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检索条件"主题词=phase-shifting algorithm"
70 条 记 录,以下是41-50 订阅
排序:
Efficient nonlinear algorithm for envelope detection in white light interferometry
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JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION 1996年 第4期13卷 832-843页
作者: Larkin, KG []Department of Physical Optics The University of Sydney NSW 2006 Australia
A compact and efficient algorithm for digital envelope detection in white light interferograms is derived from a well-known phase-shifting algorithm. The performance of the new algorithm is compared with that of Princ... 详细信息
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Fringe projection decamouflaging
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OPTICS AND LASERS IN ENGINEERING 2020年 134卷 106201-106201页
作者: Deng, Ji Li, Jian Ding, Shumeng Feng, Hao Xiao, Yu Han, Wenzhong Zeng, Zhoumo Tianjin Univ Sch Precis Instrument & Opto Elect Engn State Key Lab Precis Measurement Technol & Instru 92 Weijin Rd Tianjin 300072 Peoples R China North China Inst Aerosp Engn Sch Mech & Elect Engn 133 Aimin East Rd Langfang 065000 Peoples R China
Unveiling the cheating mask of camouflage is of great significance in scientific and military research, but the acquisition of detailed information about camouflaged objects remains extremely difficult. This paper pre... 详细信息
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Noncontact surface profiling using optical interferometric microscopy
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OPTICAL ENGINEERING 2024年 第2期63卷 023104-023104页
作者: Palacios, Diego Zhai, Bowen Wang, Michael R. Univ Miami Dept Elect & Comp Engn Coral Gables FL 33124 USA
. We report the use of noncontact optical interferometric microscopy for surface topographic profiling. A Linnik optical configuration is used to create interferograms of an object's surface. When the coherence co... 详细信息
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Two-frame wavefront reconstruction method with nonlinear optimization for Ronchi lateral
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OPTICS COMMUNICATIONS 2024年 559卷
作者: Shi, Runzhou Liu, Huiwen Shao, Yuqi Zhang, Tian Bai, Jian Zhejiang Univ State Key Lab Extreme Photon & Instrumentat Hangzhou 310027 Peoples R China Zhejiang Univ Coll Opt Sci & Engn Hangzhou 310027 Peoples R China Zhejiang Univ ZJU Hangzhou Global Sci & Technol Innovat Ctr Hangzhou 311215 Peoples R China
Ronchi lateral shearing interferometry is widely applied in wavefront measurement of advanced lithography tools. In Ronchi lateral shearing interferometry, higher-order diffraction beam interference is a common challe... 详细信息
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Measurement of Thickness and Refractive Index of Optical Samples Simultaneously Using Full-Range One-Shot Frequency-Domain Optical Coherence Tomography
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FIBER AND INTEGRATED OPTICS 2015年 第3期34卷 171-182页
作者: Cheng, Hsu-Chih Huang, Chia-Tsai Natl Formosa Univ Dept Electroopt Engn Huwei Township Yunlin County Taiwan Natl Cheng Kung Univ Inst Electroopt Sci & Engn Dept Photon Tainan 70101 Taiwan
This article proposes an improved frequency-domain optical coherence tomography for simultaneously measuring the thickness and refractive index of an unknown sample. In conventional frequency-domain optical coherence ... 详细信息
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Development of surface reconstruction algorithms for optical interferometric measurement
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Frontiers of Mechanical Engineering 2021年 第1期16卷 1-31页
作者: Dongxu WU Fengzhou FANG Centre of Micro/Nano Manufacturing Technology(MNMT-Dublin) University College DublinDublin 4Ireland School of Control Engineering Northeastern University at QinhuangdaoQinhuangdao 066004China State Key Laboratory of Precision Measuring Technology and Instruments Centre of Micro/Nano Manufacturing Technology(MNMT)Tianjin UniversityTianjin 300072China
Optical interferometry is a powerful tool for measuring and characterizing areal surface topography in precision manufacturing.A variety of instruments based on optical interferometry have been developed to meet the m... 详细信息
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phase-measuring algorithm to suppress inner reflection of transparent parallel plate in wavelength tuning Fizeau interferometer
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PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY 2017年 48卷 67-74页
作者: Kim, Yangjin Sugita, Naohiko Mitsuishi, Mamoru Pusan Natl Univ Sch Mech Engn 2Busandaehak ro 63beon gil Busan 46241 South Korea Univ Tokyo Dept Mech Engn Bunkyo Ku 7-3-1 Hongo Tokyo 1138656 Japan
Optical thickness variation is a fundamental characteristic of transparent optical devices. When measuring this variation by using a wavelength-tuning Fizeau interferometer, the measurement accuracy depends on the pha... 详细信息
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Enhanced dual-frequency pattern scheme based on spatial-temporal fringes method
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JOURNAL OF MODERN OPTICS 2018年 第12期65卷 1495-1506页
作者: Wang, Minmin Zhou, Canlin Si, Shuchun Lei, Zhenkun Li, Xiaolei Li, Hui Li, YanJie Shandong Univ Sch Phys Jinan Shandong Peoples R China Dalian Univ Technol Dept Engn Mech Dalian Peoples R China Hebei Univ Technol Sch Mech Engn Tianjin Peoples R China Jinan Univ Sch Civil Engn & Architecture Jinan Shandong Peoples R China
One of the major challenges of employing a dual-frequency phase-shifting algorithm for phase retrieval is its sensitivity to noise. Yun et al proposed a dual-frequency method based on the Fourier transform profilometr... 详细信息
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Statistical and interferometric determination of the optical thickness of a multilayer transparent plate
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OPTICAL REVIEW 2017年 第6期24卷 734-740页
作者: Kim, Yangjin Hibino, Kenichi Pusan Natl Univ Sch Mech Engn 2 Busandaehak Ro63beon Gil Busan 46241 South Korea Natl Inst Adv Ind Sci & Technol 1-1-1 Umezono Tsukuba Ibaraki 3058563 Japan
Wavelength-tuning Fizeau interferometry has been widely used to measure and estimate the optical thickness of optical components. However, in multilayer interferometry, the coupling errors between the higher harmonics... 详细信息
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Suppression of multiple-beam interference noise in testing an optical-parallel plate by wavelength-scanning interferometry
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OPTICAL REVIEW 2002年 第2期9卷 60-65页
作者: Hibino, K Takatsuji, T Natl Inst Ind Sci & Technol Tsukuba Ibaraki 3058564 Japan
Measurements of optical parallel plates in a Fizeau interferometer lead to problems from multiple-beam interference noise unless the back surface of the plate has an additional treatment to prevent its reflection from... 详细信息
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