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检索条件"主题词=phase shift algorithm"
18 条 记 录,以下是11-20 订阅
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Optical current sensor using phase shift algorithms
Optical current sensor using phase shift algorithms
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Conference on Fiber Optic Sensors and Applications V
作者: Flores, Jorge L. Garcia-Torales, G. Ortiz, Victor H. Univ Guadalajara Dept Elect Engn Guadalajara 44840 Jalisco Mexico
A new fiber-optic current sensor (FOCS) is described which employs phase shifting algorithms to process the optical signal. In this approach the sensing element consists of a coil low birefringence fiber placed betwee... 详细信息
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Absolute measurement of density of silicon crystals for determining Avogadro constant
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Jiliang Xuebao/Acta Metrologica Sinica 2008年 第3期29卷 211-215页
作者: Luo, Zhi-Yong Yang, Li-Feng Gu, Ying-Zi Guo, Li-Gong Ding, Jing-An Chen, Zhao-Hui National Institute of Metrology Beijing 100013 China
Based on the improved five-interferogram algorithm, a novel interferometer with special etalon is developed. The distance between two standard surfaces of this etalon can be changed by pressure in vertical direction t... 详细信息
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Detection algorithm of series arc for electrical fire prediction
Detection algorithm of series arc for electrical fire predic...
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International Conference on Condition Monitoring and Diagnosis
作者: Park, Dae-won Kim, Il-kwon Choi, Su-yeon Kil, Gyung-suk Korea Maritime Univ Pusan 606791 South Korea
In this paper, we studied on the detection of series arcing which is a main cause of electrical fires in low-voltage indoor wiring system. To distinguish series arcing state from normal one, we proposed a detection me... 详细信息
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A four-frame phase shift method insensitive to phase shifter nonlinearity
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JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS 2006年 第3期8卷 300-303页
作者: Zhong, XH Shanghai Inst Opt & Fine Mech Lab Informat Opt Shanghai 201800 Peoples R China
A four-frame phase shift method and an associated algorithm using unequal phase steps are presented. The unique advantage of this method is that it becomes insensitive to phase shifter nonlinearity because of the perf... 详细信息
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Summary of algorithms for white-light scanning interferometry
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Guangxue Jishu/Optical Technique 2006年 第1期32卷 115-117+120页
作者: Yang, Tian-Bo Guo, Hong Li, Da-Cheng State Key Laboratory Precision Measurement Technology and Instrument Tsinghua University Beijing 100084 China
White light interference is an extremely powerful method of optical measurements. When the structure of the interferometer, the spectrum width of the light source, and the scanning step is certain, the right algorithm... 详细信息
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Measurement of optical thickness variation of a multiple-surface object by a wavelength tuning interferometer
Measurement of optical thickness variation of a multiple-sur...
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20th Congress of the International Commission for Optics
作者: Jan Burke Kenichi Hibino Ryohei Hanayama Bozenko F.Oreb CSIRO Telecommunication & Industrial Physics Lindfield NSW 2070 Australia. AIST Photonics Research Institute Tsukuba 305-8564 Japan. University of Tokyo Bunkyo-ku Tokyo 113-8656 Japan. CSIRO Telecommunication & Industrial Physics Lindfield NSW 2070 Australia.
Wavelength tuning interferometry can distinguish interference signals from different surfaces in frequency space. The optical thickness variation of each layer of a multiple-surface object was measure
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Interferometric measurement of a multi-parallel-surface transparent object by a new class of wavelength tuning algorithms
Interferometric measurement of a multi-parallel-surface tran...
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Conference on Interferometry XII - Techniques and Analysis
作者: Hibino, K Burke, J Hanayama, R Oreb, BF CSIRO Telecommun & Ind Phys Lindfield NSW 2070 Australia
Wavelength scanned interferometry can distinguish in frequency space interference signals from different surfaces and therefore allows the measurement of optical thickness variation between several quasi-parallel surf... 详细信息
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Improved algorithms for wavelength scanning interferometry: application to the simultaneous measurement of surface topography and optical thickness variation in a transparent parallel plate
Improved algorithms for wavelength scanning interferometry: ...
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Conference on Interferometry XI Techniques, Analysis and Applications
作者: Hibino, K Oreb, BF Fairman, PS CSIRO Telecommun & Ind Phys Lindfield NSW 2070 Australia
Wavelength scanning interferometry allows the simultaneous measurement of the surface profile and the optical thickness variation of a parallel plate. However, it is necessary to evaluate the modulation frequencies of... 详细信息
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