Functional test content to screen for electrical marginalities during silicon validation are not generated with the goal of identifying speed-limiting paths, adversely affecting the quality and efficiency of validatio...
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ISBN:
(纸本)9781424472055
Functional test content to screen for electrical marginalities during silicon validation are not generated with the goal of identifying speed-limiting paths, adversely affecting the quality and efficiency of validation We propose a methodology to generate functional tests to excite pre-silicon timing-critical paths along with environmental effects such as voltage droop. These tests are to replace random/function-targeted content as the source for identifying speed failures during silicon validation The effectiveness of this methodology
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