With the growing clock frequencies and complexity for VLSIs, transitionfault testing is required. Him Clef , the number of untestable transitionfaults is generally much more than that of untestable stuck-at faults d...
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ISBN:
(纸本)9781728124902
With the growing clock frequencies and complexity for VLSIs, transitionfault testing is required. Him Clef , the number of untestable transitionfaults is generally much more than that of untestable stuck-at faults due to the circuit structures and functions of VLSIs. From the view point of current structural testing, transition fault coverage might be insufficient and potential timing defects might be escaped. Therefore, design-for-testability to improve transition fault coverage is important. In this paper, we propose a controller augmentation method in addition to scan design, to improve transition fault coverage with reducing the number of untestable faults. Experimental results on high-level synthesis benchmark circuits show that the transition fault coverage was improved by 4.75 and the number of untestable faults was reduced by 76.93% on average.
Recently, it is indispensable to test in transitionfault model due to timing defects increase along with complication and high speed of VLSI. However, the transition fault coverage tends to be lower than the stuck-at...
详细信息
ISBN:
(纸本)9781728122601
Recently, it is indispensable to test in transitionfault model due to timing defects increase along with complication and high speed of VLSI. However, the transition fault coverage tends to be lower than the stuck-at faultcoverage due to untestable faults caused by the circuit structure. Low transition fault coverage may not be able to detect potential timing defects. Therefore, it is important to design-for-testability (DFT) to improve transition fault coverage. In this paper, we show that transition fault coverages depend on state assignment to a controller in RTL netlists. We propose a QDT value which is an evaluation index on transition fault coverage for state assignment. Experimental results show that state assignment with high evaluation index has high transition fault coverages.
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