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2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI)

作者： Li Pan Wang Shaojun Ma Ning Liu Datong Department of Automatic Test and Control Harbin of Institute of Technology

ISBN: (纸本)9781509050369;9781509050352

The program memory of the on-board computer for satellite is susceptible to the space radiation effect. In order to overcome this problem, a reliable strategy to comprise a storage unit with NOR Flash was proposed for space application. And a fault-tolerant approach based on triple modular redundancy(TMR) was employed to correct the error by radiation effect. Meanwhile, several backup partitions were designed in the single-chip flash to further enhance the faulttolerant ability of on-board computer. Another obstacle for TMR program memory system is how to download the program into each chip or partition on board with one download interface. A TMR-Switch program downloading method was proposed to overcome it by setting download data path and controlling memory partitions. Experiments on three NOR Flash chips and ZYNQ processor was conducted, and the results showed great capability in correcting faults in the onboard computer program file.

关键词： On-board computer program memory Fault-tolerant TMR

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Instruction-Vulnerability-Factor-Based Reliability Analysis Model for program memory

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JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2016年第6期32卷 695-703页

作者： Chen, Qingyu Chen, Li Wang, Haibin Wu, Longsheng Li, Yuanqing Zhao, Xing Chen, Mo Xian Microelect Technol Inst Xian 710065 Shaanxi Peoples R China Univ Saskatchewan Saskatoon SK S7N 5B5 Canada Hohai Univ Coll IOT Engr Nanjing Jiangsu Peoples R China Chinese Acad Sci Inst Microelect Beijing Peoples R China

Bit faults induced by single-event upsets in instruction may not cause a system to experience an error. The instruction vulnerability factor (IVF) is first defined to quantify the effect of non-effective upsets on program reliability in this paper;and the mean time to failure (MTTF) model of program memory is then derived based on IVF. Further analysis of MTTF model concludes that the MTTF of program memory using error correcting code (ECC) and scrubbing is not always better than unhardened program memory. The constraints that should be met upon utilizing ECC and scrubbing in program memory are presented for the first time, to the best of authors' knowledge. Additionally, the proposed models and conclusions are validated by Monte Carlo simulations in MATLAB. These results show that the proposed models have a good accuracy and their margin of error is less than 3 % compared with MATLAB simulation results. It should be highlighted that our conclusions may be used to contribute to selecting the optimal fault-tolerant technique to harden the program memory.

关键词： Instruction vulnerability factor (IVF) program memory Reliability model Mean time to failure (MTTF) Monte Carlo simulation

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Mathatron: a New Concept in Electronic Computation

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2017年

Mathatron: a New Concept in Electronic Computation: by published by

关键词： calculations computation computation: concept digits electronic electronic calculator electronic interface level punched mathatron mathatron: printed program program memory punched punched paper registers storage registers stored

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Pro-Log :: Pls 400 :: the Designers Guide to programmed Logic for Pls 400 Systems Aug73

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2016年

[Auto Generated] OF RAM RAM EVEN I/O PORT DEVICE PIN 10 REGISTER SELECTED RAM # REGISTER TYPE WIRED 0 0 0 0 1 1 0 1 4002-1 HIGH 2 2 0 2 3 3 0 3 4 4 1 0 5 5 i 1 4002-1 LOW 6 6 1 2 7 7 1 3 8 8 2 0 9 9 2 1 4002-2 HIGH A ... 详细信息