Erbium （Er） doped in nanocrystalline Si （nc-Si：Er） surrounded by SiO2 is investigated by selectivelyexcited photoluminescence（PL） technique. Optical transitions come from nc-Si （peak located at 1.39 eV, denote...
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Erbium （Er） doped in nanocrystalline Si （nc-Si：Er） surrounded by SiO2 is investigated by selectivelyexcited photoluminescence（PL） technique. Optical transitions come from nc-Si （peak located at 1.39 eV, denoted as Enc-Si） and Er ions （peak located at 0. 81 eV, denoted as EEr） are measured when nc-Si：Er is excited by 1. 519 eV or higher excitation photon energy（Eex）. Although the Eex of 1.42 eV exceeds the peak energies of Enc-Si and EEr the Enc-Si and EE, emissions are unobserved. A resonant enhancement of the EEr emission is observed in nc-Si：Er. While the PL peak intensitiy of the Enc-Si transition is quenched under this Eex. The resonant-enhanced effect in nc-Si ：Er indicates that the energy transfer process of carriers from nc-Si to nearby Er ions is enhanced by resonant excitation.
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