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检索条件"机构=ee"
4 条 记 录,以下是1-10 订阅
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Software tools for scan test
EE: Evaluation Engineering
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ee: Evaluation Engineering 1991年 第6期30卷
作者: Jacob, Gerald EE
Test engineers have been asking designers to implement DFT for more than a decade. By now, most designers have received the message and many have grudingly - and a few willingly - responded. An increasing number of bo... 详细信息
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Higher frequency devices require characterization
EE: Evaluation Engineering
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ee: Evaluation Engineering 1991年 第6期30卷
作者: O'Shea, Paul EE
The RF/microwave test equipment market is one of the most rapidly growing in the electronics industry. The RF communications segment alone is expected to swell from the current $360 million to $2 billion by the year 2... 详细信息
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New devices demand exacting programming facilities
EE: Evaluation Engineering
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ee: Evaluation Engineering 1991年 第6期30卷 9-11页
作者: Jacob, Gerald EE
The programmable memory device population keeps increasing in proportion to the number of electronic systems being produced. PLDs, on the other hand, have experienced phenomenal growth (approximately 50% AGR in the la... 详细信息
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Decentralized capacity reallocation for a loss network  46th
Decentralized capacity reallocation for a loss network
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Annual Conference on Information Sciences and Systems (CISS)
作者: A. Kurve G. Pang G. Kesidis G. de Veciana EE IE ECE Dept University of Texas Austin
Stochastic loss network models have been widely used to study the characteristics of a large class of resource constrained networks in terms of their blocking probability. We consider a distributed capacity allocation... 详细信息
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