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检索条件"主题词=transition fault coverage"
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A Controller Augmentation Method to Improve transition fault coverage for RTL Data-Paths  25
A Controller Augmentation Method to Improve Transition Fault...
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IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)
作者: Takeuchi, Yuki Hosokawa, Toshinori Yamazaki, Hiroshi Yoshimura, Masayoshi Nihon Univ Grad Sch Ind Technol Chiba Japan Nihon Univ Coll Ind Technol Chiba Japan Kyoto Sangyo Univ Fac Informat Sci & Engn Kyoto Japan
With the growing clock frequencies and complexity for VLSIs, transition fault testing is required. Him Clef , the number of untestable transition faults is generally much more than that of untestable stuck-at faults d... 详细信息
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A State Assignment Method to Improve transition fault coverage for Controllers  32
A State Assignment Method to Improve Transition Fault Covera...
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IEEE International Symposium on Defect and fault Tolerance in VLSI and Nanotechnology Systems (DFT)
作者: Yoshimura, Masayoshi Takeuchi, Yuki Yamazaki, Hiroshi Hosokawa, Toshinori Kyoto Sangyo Univ Fac Informat Sci & Engn Kita Ku Kyoto 6038555 Japan Nihon Univ Grad Sch Ind Technol 1-2-1 Izumi Cho Narashino Chiba 2758575 Japan Nihon Univ Coll Ind Technol 1-2-1 Izumi Cho Narashino Chiba 2758575 Japan
Recently, it is indispensable to test in transition fault model due to timing defects increase along with complication and high speed of VLSI. However, the transition fault coverage tends to be lower than the stuck-at... 详细信息
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