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检索条件"主题词=structure-based testing"
7 条 记 录,以下是1-10 订阅
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Random vs. structure-based testing of Answer-Set Programs: An Experimental Comparison
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11th International Conference on Logic Programming and Nonmonotonic Reasoning (LPNMR)
作者: Janhunen, Tomi Niemela, Ilkka Oetsch, Johannes Puehrer, Joerg Tompits, Hans Aalto Univ Dept Informat & Comp Sci POB 15400 FI-00076 Aalto Finland Techn Univ Wien Inst Informat Syst A-1040 Vienna Austria
Answer-set programming (ASP) is an established paradigm for declarative problem solving, yet comparably little work on testing of answer-set programs has been done so far. In a recent paper, foundations for structure-... 详细信息
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Toward an integration of data flow and domain testing
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JOURNAL OF SYSTEMS AND SOFTWARE 1999年 第1期45卷 19-30页
作者: Jeng, B Natl Sun Yat Sen Univ Dept Informat Management Kaohsiung 80424 Taiwan
Data flow and domain testing are both well-known program-based testing techniques. Each has its intuitive appeal, but their widespread use has been hampered by practical limitations. Data flow testing provides a numbe... 详细信息
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Verification of a safety-related I&C system for nuclear power plant by model checking, test case generation and automatic testing  27
Verification of a safety-related I&C system for nuclear powe...
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IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)
作者: Ausberger, Tomas Kubicek, Karel Medvecova, Pavla Wolf, Jindrich Univ West Bohemia NTIS New Technol Informat Soc Fac Appl Sci Tech 8 Plzen 30614 Czech Republic
This article describes a process for modern verification of safety-related I&C (Instrumentation and Control) systems based on algorithm model checking, model-based test case generation and automatic testing. The v... 详细信息
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Sequential test generators: past, present and future
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INTEGRATION-THE VLSI JOURNAL 1998年 第1-2期26卷 41-54页
作者: Kim, YC Saluja, KK Univ Wisconsin Dept Elect & Comp Engn Madison WI 53706 USA
With the growth in complexity of very large scale integration (VLSI) circuits, test generation for sequential circuits is becoming increasingly difficult and time consuming. Even though the computing power and resourc... 详细信息
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Automatic test set generation for function block based systems using model checking  9
Automatic test set generation for function block based syste...
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9th International Conference on the Quality of Information and Communications Technology (QUATIC)
作者: Lahtinen, Jussi VTT Tech Res Ctr Finland Espoo Finland
Many nuclear instrumentation and control (I&C) systems are designed using a function block diagram description of the system. Strict requirements pertain to the verification of these systems. Different verificatio... 详细信息
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Test case generation for Function Block Diagram based on blocks' predefined behaviour  23
Test case generation for Function Block Diagram based on blo...
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23rd International Conference on Process Control (PC)
作者: Ausberger, Tomas Kubicek, Karel Medvecova, Pavla Myslivec, Tomas Univ West Bohemia NTIS New Technol Informat Soc Fac Appl Sci Tech 8 Plzen 30614 Czech Republic
Automatic test case generation based on knowledge of a model is currently a challenge for many researchers and developers. This article describes the first of two complementary methods for test case generation for Fun... 详细信息
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Model Checking Large Nuclear Power Plant Safety System Designs
Model Checking Large Nuclear Power Plant Safety System Desig...
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作者: Jussi Lahtinen Aalto University
学位级别:博士
Digital instrumentation and control (I&C) systems are increasingly being used for implementing safety-critical applications such as nuclear power plant safety systems. The exhaustive verification of these systems ... 详细信息
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