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检索条件"机构=ASIC and System State-Key Lab"
809 条 记 录,以下是701-710 订阅
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Very low-cost VLSI implementation of AES algorithm
Very low-cost VLSI implementation of AES algorithm
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2006 IEEE Asian Solid-state Circuits Conference, ASSCC 2006
作者: Jia, Zhao Xiaoyang, Zeng Jun, Han Jun, Chen State-Key Lab. of ASIC and System Fudan University Shanghai 200433 China
This paper proposes a very low-cost VLSI implementation of AES algorithm. This design splits the 128bit computation in every round into four 32bit calculations and exploits 2-level pipeline to finish the process. More... 详细信息
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A new dual-field elliptic curve cryptography processor
A new dual-field elliptic curve cryptography processor
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ISCAS 2006: 2006 IEEE International Symposium on Circuits and systems
作者: Yongyi, Wu Xiaoyang, Zeng State Key Lab. of ASIC and System Fudan University Shanghai 200433 China
A new Elliptic Curve Cryptography (ECC) processor is proposed in this paper, which supports Galois fields GF(p) and GF(2n) arithmetic for arbitrary prime numbers and irreducible polynomials by introducing a dualfield ... 详细信息
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A novel hybrid FPGA architecture
A novel hybrid FPGA architecture
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ICSICT-2006: 2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Chen, Li-Guang Wang, Kan-Wen Lai, Jin-Mei Tong, Jia-Rong State Key Lab. of ASIC and System Fudan University Shanghai 201203 China
In this paper, a new Hybrid Field Programmable Gate Array (FPGA) architecture is proposed. The logic tile, which consists of a logic cluster and related Connection Boxes (CBs), can be configured as either Programmable... 详细信息
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Efficient parameter extraction scheme in ultra-thin gate dielectric MOS capacitor with considerable gate leakage
Efficient parameter extraction scheme in ultra-thin gate die...
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ICSICT-2006: 2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: He, Daokui Quan, Wuyun ASIC and System State-key Lab. Fudan University Shanghai 200433 China
Presented herein is a fast but accurate quantum C-V simulation, capable of extracting effective oxide thickness and other parameters based strictly on C-V data alone. The apparent C-V degradation in leaky dielectric M... 详细信息
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FPGA downloading circuit design and implementation
FPGA downloading circuit design and implementation
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ICSICT-2006: 2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Wang, Jian Chen, Li-Guang Lai, Jin-Mei State Key Lab. of ASIC and System Fudan University Shanghai 200433 China
The most charming feature of FPGA is that it is post-fabricated, which means that user can design his own logic onto the chip without the need of tape out. So both design cycle and prototype cost can be greatly reduce... 详细信息
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Interfacial depletion layers evidenced from dielectric relaxation current in ferroelectric thin films
Interfacial depletion layers evidenced from dielectric relax...
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ICSICT-2006: 2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Jiang, A.Q. Lin, Y.Y. Tang, T.A. ASIC and System State Key Lab Department of Microelectronics Fudan University Shanghai 200433 China
The relaxation current decays with time t to follow the Curie-von Schweidler law of Jr(t) = J0t-n with the exponent n slightly less than the unity either under or after dc-voltage stressing of Pb(Zr,Ti)O3 thin films, ... 详细信息
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The failure mechanism of gate resistance testing for power MOSFET
The failure mechanism of gate resistance testing for power M...
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ICSICT-2006: 2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Pan, Shaohui He, Lunwen Zhang, David Wei Wang, L.K. Department of Microelectronics ASIC and System State Key Lab. Fudan University Shanghai 200433 China
The vertical DMOS (Double Diffused MOSFET) is widely used in power microelectronics, its switching performance is determined mainly by the gate resistance and the input capacitance. Thus a gate resistance testing tech... 详细信息
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A systematic error model of high-resolution pipelined analog-to-digital converters
A systematic error model of high-resolution pipelined analog...
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2006 49th Midwest Symposium on Circuits and systems, MWSCAS'06
作者: Tingqian, Chen Bingkun, Yao Jun, Xu Junyan, Ren ASIC and System State Key Lab. Dept. of Microelectronics Fudan University Shanghai China
This work presents a systematic error model of high-resolution pipelined analog-to-digital converters (ADCs) implemented in MATlab. Many errors limit linearity or noise performance of high-resolution ADCs, such as sam... 详细信息
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Heel crack and lead-free soldering issues affecting power electronics packages
Heel crack and lead-free soldering issues affecting power el...
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2006 IEEE Region 10 Conference, TENCON 2006
作者: He, Lunwen Pan, Shaohui Wang, L.K. Zhang, David Wei IEEE ASIC and System State Key Lab. Fudan University 220 Handan Road Shanghai 200433 China
Heel crack is one of the most complicated reliability problems of wire bonding in the power electronic package. In this work, we investigate the effects of solder IR reflow to the heel crack both in experimental and F... 详细信息
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The Study of the Gas Microsensors Based on Polymer-Carbon Black Composites
The Study of the Gas Microsensors Based on Polymer-Carbon Bl...
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2006 8th International Conference on Solid-state and Integrated Circuit Technology
作者: Haifen Xie Jiangsheng Wu Peng Huang XinmingJi Yiping Hunag Department of Physics East China University of Science and Technology ASIC and System State Key Lab Department of MicroelectronicsFudan University
In this paper,we study a novel chemical gas sensor arrays based on polymer-carbon black *** two different polymers which are poly(4-vinyl phenol), poly(ethylene oxide) are employed as the sensor materials which are im... 详细信息
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