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25th Euromicro Conference on Digital System Design (DSD)

作者： Novak, Ondrej Tech Univ Liberec Inst Informat Technol & Elect Liberec Czech Republic

ISBN: (纸本)9781665474047

This paper deals with extending linear compression codes by nonlinear check bits that improve the usability of decompressed patterns for testing circuits with more inputs. The earlier works used a purely random or partially random search of the nonlinear check-bits truth tables to construct the first nonlinear structures. Here, we derive deterministic rules that characterize the relationship among the nonlinear code check bits. The efficiency of the rules is demonstrated on different codes with the number of specified bits equal to three. The code parameters obtained after applying the rules overperform the parameters of the linear codes. Keeping the restrictions makes the search for the check bit truth tables faster and more efficient than can be got by a simple random search. The reached nonlinear block code (136,5,3) is the most efficient code among other loose compression codes.

关键词： test vector compression technique Pseudo-exhaustive testing Binary nonlinear codes Graph theory Minimum clique cover problem Design for testability

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Nonlinear compression block codes: Exact and random search strategy

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MICROPROCESSORS AND MICROSYSTEMS 2023年第1期101卷

作者： Novak, Ondrej Tech Univ Liberec Inst Informat Technol & Elect Liberec Czech Republic

The nonlinear block codes have significantly better testing abilities than the linear ones used in Built-In Self test Equipment or test pattern decompressors. Unfortunately, no sufficiently effective deterministic code creation strategy has been discovered till now. This paper deals with a deterministic nonlinear code search strategy and a strategy based on extending linear compression codes by nonlinear check bits that improve the usability of decompressed patterns for testing circuits with more inputs. The earlier works used a purely or partially random search of the nonlinear check-bits truth tables to construct the first nonlinear structures. Here, we derive deterministic rules that can be used for the iterative process of code generation with no necessity of any random search for codes with the number of specified bits equal to three. We compare the code parameters of codes based on linear code extension, direct deterministic code search methods, and previously published results. The most extensive codes still need to be constructed with a partial random search strategy, but keeping the restrictions introduced in the paper causes the search to be substantially more efficient.

关键词： test vector compression technique Pseudo-exhaustive testing Binary nonlinear block codes Graph theory Minimum clique cover problem Design for testability

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Search Strategy of Large Nonlinear Block Codes 24

Search Strategy of Large Nonlinear Block Codes

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24th Euromicro Conference on Digital System Design (DSD)

作者： Novak, Ondrej Tech Univ Liberec Inst Informat Technol & Elect Liberec Czech Republic

ISBN: (纸本)9781665427036

test pattern compression techniques reduce the amount of transferred data while decompressed pattern flexibility remains high. The flexibility can be measured by the guaranteed number of specified test pattern bits, equal to or greater than the number of care bits in the pattern. This paper addresses the problem of test pattern compression and decompression using nonlinear codes. test patterns can be encoded using a linear code that leads to an XOR network that decompresses the compressed patterns transferred from a tester. This XOR network can be completed or replaced by a standard (nonlinear) combinational network with substantially improved compression efficiency. The problem of finding the code was formulated as a clique cover problem. This approach's tight throat lies in computational complexity and the needed memory capacity to temporarily retain intermediate results of clique coverage search attempts. The paper proposes a method that substantially reduces the computational time to get a robust nonlinear code with decompression ability. It shows that random search algorithms cannot reach the code parameters obtained by a restricted iterative search proposed in the paper. Additional knowledge concerning the check-bit truth table characteristics was used to avoid unsuccessful investigations. The proposed decompressor schemes have higher efficiency than till now known decompressor constructions. On the other hand, finding other heuristics that provide efficient codes for a broader class of code parameters is challenging than the proposed solution.

关键词： BIST Design for testability test vector compression technique Pseudo-exhaustive testing Binary nonlinear codes Graph theory Minimum clique cover problem

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Nonlinear compression Codes Used In IC testing 22

Nonlinear Compression Codes Used In IC Testing

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22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

作者： Novak, Ondrej Tech Univ Liberec Inst Informat Technol & Elect Liberec Czech Republic

ISBN: (纸本)9781728100739

It was found that the linear binary codes can be extended by a relatively high number of nonlinear check bits in such a way that the code words preserve the value of the maximum number of independently specified bits from the original linear code words. These extended nonlinear binary codes can be used for pattern compression and decompression. The number of scan chains loaded in parallel from the sequential decompressor may be increased while the number of specified bits is kept. The nonlinear structures guarantee the number of independently specified bits within the whole decompressed test pattern independently on the scan chain clock cycle for a substantially higher number of parallel scan chains than the linear decompressors while the number of bits transferred from the tester is kept. We proposed an algorithm that finds the appropriate nonlinear modification circuit of the sequential decompressor and verifies the test pattern quality for different numbers of care bits in a test pattern.

关键词： BIST design for testability test vector compression technique pseudo-exhaustive testing binary codes

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Nonlinear Binary Codes and Their Utilization for test 21

Nonlinear Binary Codes and Their Utilization for Test

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21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

作者： Novak, Ondreg Tech Univ Liberec Inst Informat Technol & Elect Liberec Czech Republic

ISBN: (纸本)9781538657546

The nonlinear binary codes have a great disadvantage of difficult enumeration of the results due to the necessity of solving a nonlinear set of equations. In the common case, the computational effort will be equal to the effort of solving a set of nonlinear binary equations with a big number of variables. On the other hand, the nonlinear codes substantially overcome the best parameters of the linear ones. It is possible to design such nonlinear binary cyclic codes that have numbers of individually specified bits substantially bigger than can be obtained for linear ones. In this paper, we discuss properties of built-in pseudo-exhaustive test pattern generators and test compressors that employ the nonlinear binary codes. We elaborate the previous results with new simulations. The results can be used for generator or decompressor structure optimization. We formulate several topics that have to be solved in future to enable practical application of the nonlinear codes in testing.

关键词： BIST design for testability test vector compression technique pseudo-exhaustive testing binary codes

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test compression Using Extended Nonlinear Binary Codes 24

Test Compression Using Extended Nonlinear Binary Codes

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24th IEEE International Symposium on On-Line testing and Robust System Design (IOLTS)

作者： Novak, Ondrej Tech Univ Liberec Inst Informat Technol & Elect Liberec Czech Republic

ISBN: (纸本)9781538659922

The linear binary codes can be extended by a relatively high number of nonlinear check bits in such a way that the code words preserve the value of the maximum number of independently specified bits from the original linear code words. A substantial improvement can be achieved in the field of sequential pattern compression using these nonlinear codes. The number of scan chains loaded in parallel can be increased while the number of specified bits is kept. We propose an algorithm that finds the appropriate nonlinear modification circuit structure and verifies the test pattern quality for different numbers of care bits in a test pattern.

关键词： BIST design for testability test vector compression technique pseudo-exhaustive testing binary codes

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test compression Using Extended Nonlinear Binary Codes

Test Compression Using Extended Nonlinear Binary Codes

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IEEE International Symposium on On-Line testing and Robust System Design

作者： Ondrej Novak Institute of lnformation Technologies and Electronics Technical University in Liberec Czech Republic

关键词： BIST design for testability test vector compression technique pseudo-exhaustive testing binary codes

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Extended Binary Nonlinear Codes and Their Application in testing and compression 22

Extended Binary Nonlinear Codes and Their Application in Tes...

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22nd IEEE European test Symposium (ETS)

作者： Novak, Ondrej Tech Univ Liberec Inst Informat Technol & Elect Liberec Czech Republic

ISBN: (纸本)9781509054572

In this paper, we show that the binary linear codes can be extended by a relatively big number of check bits in such a way that the code words preserve the value of a maximum number of independently specified bits from the original linear code words. It can improve pattern compression and-or pseudo-exhaustive testing. Existing linear compression and testing techniques adopt linear codes either for pattern expansion in the decompressor or for pattern generation. The minimum code distance of the dual linear code determines the encoding efficiency, the greater distance causes the bigger maximum number of independently specified bits on the decompressor outputs. While keeping the number of specified bits for longer code words the extended codes provide a possibility of feeding more parallel scan chains with the decompressor output bits. In the case of pseudo-exhaustive test pattern generators, the extended nonlinear codes guarantee an existence of the universal pseudo-exhaustive test set with better parameters than can be obtained for linear test pattern generators. We compare the properties of the extended non-linear and linear codes and demonstrate the effectiveness of the decompressors using these codes.

关键词： BIST design for testability test vector compression technique pseudo-exhaustive testing

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