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检索条件"主题词=phase-shifting algorithm"

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Nonlinearity correction in digital fringe projection profilometry by using histogram matching technique - art. no. 66162I

Nonlinearity correction in digital fringe projection profilo...

引用

Conference on Optical Measurement Systems for Industrial Inspection V

作者： Guo, Hongwei Zhao, Zhan Shanghai Univ Dept Precis Mech Engn Lab Appl Opt & Metrol Shanghai 200072 Peoples R China

ISBN: (纸本)9780819467584

Digital fringe projection profilometry employs a digital video projector as a structured light source and thus gains great flexibility. However, the luminance nonlinearity of the video projector may decrease measurement accuracy and resolution. To overcome this problem, we propose a nonlinearity correction technique for digital fringe projection profilometry. This technique allows determining the response curve of a digital video projector by matching the histogram of the fringe images with that of a standard sinusoid signal. By iterating the two steps, histogram matching and phase evaluation, the phase distribution of the fringe pattern is finally solved with higher accuracy. In so doing, neither photometric calibration nor knowledge about the device is required. Both computer simulation and experiment are carried out to demonstrate the validity of this technique.

关键词： fringe projection profilometry phase measurement phase-shifting algorithm nonlinearity correction

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Repeatability study on different interference systems

Repeatability study on different interference systems

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Conference on Optical Precision Manufacturing, Testing, and Applications / International Symposium on Optoelectronic Technology and Application / Annual Conference of the Chinese-Society-for-Optical-Engineering (CSOE)

作者： Zhang, Linghua Zhang, Bo Han, Sen Tang, Shouhong Zhuang, Chengjin Univ Shanghai Sci & Technol Shanghai Peoples R China Suzhou Univ Sci & Technol Suzhou Peoples R China Suzhou H&L Instruments LLC Suzhou Peoples R China

ISBN: (数字)9781510623378

ISBN: (纸本)9781510623378

Interferometry repeatability is an important indicator for measuring instrumentation and test results. The precondition of improving the detection accuracy is to ensure high-precision repeatability, so high-precision repeatability is one of the most important indicators in precision detection. In the Fizeau interferometer, common light paths are used for the distances from the laser light source to the reference surface, from the reference surface to the detector CCD, and the reference beam and the test beam. However, the strict sense of the co-beam does not exist, and it is not absolute ideal that reference plane has high-precision surface. The test beam reflects from the measured surface will have a certain angular deviation from the reference beam. If so, it may make the reference beam and the test beam reach the CCD detector along different optical paths and generate return error accordingly. And finally it makes effects in sampling and wave surface reproduction. Therefore, using the Zygo GPI system, the 4D system and the H&L system to make research on the same optical platform for relative interferometry repeatability comparison, ensuring that the cavity length is the same, and the standard reference mirror and the tested mirror is the same. Measurements were repeated 50 times for zero-stripes, five-stripes, and ten-stripes. The PV values and RMS values of the 50 measurements make mean processing to reflect the measurement repeatability. Further repeatability error analysis is performed on the phase shift algorithm and PZT phase shifter.

关键词： repeatability phase-shifting algorithm PZT phase shifter

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Real-time multi-camera system for measurement of 3D coordinates by pattern projection - art. no. 66160A

Real-time multi-camera system for measurement of 3D coordina...

引用

Conference on Optical Measurement Systems for Industrial Inspection V

作者： Sainov, Ventseslav Stoykova, Elena Hanizanova, Jana Bulgarian Acad Sci Cent Lab Opt Storage & Proc Informat BU-1113 Sofia Bulgaria

ISBN: (纸本)9780819467584

The report describes a real-time pattern-projection system for measurement of 3D coordinates with simultaneous illumination and recording of four phase-shifted fringe patterns which are projected at four different wavelengths and captured by four synchronized CCD cameras. This technical solution overcomes the main drawback of the temporal phase-shifting profilometry in which the pattern acquisition is made successively in time. The work considers the use of a sinusoidal phase grating as a projection element which is made by analysis of the frequency content of the projected fringes in the Fresnel diffraction zone and by test measurements of relative 3D coordinates that are performed with interferometrically recorded sinusoidal phase gratings on holographic plates. Finally, operation of a four-wavelength profilometric system with four spatially phase-shifted at pi/2 sinusoidal phase gratings illuminated with four diode lasers at wavelengths 790 nm, 810 nm, 850 nm and 910 nm is simulated and the systematical error of the profilometric measurement is evaluated.

关键词： pattern projection profilometry gratings phase-shifting algorithm

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Non-contact high-precision surface three dimensional profiler

Non-contact high-precision surface three dimensional profile...

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Conference on Rough Surface Scattering and Contamination

作者： Jiang, JF He, YH Zhao, WS Harbin Inst Technol Mech Engn Dept 421 Harbin 150001 Peoples R China

ISBN: (纸本)0819432709

This paper presents a system to measure three-dimensional profile of a surface, based on the principle of scanning white light interferometry. It adopts a basic structure of Michelson interferometer and semiautomatic fast focus-adjusting mechanism. Through increasing the sampling frequency and applying the feature extracting algorithm, the precision and efficiency of measurement can be increased together.

关键词： surface topography measurement scanning white light interferometry tranditional interferometry optical path difference optimal interference point piezeoelectric transmitter CCD (Charge Coupled Device) phase-shifting algorithm feature extracting algorithm sampling frequency maximum contrast

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Harmonic frequency estimation method in multi-surface interferometry 7

Harmonic frequency estimation method in multi-surface interf...

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7th Asia Pacific Conference on Optics Manufacture (APCOM)

作者： Chang, Lin He, Tingting Yu, Yingjie Shanghai Univ Sch Mechatron Engn & Automat Shanghai Peoples R China

ISBN: (数字)9781510652095

ISBN: (纸本)9781510652095;9781510652088

The surface morphologies and thickness variation are the basic characteristics of a transparent parallel plate with multiple surfaces. Measurements of these profiles are greatly significant for the evaluation of surface quality. The measurement accuracy of phase-shifting interferometry can reach the nanometer level, which is an effective method for high-precision measurements of ultra-smooth surfaces. However, each measured surface will give its own harmonic to the captured interferograms, resulting in the information of harmonics mixed. Thus the surface topology information can not be detected directly, which can cause problems of the wavefront reconstruction of the measured surface. To solve this problem, separating the mixed harmonics is necessary. The fundamental difference in harmonics lies in their frequency. Therefore, determining these differences of harmonics by frequency is a preliminary method of phase demodulation.

关键词： Least Squares Multi-Surface Measurement phase-shifting algorithm Frequency Estimation

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Full-field optical coherence tomography by achromatic phase shifter with a rotating half-wave plate

Full-field optical coherence tomography by achromatic phase ...

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5th International Conference on Photonics and Imaging in Biology and Medicine

作者： Yang, Yaliang Ding, Zhihua Zhejiang Univ State Key Lab Modern Opt Instrumentat Hangzhou 310027 Peoples R China

ISBN: (纸本)9780819466563

In optical coherence tomography (OCT), broad-bandwidth optical sources are required to achieve high axial resolution. Introducing a variable phase shift achromatically between the probe and reference beams is required for phase-shifting algorithms implemented to extract the coherence signal. We propose a full-field OCT using an achromatic phase shifter based on wave plates. The phase shifter that is almost independent of the wavelength over a range of 240 nm, can provide a phase shift of eight times the rotating angle of the half-wave plate. The system is based on a Michelson interferometer, illuminated by a white light source, and has several advantages compared with previous implementation of full-field OCT based an achromatic phase shifter. Numerical simulation on phase shift error and amplitude ratio between orthogonal polarization components at nominal phase shifts required for two typical phase-stepping algorithms is conducted. Approach for extracting OCT signal by the revised Carre algorithm is presented.

关键词： optical coherence tomography (OCT) full-field OCT achromatic phase shifter phase-shifting algorithm

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End-to-End algorithm for Absolute phase Retrieval 12

End-to-End Algorithm for Absolute Phase Retrieval

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12th International Conference on Information Optics and Photonics (CIOP)

作者： Lu, Jin Li, Yuan Xu, Jian Wang, Fu P. Sun, Xiao G. XIAN Univ Posts & Telecommun Sch Commun & Informat Engn 618 Changan West St Xian 710121 Shaanxi Peoples R China XIAN Univ Posts & Telecommun Res Inst Ind Internet 618 Changan West St Xian 710121 Shaanxi Peoples R China Yangzhou Univ Coll Mech Engn 88 Daxue South Rd Yangzhou 225127 Jiangsu Peoples R China

ISBN: (数字)9781510649903

ISBN: (纸本)9781510649903;9781510649897

Absolute phase plays a very important role for many applications. At present, various techniques have been exhaustively developed for absolute phase recovery. There are three major categories: spatial phase unwrapping, temporal phase unwrapping and deep learning techniques. Analyzing from these methods, a commonality is limited into the procedure of absolute phase recovery. Namely, the conventional algorithms yield to calculate wrapped phase, fringe order and absolute phase in turn. There is a closer dependency between the accuracy of the previous results and the next ones. So more serious errors could accumulate from this computation procedure, meanwhile the recovery speed is decreased. For this reason, we present an end-to-end method to obtain the absolute phase maps by projecting only two-step specially intensity-coded fringe patterns. Unlike the above-mentioned techniques, we can not only compute the wrapped phases from two fringe images, but also decode the corresponding fringe orders simultaneously from two fringe images without any additional patterns. The presented method breaks the limitation and simplifies the procedure of phase unwrapping. Simulations have been carried out to validate the feasibility of the proposed method.

关键词： Digital fringe projection profilometry phase-shifting algorithm phase unwrapping absolute phase recovery

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Absolute phase measurement method with few-patterns

Absolute phase measurement method with few-patterns

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Conference on AOPC - Optical Sensing and Imaging Technology

作者： Qi, Xingyang Zhou, Canlin Ding, Yanping Si, Shuchun Li, Hui Shandong Univ Sch Phys Jinan 250100 Peoples R China

ISBN: (纸本)9781510650060;9781510650053

To unwrap the wrapping phase from phase measuring profilometry in 3D surface measurement, many spatial and temporal phase retrieval methods have been presented. However, spatial phase retrieval method often leads to errors because of discontinuous morphology, noise and fringe undersampling. Temporal phase retrieval method can solve this problem. But the method needs multiple frames of fringe images which would take much time. We proposed a novel absolute phase measurement method with few-patterns to overcome this problem. The proposed method combines an object reflectivity correction and a half-period gray-coded phase unwrapping algorithm. One group of precoded three-step phase-shifting fringe patterns are used to determine the wrapped phase, divide the region, and correct the surface reflectivity of the tested object, a frame of half-period gray-coded pattern is used to determine the fringe order. The proposed method can obtain a large number of codewords for fringe order without decreasing the intensity level for each stair. The result shows that our half-period gray-level coding (HGC) method is robust and efficient.

关键词： phase-shifting algorithm phase measuring profilometry absolute phase measurement 3D shape measurement wrapped phase half-period gray-level

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Use of an interferential objective and synthetic wavelength in evaluation of biological samples

Use of an interferential objective and synthetic wavelength ...

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Optical Technology and Measurement for Industrial Applications Conference

作者： Martinez-Garcia, Amalia Hernandez-Gutierrez, Ivan Antonio Rayas-Alvarez, Juan Karen Reyes, Ana Ctr Invest Opt AC Loma Bosque 115 Guanajuato 37150 Mexico

ISBN: (数字)9781510660687

ISBN: (纸本)9781510660687

Red blood cell (RBC) anomalies are significant symptoms for identification of health disorders and several blood diseases, which involve the modification of the parameters and biophysical characteristics of such cells. An optical system was implemented using a Mirau interferential objective to evaluate the micro-topography of Red Blood Cells in Papanicolaou test (PAP). The phase-shifting algorithm called 8-Bell6 was applied to evaluate the phase map. The phase ambiguity is removed by using three light-emitting diodes (LEDs) emitting at three different wavelengths: 459.7, 512.8 and 637 nm. The micro-topography is evaluated for one of the RBC observed in the sample. Profiles of two perpendicular diameters to each other are showed. The relative error for measurements made with this optical system is 2.9%.

关键词： Mirau objective red blood cells synthetic wavelength phase-shifting algorithm interference microscopy optical metrology

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Modified Fourier transform profilometry based on digital time-multiplexing technique 6

Modified Fourier transform profilometry based on digital tim...

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6th International Conference on Optical and Photonic Engineering (icOPEN)

作者： Zhou, Canlin Li, XiaoLei Si, Shuchun Lei, Zhenkun Li, YanJie Shandong Univ Sch Phys Jinan 250100 Shandong Peoples R China Hebei Univ Technol Sch Mech Engn Tianjin 300130 Peoples R China Dalian Univ Technol Dept Engn Mech Dalian 116024 Peoples R China Jinan Univ Sch Civil Engn & Architecture Jinan 2250020 Shandong Peoples R China

ISBN: (纸本)9781510622579

In order to avoid frequency aliasing, improve the spatial resolution of the phase map in Fourier transform Profilometry(FTP), an approach based on the digital time-multiplexing technique is proposed to remove the background component from the deformed fringe pattern. Firstly, a sinusoidal fringe pattern is projected onto the tested object by digital-light-processing(DLP) projector, the fringe pattern modulated by the object's surface is captured by a CCD camera. Secondly, apply Fourier transform to the captured fringe pattern to obtain the spectrum. Thirdly, rotate the specimen's fringe pattern 90-deg to obtain the rotated fringe pattern, then obtain the new spectrum corresponding to the rotated fringe pattern. Fourthly, the new spectrum is subtracted from the original spectrum, clip the negative going values in the resultant spectrum by digital manipulation. Fifthly, filter out the first-order spectrum from the resultant spectrum by the band filter, apply inverse Fourier transform to the selected spectrum to obtain complex fields, then retrieve the phase, unwrap the wrapped phase map by the phase unwrapping algorithm. Finally, the simulation and experimental evaluations are conducted to prove the validity and performance of the proposed method. The results are analyzed and compared with those of the conventional method. The effectiveness and superiority of the proposed method have been demonstrated and verified.

关键词： phase-shifting algorithm Fourier transform phase measuring profilometry(PMP) filtering

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