This paper presents an approach to multilabel classification (MLC) with a large number of labels. Our approach is a reduction to binary classification in which label sets are represented by low dimensional binary vect...
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ISBN:
(纸本)9781632660244
This paper presents an approach to multilabel classification (MLC) with a large number of labels. Our approach is a reduction to binary classification in which label sets are represented by low dimensional binary vectors. This representation follows the principle of Bloom filters, a space-efficient data structure originally designed for approximate membership testing. We show that a naive application of Bloom filters in MLC is not robust to individual binary classifiers' errors. We then present an approach that exploits a specific feature of real-world datasets when the number of labels is large: many labels (almost) never appear together. Our approach is provably robust, has sublinear training and inference complexity with respect to the number of labels, and compares favorably to state-of-the-art algorithms on two large scale multilabel datasets.
The aggressive scaling of the NAND flash technology has led to write noise becoming the dominant source of disturbance in the currently shipping sub-30 nm MLC NAND memories. Write noise can be mitigated by reducing th...
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ISBN:
(纸本)9781457720529
The aggressive scaling of the NAND flash technology has led to write noise becoming the dominant source of disturbance in the currently shipping sub-30 nm MLC NAND memories. Write noise can be mitigated by reducing the magnitude of the voltage levels programmed into the cells, which additionally translates to longer flash memory lifetime. However, if all the target levels are small and close together, the probability of error could become excessively high. It is therefore necessary to optimize the target level placement in order to achieve a trade-off between flash lifetime and error probability. This paper proposes a method to maximize flash lifetime subject to reliability constraints, and vice versa. Simulation results show that the proposed method doubles flash lifetime in comparison to a naive scheme, for a 2% reliability constraint. It also comes very close to the optimal solution obtained by brute force search, while maintaining negligible computational complexity in comparison.
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