This paper presents a method for concurrent BIST cost estimation during testable data path allocation. The method integrates testability in the design process and generates a distributed test controller that aims to m...
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ISBN:
(纸本)9781424453771
This paper presents a method for concurrent BIST cost estimation during testable data path allocation. The method integrates testability in the design process and generates a distributed test controller that aims to minimize area and power. The system has been implemented and favorable results are reported.
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