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检索条件"主题词=trace data compression"
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Efficient trace data compression using Statically Selected Dictionary
Efficient Trace Data Compression using Statically Selected D...
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29th IEEE VLSI Test Symposium (VTS)/Workshop on Design for Reliability and Variability (DRV)
作者: Basu, Kanad Mishra, Prabhat Univ Florida Gainesville FL 32611 USA
Post-silicon validation and debug have gained importance in recent years to track down errors that have escaped the pre-silicon phase. Limited observability of internal signals during post-silicon debug necessitates t... 详细信息
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X-tracer: A Reconfigurable X-Tolerant trace Compressor for Silicon Debug  12
X-Tracer: A Reconfigurable X-Tolerant Trace Compressor for S...
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49th ACM/EDAC/IEEE Design Automation Conference (DAC)
作者: Yuan, Feng Liu, Xiao Xu, Qiang Chinese Univ Hong Kong CUhk REliable Comp Lab CURE Dept Comp Sci & Engn Shatin Hong Kong Peoples R China
The effectiveness of at-speed silicon debug is constrained by the limited trace buffer size and/or trace port bandwidth, requiring highly-efficient trace data compression solutions. As it is usually inevitable to have... 详细信息
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