Although critical for delivering resilient, secure, efficient, and easily changed IT systems;cross-technology, cross-layer quality defect detection in IT systems still faces hurdles. Two hurdles involve the absence of...
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(纸本)9781467370349
Although critical for delivering resilient, secure, efficient, and easily changed IT systems;cross-technology, cross-layer quality defect detection in IT systems still faces hurdles. Two hurdles involve the absence of an absolute target architecture and the difficulty of apprehending multi-component anti-patterns. However, Static analysis and measurement technologies are now able to both consume contextual input and detect system-level anti-patterns. This paper will provide several examples of the information required to detect system-level anti-patterns using examples from the Common Weakness Enumeration repository maintained by MITRE Corp.
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