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检索条件"机构=2Science and Technology on Reliability Physics and Application of Electronic Component Laboratory"

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Research on IC-LOGO Extraction Algorithm Based on Deep Semantic Segmentation Network 6

Research on IC-LOGO Extraction Algorithm Based on Deep Seman...

引用

6th International Conference on Artificial Intelligence and Computer applications, ICAICA 2024

作者： Zhao, Yue Guan, Mingfeng Luo, Jun Zhang, Qiuzhen China Electronic Product Reliability and Environmental Testing Research Institute Science and Technology on Reliability Physics and Application of Electronic Component Laboratory Guangzhou China China Electronic Product Reliability and Environmental Testing Research Institute Testing Center of Electronic Components Guangzhou China

ISBN: (纸本)9798350377255

Considering the characteristics of the logo and character areas being intertwined, along with the variability in size and irregularity in shape of logos within integrated circuit (IC) identification images, this paper propose a logo extraction algorithm based on a deep semantic segmentation network. Initially, preprocessing and data augmentation techniques are employed to facilitate the creation of an IC identification dataset, alongside the establishment of a semantic segmentation dataset specifically for the LOGO area. Subsequently, network models including DeepLabv3+, U-Net, PSPNet, and HRNet are trained and validated to identify the optimal model for IC logo extraction. The experimental results indicate that the deep semantic segmentation network demonstrates effective segmentation performance in the extraction of integrated circuit logos, with the HRNet model achieving high segmentation accuracy and an average intersection-over-union ratio of 80%. © 2024 IEEE.

关键词： Semantic Segmentation

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Research on Failure Mechanism of High-Power Tapered Semiconductor Laser

Research on Failure Mechanism of High-Power Tapered Semicond...

引用

2023 Applied Optics and Photonics China: Laser technology and applications;and Optoelectronic Devices and Integration, AOPC 2023

作者： Liao, WenYuan Chen, XingMian Liu, YueBo Li, ShuWang Yang, ShaoHua Lai, CanXiong Lu, GuoGuang Science and Technology on Reliability Physics and Application of Electronic Component Laboratory The Fifth Electronic research institute of the Ministry of Industry and Information Technology Guangzhou511370 China

ISBN: (纸本)9781510672246

Tapered semiconductor lasers are widely used in space communication due to their high output power and high beam quality. The tapered semiconductor laser structure mainly consists of ridge region, absorption region and tapered region. The tapered semiconductor laser is analyzed by characterization methods such as EMMI, EDS and FIB-SEM in this paper. It is found that the waveguide damage in the ridge region is caused by the enhancement of the local optical power density in the ridge waveguide, and there are failure points inside the waveguide and the sidewall of the device, resulting in photon leakage. The closer to the optical cavity surface, the more holes between the solder and the electrodes, and the presence of oxygen elements near the optical cavity surface, indicating that the interface holes existing in the optical cavity surface would lead to the migration of oxygen elements. The research results reveal that the enhancement of local power density in the ridge waveguide is caused by the optical feedback process. The main failure mechanisms of the device contain the solder holes and the enhancement of local power density, which provide an important reference for the process optimization of high-power tapered semiconductor lasers. © 2023 SPIE.

关键词： Semiconductor lasers

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Vibration reliability Analysis of the Gold Wire Leads of MEMS Inertial Devices 14

Vibration Reliability Analysis of the Gold Wire Leads of MEM...

引用

14th International Conference on reliability, Maintainability and Safety, ICRMS 2023

作者： Xu, Yingyu He, Chunhua Huang, Qinwen Guangdong University of Technology School of Computer Guangzhou China CEPREI Science and Technology on Reliability Physics and Application of Electronic Component Laboratory Guangzhou China

ISBN: (纸本)9798350329988

With the rapid development of the Internet of Things (IoT), MEMS inertial devices are being employed for various applications such as in smart homes, unmanned aerial vehicles, and aerospace. The MEMS inertial devices are exposed to harsh vibration environments, and the deformation of the internal bonding wire may cause reliability issues such as short circuits and fracture failures. The reliability of the gold wire leads of MEMS inertial devices in practice is theoretically analyzed to study the failure mechanisms. The failures caused by the resonance of the wire leads attributed to the mechanical vibration at different temperatures are studied by establishing finite element method models, and the inherent frequency and stress distribution of the wire lead are obtained. The root of the wire lead has the highest stress, and it is the weakest link. Further, the reliability of the wire lead can be improved by increasing its diameter or shortening its length. © 2023 IEEE.

关键词： Vibration analysis

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Effect of Residual Stress After Reflow Soldering of Ball Grid Array Mixed Solder Joint on Thermal Cycling reliability 14

Effect of Residual Stress After Reflow Soldering of Ball Gri...

引用

14th International Conference on reliability, Maintainability and Safety, ICRMS 2023

作者： Chen, Fangzhou Liu, Jiahao Wu, Jianyu Zhao, Hao Xiao, Hui Lu, Tao Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Guangzhou China Reliability Research and Analysis Center Ceprei Laboratory China Electronic Product Reliability and Environmental Testing Guangzhou China

ISBN: (纸本)9798350329988

This study investigates the influence of residual stress after reflow soldering on the thermal cycling of a ball grid array (BGA). The devices were analyzed after thermal cycling using methods such as macroscopic morphology observation and microscopic structure evolution. The residual stress and strain of an Sn63Pb37/Sn3.0Ag0.5Cu mixed BGA structure were obtained by applying the reflow soldering temperature profile through finite element simulation. Subsequently, temperature cycling loads were applied to the BGA package model after reflow soldering. The thermal fatigue life of the BGA solder joints was predicted using the Darveaux fatigue model based on the strain energy damage. The results showed that considering the residual stress after reflow soldering in the simulation, the equivalent plastic strain was relatively large. The maximum stress was located at the corners where the solder joints contacted the PCB and chip. Microscopic cracks were formed on the interface at the chip-end in critical solder joints. The life prediction indicated that the relatively high residual stress generated during the reflow soldering process had negligible effect on the thermal fatigue performance of the hybrid BGA solder joints. © 2023 IEEE.

关键词： Ball grid arrays

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Improving the sensitivity of diamond NV center ensemble magnetometer based on microsphere

Improving the sensitivity of diamond NV center ensemble magn...

引用

2024 International Conference on Optical and Photonic Engineering, icOPEN 2024

作者： Zhou, Yangyang Tang, Jiong Ma, Bingxu Qiu, Jian Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Produce Reliability and Environmental Testing Research Institute Guangzhou Guangdong510610 China School of Electronic and Information Engineering South China Normal University Foshan Guangdong528225 China

ISBN: (数字)9781510688117

ISBN: (纸本)9781510688100

Diamond nitrogen-vacancy (NV) center ensemble magnetometer is a novel solid quantum magnetometer with high sensitivity and high spatial resolution, which can be used at normal temperature and pressure. However, the low fluorescence collection efficiency of the magnetometer in confocal optical system hinders further improvement in sensitivity. To solve the problem, based on silica microspheres, we propose a method to enhance the excitation and collection efficiency of NV center ensemble in massive diamond. Experimental results show, compared with the NV diamond magnetometer without microspheres, the photon collection efficiency of NV diamond magnetometer coated with a layer of microspheres is increased by 110%. Thus, the sensitivity of the NV center magnetometer is increased by 4 times to 5.3μT/√Hz. © 2025 SPIE.

关键词： Microspheres

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Effect of Integration Time on the Performance Parameters of InGaAs Detectors

Effect of Integration Time on the Performance Parameters of ...

引用

2024 Conference on Spectral technology and applications, CSTA 2024

作者： Luo, Xi Liu, Yuebo Zhang, Yichi Lu, Jianting Wei, Zhipeng Yang, Shaohua State Key Laboratory of High Power Semiconductor Lasers Changchun University of Science and Technology Changchun130022 China Reliability Physics and Application Technology of Electronic Component Key Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou511370 China

ISBN: (纸本)9781510683082

Shortwave infrared imaging has the characteristics of high recognition and all-weather adaptation. Consequently, InGaAs short-wave infrared (SWIR) detectors find extensive applications in military and civilian fields, which imposes higher performance demands on InGaAs SWIR detectors. To optimize the performance and effectiveness of InGaAs SWIR detectors, this study delves into the fluctuation patterns of detectivity, responsivity, and dynamic range concerning integration time. Furthermore, it examines the outcomes of these parameters at various integration times. It is observed that the performance of InGaAs SWIR detectors changes at different integration times, and each parameter exhibits specific variation patterns with integration time. © 2024 SPIE.

关键词： Infrared detectors

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Synthesis and characterization of photosensitive humidity-responsive cobalt ion coordination polyurethanes

Synthesis and characterization of photosensitive humidity-re...

引用

2023 International Conference on Optoelectronic Materials and Devices, ICOMD 2023

作者： Wei, Yanhong Yun, Tian Yu, Xiaowen Zhang, Luziping Xiao, Fei Wang, Lian Chongqing CEPREI Industrial Technology Research Institute Co. Ltd Chongqing401332 China Science and Technology on Reliability Physics and Application of Electronic Component Laboratory CEPREI Guangzhou511370 China

ISBN: (纸本)9781510674509

CoPU films with different complexing ratios were synthesized by coordination modification experiments on polyurethane using cobalt chloride as the complexing agent. In view of the phenomena that the colour of CoPU film changed from blue to pink and the transparency decreased during the process of storage in a humidity environment, the FT-IR spectra and the humidity response of the transmittance were studied. The results show that CoPU films absorb water to form a coordinated crystalline water structure in the humidity environment, and the cobalt ion configuration changes from sp3 tetrahedron state to d2sp3 octahedron state, resulting in the change of colour and transparency. This process is reversible. Meanwhile, there is a good linear relationship between the moisture absorptivity and the average transmittance of the visible light region of the low complexing ratio material films, which has application prospects of photosensitive humidity-responsive polyurethane materials. © 2024 SPIE. All rights reserved.

关键词： Polyurethanes

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Fault Diagnosis Algorithm For Power Module Based On A Hybrid Attention Network 14

Fault Diagnosis Algorithm For Power Module Based On A Hybrid...

引用

14th IEEE Global reliability and Prognostics and Health Management Conference, PHM-Hangzhou 2023

作者： Yu, Lubin Zhou, Zhenwei Huang, Yuhang Liu, Junbin He, Shilie Yu, Pengfei Meng, Linghui Hong, Danni Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou China Guangzhou Institute of Technology Xidian University Guangzhou China

ISBN: (纸本)9798350301359

Fault diagnosis has a significant contribution to the reliability of the power module, the stability and accuracy of the fault diagnosis algorithm based on single-channel data have major limitations, and existing fault diagnosis algorithms based on multichannel data have limitations such as insufficient capability of extracting features and low utilization rate of inter-channel correlation information. Therefore, in this paper, a multi-channel fault diagnosis algorithm for power modules based on a hybrid attention network is proposed, aiming at solving the problems of limited fault characterization capability of single-channel data and insufficient feature extraction of existing multi-channel input models. The hybrid attention module of this network adopts a mechanism that combines time attention and channel attention to extract the features of multi-channel data from both channel and time series dimensions of the input data in a holistic manner. The experiments have demonstrated that the hybrid attention network proposed in this paper achieves an accuracy of 99.40% in the multi-channel fault diagnosis test set, which is highly state-of-the-art and practicable, and can provide new ideas and methods for the research in fault diagnosis. © 2023 IEEE.

关键词： Attention mechanism Convolutional neural network Fault diagnosis

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Degradation mechanisms of total ionizing dose effect in photocouplers

Degradation mechanisms of total ionizing dose effect in phot...

引用

2023 Advanced Fiber Laser Conference, AFL 2023

作者： He, Yujuan Liu, Tianzi Ma, Teng Zhang, Hong Tan, Xu Lei, Zhifeng Peng, Chao Zhang, Zhangang Liu, Yuebo Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guangzhou511370 China Guangzhou Intelligent Equipment Research Institute Co. Ltd Guangzhou510535 China

ISBN: (纸本)9781510677661

This article investigates the degradation mechanisms of total ionizing dose (TID) effects in photocouplers under different bias conditions. The irradiation measurement of silicon-based photocoupler devices is carried out by using a 60Co γ-ray source under various radiation bias conditions. The results of the test indicate that the current transfer rate (CTR) of the photocoupler reduces with an increase in the total dose. In addition, the non-luminous traps produced by the TID irradiation in the diffusion region of the PN junction of the light-emitting diode within the photocoupler cause more severe total dose effects when the input current of the device is low. This could be attributed to the charges being captured more easily in such scenarios. These representative results support the reliable application of the photocoupler devices in space radiation environments. © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.

关键词： Irradiation

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A New Resonant Composite Probe for Near-field Scanning 15

A New Resonant Composite Probe for Near-field Scanning

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15th International Conference on Microwave and Millimeter Wave technology, ICMMT 2023

作者： Nie, Duan Wang, Rui-Qi Wang, Lei Shaanxi University of Science and Technology School of Electronic Information and Artificial Intelligence Xi'an710021 China Science and Technology on Reliability Physics and Application of Electronic Component Laboratory Ceprei Guangzhou511370 China

ISBN: (纸本)9798350338874

In this article, a new wideband resonant probe with two orthogonal magnetic-field measurement features is proposed. The resonant magnetic-field probe consists of two orthogonal shorted sensing loops, two transmission lines with two outputs, a pair of LC resonant circuits, a shorted via, a connected via, and two rows of coaxial via fences. The LC resonant circuits including a pair of shorted stubs as additional inductor and open stubs as additional capacitor are used to excite resonant mode. The connected and shorted vias are used to form the orthogonal sensing loops. In order to verify the design rationality, the proposed probe is optimized, manufactured, and measured. The simulated results reveal the proposed probe could simultaneously test two orthogonal magnetic-field components at 1.575 GHz. © 2023 IEEE.

关键词： Resonant circuits

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