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Spectroscopic super-resolution fluorescence cell imaging using ultra-small Ge quantum dots

OPTICS EXPRESS 2017年第4期25卷 4240-4253页

作者： Song, Mingying Karatutlu, Ali Ali, Isma Ersoy, Osman Zhou, Yun Yang, Yongxin Zhang, Yuanpeng Little, William R. Wheeler, Ann P. Sapelkin, Andrei V. Queen Mary Univ London Sch Phys & Astron London E1 4NS England Bursa Orhangazi Univ Elect & Elect Engn TR-16310 Bursa Turkey Kings Coll London Nikon Imaging Ctr London WC2R 2LS England Queen Mary Univ London Sch Elect Engn & Comp Sci London E1 4NS England Univ Edinburgh Inst Genet & Mol Med Edinburgh EH4 2XU Midlothian Scotland Edinburgh Super Resolut Interdisciplinary Consort Edinburgh EH4 2XU Midlothian Scotland

We demonstrate a spectroscopic imaging based super-resolution approach by separating the overlapping diffraction spots into several detectors during a single scanning period and taking advantage of the size-dependent emission wavelength in nanoparticles. This approach has been tested using off-the-shelf quantum dots (Invitrogen Qdot) and in-house novel ultra-small (similar to 3 nm) Ge QDs. Furthermore, we developed a method-specific Gaussian fitting and maximum likelihood estimation based on a Matlab algorithm for fast QD localisation. This methodology results in a three-fold improvement in the number of localised QDs compared to non-spectroscopic images. With the addition of advanced ultrasmall Ge probes, the number can be improved even further, giving at least 1.5 times improvement when compared to Qdots. Using a standard scanning confocal microscope we achieved a data acquisition rate of 200 ms per image frame. This is an improvement on single molecule localisation super-resolution microscopy where repeated image capture limits the imaging speed, and the size of fluorescence probes limits the possible theoretical localisation resolution. We show that our spectral deconvolution approach has a potential to deliver data acquisition rates on the ms scale thus providing super-resolution in live systems. Published by The Optical Society

关键词： image processing algorithms Live cell imaging Optical imaging Structured illumination microscopy Three dimensional imaging Ultraviolet radiation

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High-precision lateral distortion measurement and correction in coherence scanning interferometry using an arbitrary surface

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OPTICS EXPRESS 2017年第16期25卷 18703-18712页

作者： Ekberg, Peter Su, Rong Leach, Richard KTH Royal Inst Technol Ind Metrol & Opt Prod Engn SE-10044 Stockholm Sweden Univ Nottingham Fac Engn Mfg Metrol Team Nottingham NG7 2RD England

Lateral optical distortion is present in most optical imaging systems. In coherence scanning interferometry, distortion may cause field-dependent systematic errors in the measurement of surface topography. These errors become critical when high-precision surfaces, e.g. precision optics, are measured. Current calibration and correction methods for distortion require some form of calibration artefact that has a smooth local surface and a grid of high-precision manufactured features. Moreover, to ensure high accuracy and precision of the absolute and relative locations of the features of these artefacts, requires their positions to be determined using a traceable measuring instrument, e.g. a metrological atomic force microscope. Thus, the manufacturing and calibration processes for calibration artefacts are often expensive and complex. In this paper, we demonstrate for the first time the calibration and correction of optical distortion in a coherence scanning interferometer system by using an arbitrary surface that contains some deviations from flat and has some features (possibly just contamination), such that feature detection is possible. By using image processing and a self-calibration technique, a precision of a few nanometres is achieved for the distortion correction. An inexpensive metal surface, e.g. the surface of a coin, or a scratched and defected mirror, which can be easily found in a laboratory or workshop, may be used. The cost of the distortion correction with nanometre level precision is reduced to almost zero if the absolute scale is not required. Although an absolute scale is still needed to make the calibration traceable, the problem of obtaining the traceability is simplified as only a traceable measure of the distance between two arbitrary points is needed. Thus, the total cost of transferring the traceability may also be reduced significantly using the proposed method. Published by The Optical Society under the terms of the Creative Commons Attrib

关键词： Atomic force microscopy image processing image processing algorithms Imaging systems Nanopositioning equipment Optical aberrations

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Reconstruction of three-dimensional occluded object using optical flow and triangular mesh reconstruction in integral imaging

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OPTICS EXPRESS 2010年第25期18卷 26373-26387页

作者： Jung, Jae-Hyun Hong, Keehoon Park, Gilbae Chung, Indeok Park, Jae-Hyeung Lee, Byoungho Seoul Natl Univ Sch Elect Engn Seoul 151744 South Korea Chungbuk Natl Univ Sch Elect & Comp Engn Cheongju 361763 Chungbuk South Korea

We proposed a reconstruction method for the occluded region of three-dimensional (3D) object using the depth extraction based on the optical flow and triangular mesh reconstruction in integral imaging. The depth information of sub-images from the acquired elemental image set is extracted using the optical flow with sub-pixel accuracy, which alleviates the depth quantization problem. The extracted depth maps of sub-image array are segmented by the depth threshold from the histogram based segmentation, which is represented as the point clouds. The point clouds are projected to the viewpoint of center sub-image and reconstructed by the triangular mesh reconstruction. The experimental results support the validity of the proposed method with high accuracy of peak signal-to-noise ratio and normalized cross-correlation in 3D image recognition. (C)2010 Optical Society of America

关键词： image processing algorithms image recognition image reconstruction Lens arrays Optical flow Three dimensional imaging

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Complete polarization state generator with one variable retarder and its application for fast and sensitive measuring of two-dimensional birefringence distribution

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JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS image SCIENCE AND VISION 2011年第3期28卷 410-419页

作者： Shribak, Michael Marine Biol Lab Woods Hole MA 02543 USA

The complete polarization state generator (PSG), which consists of one rotatable polarizer and one variable retarder with a quarter-wave plate, is introduced. The orientation angle of its output polarization ellipse equals half of the retardance of the variable retarder, and the ellipticity angle corresponds to the polarizer azimuth. The PSG is employed in the quantitative orientation-independent differential polarization microscope, which uses polarized light states with the same ellipticity and different orientation angles. image processing algorithms using three or four frames are described. (C) 2011 Optical Society of America

关键词： image processing algorithms image quality Mueller matrices Optical components Polarized light Wavefront aberrations

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LuckyProfiler: an imageJ plug-in capable of quantifying FWHM resolution easily and effectively for super-resolution images

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BIOMEDICAL OPTICS EXPRESS 2022年第8期13卷 4310-4325页

作者： Li, Mengting Song, Qihang Xiao, Yinghao Wu, Junnan Kuang, Weibing Zhang, Yingjun Huang, Zhen-Li Huazhong Univ Sci & Technol Britton Chance Ctr Wuhan 430074 Peoples R China Huazhong Univ Sci & Technol Sch Engn Sci Wuhan Natl Lab Optoelect MoE Key Lab Biomed Photon Wuhan 430074 Peoples R China Hainan Univ Sch Biomed Engn Key Lab Biomed Engn Hainan Prov Haikou 570228 Hainan Peoples R China

Quantifying the resolution of a super-resolution image is vital for biologists trying to apply super-resolution microscopy in various research fields. Among the reported image resolution estimation methods, the one that calculates the full width at half maximum (FWHM) of line profile, called FWHM resolution, continues the traditional resolution criteria and has been popularly used by many researchers. However, quantifying the FWHM resolution of a super-resolution image is a time-consuming, labor-intensive, and error-prone process because this method typically involves a manual and careful selection of one or several of the smallest structures. In this paper, we investigate the influencing factors in FWHM resolution quantification systematically and present an imageJ plug-in called LuckyProfiler for biologists so that they can have an easy and effective way of quantifying the FWHM resolution of super-resolution images. (c) 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement

关键词： image processing image processing algorithms image reconstruction image resolution Light wavelength Spatial resolution

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3D shape reconstruction of large specular surface

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APPLIED OPTICS 2012年第31期51卷 7616-7625页

作者： Zhang, Hongwei Han, Shujian Liu, Shugui Li, Shaohui Ji, Lishuan Zhang, Xiaojie Tianjin Univ State Key Lab Precis Measuring Technol & Instrume Tianjin 300072 Peoples R China

A novel three-dimensional (3D) reconstruction method based on fringe reflection technique for shape measurement of large specular surfaces is presented in this paper, which effectively integrates path integration technique with zonal wavefront reconstruction algorithm. The height information of specular surface obtained from cross-path integration can then be used as the initial value in a zonal wavefront reconstruction algorithm. This method not only has the advantages of global integration, but also enables user-friendly, high-speed operation. A specific iterative algorithm is adopted to improve the antinoise capability of the measuring system, which accelerates the rate of convergence significantly and even improves the accuracy of the reconstructed 3D surface. Moreover, the proper use of boundary contour extraction of the acquired images reduces the computational load of 3D reconstruction dramatically and hence achieves high reconstruction accuracy and enhances the surface integrity at the boundary. An ultraprecision, diamond-turned planar mirror with diameter of 150 mm has been employed to implement the system calibration. The reconstruction results of simulated and actual hyperbolic surfaces and the gauge blocks identify the validity of this new method. It is demonstrated that the measurement error is about 50 mu m with reconstruction points of 150 x 560 pixels of gauge blocks. (C) 2012 Optical Society of America

关键词： Digital image processing Freeform surfaces image processing algorithms Phase unwrapping Reconstruction algorithms Three dimensional reconstruction

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Fourier interpolation stochastic optical fluctuation imaging

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OPTICS EXPRESS 2015年第12期23卷 16154-16163页

作者： Stein, Simon C. Huss, Anja Haehnel, Dirk Gregor, Ingo Enderlein, Joerg Univ Gottingen Inst Phys 3 D-37077 Gottingen Germany BCCN Gottingen Germany DFG Res Ctr Nanoscale Microscopy & Mol Physiol Br Gottingen Germany

Stochastic Optical Fluctuation Imaging (SOFI) is a super-resolution fluorescence microscopy technique which allows to enhance the spatial resolution of an image by evaluating the temporal fluctuations of blinking fluorescent emitters. SOFI is not based on the identification and localization of single molecules such as in the widely used Photoactivation Localization Microsopy (PALM) or Stochastic Optical Reconstruction Microscopy (STORM), but computes a superresolved image via temporal cumulants from a recorded movie. A technical challenge hereby is that, when directly applying the SOFI algorithm to a movie of raw images, the pixel size of the final SOFI image is the same as that of the original images, which becomes problematic when the final SOFI resolution is much smaller than this value. In the past, sophisticated cross-correlation schemes have been used for tackling this problem. Here, we present an alternative, exact, straightforward, and simple solution using an interpolation scheme based on Fourier transforms. We exemplify the method on simulated and experimental data. (C) 2015 Optical Society of America

关键词： Fast Fourier transforms Fourier transforms image processing algorithms image quality Spatial resolution Three dimensional imaging

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Low-pass filtering based polarimetric dehazing method for dense haze removal

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OPTICS EXPRESS 2021年第18期29卷 28178-28189页

作者： Liang, Jian Ren, Liyong Liang, Rongguang Shaanxi Normal Univ Sch Phys & Informat Technol Xian 710119 Peoples R China Univ Arizona James C Wyant Coll Opt Sci Tucson AZ 85721 USA

Polarimetric dehazing method is very promising in enhancing the quality of images captured in the scattering media. However, it is found that the dehazing results calculated by hazy images are very sensitive to the noise, which may cause the method unstable or even invalid. To overcome this drawback and enhance the capability and stability of the polarimetric dehazing method, digital image processing algorithms or bias parameters need to be added into the method, however, they will make the algorithm complex and time consuming. In this paper, using low pass filter to suppress the noise of the hazy images, a novel polarimetric dehazing method is proposed to enhance the visibility of hazy images, especially for dense haze removal. Experimental results demonstrate that this method is totally automatic and very effective in dense haze processing. This method may have great potential usage in many applications, such as optical surveillance, underwater imaging, and bio-tissue imaging, etc. (C) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

关键词： Digital image processing image processing image processing algorithms Scattering media Underwater imaging Visibility

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Surface topography acquisition method for double-sided near-right-angle structured surfaces based on dual-probe wavelength scanning interferometry

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OPTICS EXPRESS 2017年第20期25卷 24148-24156页

作者： Zhang, Tao Gao, Feng Jiang, Xiangqian Univ Huddersfield Huddersfield W Yorkshire England

This paper proposes an approach to measure double-sided near-right-angle structured surfaces based on dual-probe wavelength scanning interferometry (DPWSI). The principle and mathematical model is discussed and the measurement system is calibrated with a combination of standard step-height samples for both probes vertical calibrations and a specially designed calibration artefact for building up the space coordinate relationship of the dual-probe measurement system. The topography of the specially designed artefact is acquired by combining the measurement results with white light scanning interferometer (WLSI) and scanning electron microscope (SEM) for reference. The relative location of the two probes is then determined with 3D registration algorithm. Experimental validation of the approach is provided and the results show that the method is able to measure double-sided near-right-angle structured surfaces with nanometer vertical resolution and micrometer lateral resolution. (C) 2017 Optical Society of America

关键词： image processing algorithms Scanning electron microscopy Scanning probe microscopy Scanning tunneling microscopy Surface light scattering White light interferometry

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Complex-argument universal nonlinear cell for rapid prototyping

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IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 1997年第1期5卷 15-27页

作者： Jain, VK Lin, L Dept. of Electr. Eng. Univ. of South Florida Tampa FL USA

The development of generic cells to perform linear and nonlinear arithmetic is critical to cost-effective rapid prototyping. Our LARP architecture deploys generic cells, thereby offering the capability of mapping a wide variety of signal and image processing algorithms on to the same pool of resources. This paper presents a further advance in this direction. Specifically, it reports on the development of a complex-argument nonlinear universal cell, which achieves both high speed and high accuracy. To accomplish this, low-degree MIP polynomials are used, as explained in the paper. Four specific functions, namely the reciprocal, absolute value, logarithm, and the square-root, are considered, but the procedure is extendible to other functions as well. A 24- and a 16-b chip are described. Finally, their application to an antenna array processor is presented which is amenable to large-area-device implementation.

关键词： Software Prototyping Floating Point Arithmetic Polynomials ULSI Real Time Systems Array Signal processing Interpolation Pipeline processing Digital Signal processing Chips Complex Argument Universal Nonlinear Cell Rapid Prototyping Generic Cells Nonlinear Arithmetic LARP Architecture image processing algorithms Low Degree MIP Polynomials Antenna Array Processor Large Area Device Implementation ULSI Floating Point Arguments Signal processing algorithms 24 Bit 16 Bit Prototypes Ultra Large Scale Integration Interpolation Arithmetic Signal processing image processing Polynomials Computer Architecture Silicon Laser Beam Cutting

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