Several hyperscalers have recently disclosed the occurrence of Silent Data Corruptions (SDCs) in their systems fleets, sparking concerns about the severity of known and the existence of unidentified root causes of fau...
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ISBN:
(数字)9798350326581
ISBN:
(纸本)9798350326598
Several hyperscalers have recently disclosed the occurrence of Silent Data Corruptions (SDCs) in their systems fleets, sparking concerns about the severity of known and the existence of unidentified root causes of faults in CPUs. These incidents reveal that CPU chips have the potential to generate incorrect results for different tasks due to latent manufacturing defects, variability, marginalities, bugs, and aging. To tackle this problem, we present Harpocrates, an automated methodology for the generation of short, constrained-random functional test programs that maximize fault detection in target CPU structures and can be employed at different stages of system lifetime. Harpocrates stands out by adopting a hardware-modelin-the-loop approach, which iteratively refines the generated test programs using a detailed simulation-based microarchitecture engine. The engine models and grades for multiple hardware fault types that can lead to data corruptions during system operation. Harpocrates is versatile and can adapt to various program generators, ISAs, microarchitectures, and fault types. Our results on six important CPU hardware structures show that Harpocrates attains much shorter test generation times than hardware-agnostic publicly available frameworks and outperforms open-source test suites in terms of fault detection capability.
Physical Unclonable Functions (PUFs) have emerged as a promising primitive to provide a hardware keyless security mechanism for integrated circuit applications. Public PUFs (PPUFs) address the crucial PUF vulnerabilit...
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Data provenance, or data lineage, describes the life cycle of data. In scientific workflows on HPC systems, scientists often seek diverse provenance (e.g., origins of data products, usage patterns of datasets). Unfort...
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With the prevalence of social media platforms, rumors have been a serious social problem. Notably, existing rumor detection methods simply provide detection labels while ignoring their explanation. However, illustrati...
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This work describes a virtual reality (VR) based robot teleoperation framework which relies on scene visualization from depth cameras and implements human-robot and human-scene interaction gestures. We suggest that mo...
ISBN:
(数字)9781728160757
ISBN:
(纸本)9781728160764
This work describes a virtual reality (VR) based robot teleoperation framework which relies on scene visualization from depth cameras and implements human-robot and human-scene interaction gestures. We suggest that mounting a camera on a slave robot's end-effector (an in-hand camera) allows the operator to achieve better visualization of the remote scene and improve task performance. We compared experimentally the operator's ability to understand the remote environment in different visualization modes: single external static camera, in-hand camera, in-hand and external static camera, in-hand camera with OctoMap occupancy mapping. The latter option provided the operator with a better understanding of the remote environment whilst requiring relatively small communication bandwidth. Consequently, we propose suitable grasping methods compatible with the VR based teleoperation with the in-hand camera. Video demonstration: https://***/3vZaEykMS_E.
Bias Temperature Instability (BTI) is one of the dominant CMOS aging mechanisms. It causes time-dependent variation, threatening circuit lifetime reliability. BTI-induced circuit errors are not detectable at the fabri...
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ISBN:
(数字)9781728174679
ISBN:
(纸本)9781728174686
Bias Temperature Instability (BTI) is one of the dominant CMOS aging mechanisms. It causes time-dependent variation, threatening circuit lifetime reliability. BTI-induced circuit errors are not detectable at the fabrication stage. On-line monitoring schemes are therefore necessary to capture the degradations during the operational time. Traditional aging monitoring techniques exhibit high implementation complexity and low stability. In this paper, we propose a BTI monitoring approach by simply tracking the start-up behavior of SRAM cells. SRAM is a widely used on-chip device in many applications. We study the impact of BTI for SRAM start-up values and age some cells in a manipulated manner. The BTI degradation is evaluated based on the number of SRAM cells starting with a certain value. This technique can be used to estimate the degradation for on-chip logic circuits without introducing additional circuitry, and thus has very low implementation complexity. We use an SRAM array with 1024 cells to estimate the degradations for multiple logic circuits, and show the average mean absolute percentage error as 8.48%. In addition, this technique is robust considering process, voltage and temperature variations.
The experimental realisation of unconventional superconductivity and charge order in kagome systems AV3Sb5 is of critical importance. We conducted a highly systematic study of Cs(V1−xNbx)3Sb5 with x=0.07 (Nb0.07-CVS) ...
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It has been of great interest in the neuroimaging community to model spatiotemporal brain function and disorders based on resting state functional magnetic resonance imaging (rfMRI). A variety of spatiotemporal method...
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Functional MRI has attracted increasing attention in cognitive neuroscience and clinical mental health research. Towards understanding how brain give rises to mental phenomena, deep learning has been applied to functi...
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We report the study of the thermoelectric properties of layered ternary telluride Nb3SiTe6. The temperature dependence of the thermoelectric power (TEP) evolves from nonlinear to linear when the thickness of the devic...
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We report the study of the thermoelectric properties of layered ternary telluride Nb3SiTe6. The temperature dependence of the thermoelectric power (TEP) evolves from nonlinear to linear when the thickness of the devices is reduced, consistent with the suppression of electron-phonon interaction caused by quantum confinement. The magnitude of TEP strongly depends on the hole density. It increases with decreasing hole density when the hole density is low, as observed in ionic-liquid-gated thin flakes. However, the device with the largest hole density possesses the highest TEP. Theoretical analysis suggests that the high TEP in the device with the largest hole density can be ascribed to the phonon-mediated intervalley scatterings. The highest TEP reaches ∼230μV/K at 370 K while the electrical resistivity of the device is maintained below 1.5mΩcm. Therefore, a large power factor PF ∼36μWcm−1K−2 comparable to the record values reported in p-type materials is obtained.
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