A technical investigation, research and implementation is presented to correct column fixed pattern noise and black level in largearray Complementary metal oxide semiconductor(cmos) imagesensor. Through making a com...
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A technical investigation, research and implementation is presented to correct column fixed pattern noise and black level in largearray Complementary metal oxide semiconductor(cmos) imagesensor. Through making a comparison among reported solution, and give large array cmos image sensor design and considerations,according to our previous analysis on non-ideal factor and error source of piecewise Digital to analog converter(DAC) in multi-channels, an improving accurate piecewise DAC with adaptive switch technique is developed. The research theory has verified by a high dynamic range and low column Fixed pattern noise(FPN) cmosimagesensor prototype chip, which consisting of 8320×8320 pixel array was designed and fabricated in 55 nm cmos 1P4M standard process. The chip active area is 48 mm×48 mm with a pixel size of 5.7μm×5.7μm. The measured results achieved a high intrinsic dynamic range of 75 d B, a low FPN and black level of 0.06%, a low photo response non-uniformity of 1.5% respectively, and an excellent raw sample image taken by the prototype sensor.
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