding the specific points of the isointensity line, which we called the band points. The coordinates of these points are determined by the isointensity line (band) width, depending on the resolution and dynamic range of the camera. Determining the coordinates of the band points allows us to calculate the curvature of the line by the formula of the second differential derivative. The accuracy of the procedure is justified with the help of analytical estimates of the second and fourth derivatives of the function describing the isointensity line. It is shown that to measure the curvature of the isointensity line with an error not exceeding one percent, it is necessary to photograph the neighborhoods of the points of interest to us with a resolution of about 10 megapixels or to take an image of the entire diffraction pattern with a resolution of 100 megapixels. (C) 2019 Elsevier Ltd. All rights reserved.

关键词： Line curvature Image processing diffraction pattern

来源：评论

学校读者我要写书评

暂无评论

Development of new high transparent hybrid organic-inorganic monoliths with surface engraved diffraction pattern

引用

JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS 2012年第7期50卷 492-499页

作者： Moreira, Sandra D. F. C. Silva, Carlos J. R. Prado, Luis A. S. A. Costa, Manuel F. M. Boev, Victor I. Martin-Sanchez, J. Gomes, M. J. M. Univ Minho Ctr Chem P-4710057 Braga Portugal Univ Minho Ctr Phys P-4710057 Braga Portugal Tech Univ Hamburg Inst Polymer & Composites D-21073 Hamburg Germany Inst Electrochem & Energy Syst Dept Solid State Electrochem Sofia 1113 Bulgaria

Flexible hybrid xerogels bringing together high optical transparency up to 96%, low shrinkage down to 5.5%, very smooth surface (average roughness of about 0.3 nm) and thermal stability up to 200 degrees C were achieved as a result of the optimization of sol-gel preparative method and a new combination of sol-gel precursors. Two types of hybrid materials (hereafter referred, respectively, as urea-silicate and amino-alcohol-silicate gels) were synthesized in this work. The shrinkage and the transparency of these materials have been drastically improved by using two different derived siloxanes (3-isocyanate propyltriethoxysilane and 3-glycidoxypropyltrimethoxysilane) and two amine-terminated polyether precursors with different molecular weights. A drying process was implemented to minimize yellowing of prepared samples. Under these conditions, we were able to efficiently reproduce a well-defined imprinted pattern at materials surface by using an original casting mould. The study of the diffraction characteristics of the obtained grating revealed a good reproducibility of the imprinted grating that shows to be comparable with the original mould. The developed methodology opens the possibility to produce diffraction lenses with a wide range of forms by a simple method based on sol-gel process. (C) 2011 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys, 2012

关键词： composites diffraction pattern gels hybrid materials transparency xerogels

来源：评论

学校读者我要写书评

暂无评论

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

请选择保存的检索档案：

请选择收藏分类：

通借通还

建议与咨询 留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

请选择保存的检索档案： 新增检索档案 确定 取消

请选择收藏分类： 新增自定义分类 确定 取消

通借通还

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

请选择保存的检索档案：

请选择收藏分类：