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检索条件"机构=ASIC&System State-Key Lab"
813 条 记 录,以下是711-720 订阅
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Interfacial depletion layers evidenced from dielectric relaxation current in ferroelectric thin films
Interfacial depletion layers evidenced from dielectric relax...
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ICSICT-2006: 2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Jiang, A.Q. Lin, Y.Y. Tang, T.A. ASIC and System State Key Lab Department of Microelectronics Fudan University Shanghai 200433 China
The relaxation current decays with time t to follow the Curie-von Schweidler law of Jr(t) = J0t-n with the exponent n slightly less than the unity either under or after dc-voltage stressing of Pb(Zr,Ti)O3 thin films, ... 详细信息
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The failure mechanism of gate resistance testing for power MOSFET
The failure mechanism of gate resistance testing for power M...
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ICSICT-2006: 2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Pan, Shaohui He, Lunwen Zhang, David Wei Wang, L.K. Department of Microelectronics ASIC and System State Key Lab. Fudan University Shanghai 200433 China
The vertical DMOS (Double Diffused MOSFET) is widely used in power microelectronics, its switching performance is determined mainly by the gate resistance and the input capacitance. Thus a gate resistance testing tech... 详细信息
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A systematic error model of high-resolution pipelined analog-to-digital converters
A systematic error model of high-resolution pipelined analog...
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2006 49th Midwest Symposium on Circuits and systems, MWSCAS'06
作者: Tingqian, Chen Bingkun, Yao Jun, Xu Junyan, Ren ASIC and System State Key Lab. Dept. of Microelectronics Fudan University Shanghai China
This work presents a systematic error model of high-resolution pipelined analog-to-digital converters (ADCs) implemented in MATlab. Many errors limit linearity or noise performance of high-resolution ADCs, such as sam... 详细信息
来源: 评论
Heel crack and lead-free soldering issues affecting power electronics packages
Heel crack and lead-free soldering issues affecting power el...
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2006 IEEE Region 10 Conference, TENCON 2006
作者: He, Lunwen Pan, Shaohui Wang, L.K. Zhang, David Wei IEEE ASIC and System State Key Lab. Fudan University 220 Handan Road Shanghai 200433 China
Heel crack is one of the most complicated reliability problems of wire bonding in the power electronic package. In this work, we investigate the effects of solder IR reflow to the heel crack both in experimental and F... 详细信息
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The Study of the Gas Microsensors Based on Polymer-Carbon Black Composites
The Study of the Gas Microsensors Based on Polymer-Carbon Bl...
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2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Haifen Xie Jiangsheng Wu Peng Huang XinmingJi Yiping Hunag Department of Physics East China University of Science and Technology ASIC and System State Key Lab Department of MicroelectronicsFudan University
In this paper,we study a novel chemical gas sensor arrays based on polymer-carbon black *** two different polymers which are poly(4-vinyl phenol), poly(ethylene oxide) are employed as the sensor materials which are im... 详细信息
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Design and simulation of ID longitudinal acoustic resonator for photoacoustic spectroscopy
Design and simulation of ID longitudinal acoustic resonator ...
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ICSICT-2006: 2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Jia, Luo Xinming, Ji Jianye, Wang Jia, Zhou Guoping, Ru Yiping, Huang ASIC and System State Key Lab. School of Microelectronics Fudan University 2 0 Handan Road Shanghai 200433 China
The design of acoustic resonator is critical for the sensitivity of photoacoustic (PA) gas detection. In this paper, a LC Circuit model is built for the simulation of ID acoustic resonator with considerations of some ... 详细信息
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Electrical properties study of Ni (Pt)-silicide/Si contacts
Electrical properties study of Ni (Pt)-silicide/Si contacts
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ICSICT-2006: 2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Huang, Yifei Jiang, Yu-Long Ru, Guo-Ping Lu, Fang Cai, Qijia Cao, Shihai Li, Bing-Zong ASIC and System State Key Lab. School of Microelectronics Fudan University Shanghai 200433 China State Key Lab. of Applied Surface Physics Fudan University Shanghai 200433 China
The electrical propertie of Ni (Pt)-silicide/Si contact is studied and it is revealed that the Schottky barrier contact obeys a complicated two Gauss distribution. It is demonstrated that the Pt interface layer can no... 详细信息
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Methodology of the design for segments-switchable switch blocks
Methodology of the design for segments-switchable switch blo...
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ICSICT-2006: 2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Shen, Qiushi Tan, Jun Tong, Jiarong Wang, Lingli Lai, Jinmei State Key Lab. of ASIC and System Fudan University Pudong High-Tech. Park Zhangheng Road 825 Shanghai 201203 China
Previous researches on switch blocks focused on the analysis of individual switch blocks that contain single length segments. In those switch blocks, segments of different length are separated from each other, which r... 详细信息
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ALo Cost design for timized I C and de antization of
ALo Cost design for timized I C and de antization of
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2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Lin Yi-fan Zeng Xiao-yang Chen Jun Zhang Zhang State Key Lab of ASIC & System Fudan University
<正>H.264 also known as MPEG4 part 10 is a promising video coding standard for the next generation video *** meet the needs of low cost H.264 decoders,this paper presents a low cost hardware implementation for the i... 详细信息
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METHODOLOGY OF THE DESIGN FOR SEGMENTS-SWITCHABLE SWITCH BLOCKS
METHODOLOGY OF THE DESIGN FOR SEGMENTS-SWITCHABLE SWITCH BLO...
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2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Qiushi SHEN Jun TAN Jiarong TONG Lingli WANG Jinmei LAI State Key Lab of ASIC & System Fudan University
Previous researches on switch blocks focused on the analysis of individual switch blocks that contain single length *** those switch blocks,segments of different length are separated from each other,which results in l... 详细信息
来源: 评论