A new material structure with Al 0.22Ga 0.78As/In 0.15Ga 0.85As/GaAs emitter spacer layer and GaAs/In 0.15- Ga 0.85As/GaAs well for resonant tunneling diodes is designed and the corresponding device...
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A new material structure with Al 0.22Ga 0.78As/In 0.15Ga 0.85As/GaAs emitter spacer layer and GaAs/In 0.15- Ga 0.85As/GaAs well for resonant tunneling diodes is designed and the corresponding device is *** DC characteristics are measured at room temperature. Peak-to-valley current ratio and the available current density for RTDs at room temperature are *** on these results suggests that adjusting material structure and optimizing fabrication processes will be an effective means to improve the quality of RTDs.
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