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检索条件"主题词=fault coverage"
395 条 记 录,以下是1-10 订阅
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Power-Aware Testing for Maximum fault coverage in Analog and Digital Circuits Simultaneously
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IETE TECHNICAL REVIEW 2022年 第6期39卷 1395-1409页
作者: Singh, Vivek Kumar Sarkar, Trupa Pradhan, Sambhu Nath Natl Inst Technol Agartala ECE Dept Agartala India
In this paper, a method for maximum fault coverage with minimum power dissipation, during the testing of analog and digital circuits of mixed-signal System-on-Chip (SOC) simultaneously using Genetic Algorithm, (GA) is... 详细信息
来源: 评论
fault coverage Analysis using Sneak Path based Testing in Memristor Circuits  31
Fault Coverage Analysis using Sneak Path based Testing in Me...
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31st IEEE Microelectronics Design and Test Symposium (MDTS)
作者: Joshi, Rasika Acken, John M. Intel Corp Hillsboro OR 97124 USA Portland State Univ Portland OR 97207 USA
Testing memristor crossbar arrays is required to ensure high quality. However, inefficient testing can be prohibitively expensive. To evaluate the quality and efficiency of a test requires identifying the underlying r... 详细信息
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Balanced Scan Chain Analysis to Improve fault coverage in VLSI circuits  6
Balanced Scan Chain Analysis to Improve Fault Coverage in VL...
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6th International Conference on Inventive Computation Technologies (ICICT)
作者: Somanathan, Geethu Remadevi Bhakthavathchalu, Ramesh Krishnakumar, M. Amrita Vishwa Vidyapeetham Dept Elect & Commun Engn Amritapuri India KSEBL Thiruvananthapuram Kerala India
Built-in-Self-Test allows a circuit to test itself, and finds more use with standalone and mission critical applications like medical or automotive. Testability of a circuit is a key factor which determines the level ... 详细信息
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fault coverage-Aware Metrics for Evaluating the Reliability Factor of Solar Tracking Systems
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ENERGIES 2021年 第4期14卷 1074页
作者: Rotar, Raul Jurj, Sorin Liviu Opritoiu, Flavius Vladutiu, Mircea Politehn Univ Timisoara Comp & Informat Technol 2 V Parvan Blvd Timisoara 300223 Romania
This paper presents a mathematical approach for determining the reliability of solar tracking systems based on three fault coverage-aware metrics which use system error data from hardware, software as well as in-circu... 详细信息
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A Methodology for Identification of Internal Nets for Improving fault coverage in Analog and Mixed Signal Circuits
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JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2020年 第6期36卷 719-730页
作者: Sanyal, Sayandeep Bhattacharya, Mayukh Patra, Amit Dasgupta, Pallab Indian Inst Technol Kharagpur Dept Comp Sci & Engn Kharagpur W Bengal India Synopsys Inc San Diego CA USA Indian Inst Technol Kharagpur Dept Elect Engn Kharagpur W Bengal India
Traditional literature on analog testing deals with the propagation of faults to the output ports of a circuit. Often the percentage of detected faults remains low because suitable stimuli cannot be found for propagat... 详细信息
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A comparative analysis of LFSR cascading for hardware efficiency and high fault coverage in BIST applications  29
A comparative analysis of LFSR cascading for hardware effici...
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29th IEEE Asian Test Symposium (ATS)
作者: Alamgir, Arbab Bin A'ain, Abu Khari Paraman, Norlina Sheikh, Usman Ullah Grout, Ian Univ Teknol Malaysia Fac Engn Sch Elect Engn Johor Baharu Malaysia Univ Limerick Dept Elect & Comp Engn Limerick Ireland
Determination of the most appropriate test set is a critical task for high fault coverage in digital testing. Linear feedback shift registers (LFSR) is a common choice to generate pseudo-random patterns for any circui... 详细信息
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Scalable fault coverage Estimation of Sequential Circuits without fault Injection
Scalable Fault Coverage Estimation of Sequential Circuits wi...
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IEEE International Symposium on Circuits and Systems (ISCAS)
作者: Javvaji, Pavan Kumar Tragoudas, Spyros Kondapuram, Ganesh Southern Illinois Univ Dept Elect & Comp Engn Carbondale IL 62901 USA Intel Corp Santa Clara CA 95051 USA
Industrial and automotive standards for safety critical System on Chips require fault coverage at the gate level. A scalable estimation method that avoids fault injection is presented. It is statistically correlated t... 详细信息
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fault coverage of Memory Polarized Mho Elements with Time Delays  70
Fault Coverage of Memory Polarized Mho Elements with Time De...
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70th Annual Conference on Protective Relay Engineers (CPRE)
作者: Hulme, Jason Department of Computer Science New Paltz NY
This paper analyzes the effect of time delays on the fault resistance coverage of memory polarized distance elements. A high voltage, electrically short, transmission line with a permissive overreaching transfer trip ... 详细信息
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A high fault coverage test approach for communication channels in network on chip
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MICROELECTRONICS RELIABILITY 2017年 75卷 178-186页
作者: Aghaei, Babak Islamic Azad Univ Malekan Branch Dept Comp Engn Malekan Iran
This paper proposes a new high fault coverage test approach for short faults in Network on Chip communication channels. The proposed approach consists of a built in self-test as well as a Packet/flit Comparing Module ... 详细信息
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Reliability Analysis of Flight Control System under Perfect and Imperfect fault coverage
Reliability Analysis of Flight Control System under Perfect ...
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IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology
作者: Poonam Rani G. L. Pahuja Department of Electrical Engineering National Institute of Technology
Systems such as aircraft control need very high levels of reliability, so redundancy is adopted for acquiring the same. The reliability of the system gets affected due to the coverage. When a component in a system fai... 详细信息
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