An algorithm for generating test sets to detect all the multiple stuck-at-faults in combinational logic circuits is presented. This algorithm generates a test set using a set of functions, called representative functi...
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An algorithm for generating test sets to detect all the multiple stuck-at-faults in combinational logic circuits is presented. This algorithm generates a test set using a set of functions, called representative functions, which consists of much fewer functions than all possible multiple stuck-at fault functions, but is sufficient for test generation. Two different methods of finding such a set of representative functions are presented. The test sets derived from the set of representative functions obtained by the first method will be smaller than that by the second method, but the second method is much simpler than the first especially for highly redundant circuits. Nevertheless, the complexity of this algorithm using the first method is about the same as that of Bossen and Hong"s algorithm which is the simplest existing algorithm under the multiple stuck-at fault assumption, and yet the number of tests in a test set generated will always be smaller for redundant circuits and the same for irredundant circuits as that generated by Bossen and Hong"s algorithm for irredundant circuits.
作者：
COY, WUNIV BREMEN
FAC MATH & INFORMATD-2800 BREMEN 33FED REP GER
Poage has constructed a complex fault detection algorithm which generates a complete and minimal test set of all multiple stuck-at faults of a given combinational network. Several authors have derived from his method ...
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Poage has constructed a complex fault detection algorithm which generates a complete and minimal test set of all multiple stuck-at faults of a given combinational network. Several authors have derived from his method fast and simple multiple fault detection algorithms, which are claimed to generate complete test sets with a "near-minimal" or "near-optimal" number of tests. We show that the algorithms by Bossen and Hong and the algorithm by Yang and Yau may generate test sets with an exponential number of tests (relative to the number of inputs) where a linear number of tests is sufficient for a complete multiple fault detection test set.
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