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检索条件"机构=Advanced Computing And Microelectronics Unit Indian Statistical Institute"
270 条 记 录,以下是51-60 订阅
排序:
On the Asymmetry of Stuck-at Fault Sensitivity in Memristive Neural Architectures
On the Asymmetry of Stuck-at Fault Sensitivity in Memristive...
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IEEE International Test Conference on India (ITC India)
作者: Manobendra Nath Mondal Animesh Basak Chowdhury Santlal Prajapati Susmita Sur-Kolay Bhargab B. Bhattacharya School of Computer Science UPES Dehradun India NYU Tandon School of Engineering New York University New York U.S.A. Advanced Computing and Microelectronics Unit Indian Statistical Institute India
The use of memristive crossbar-based architectures has gained traction as a potential solution for performing computationally expensive tasks such as matrix-vector multiplication and vector outer product, which requir... 详细信息
来源: 评论
Efficient Syndrome Decoder for Heavy Hexagonal QECC via Machine Learning
arXiv
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arXiv 2022年
作者: Bhoumik, Debasmita Majumdar, Ritajit Madan, Dhiraj Vinayagamurthy, Dhinakaran Raghunathan, Shesha Sur-Kolay, Susmita Advanced Computing & Microelectronics Unit Indian Statistical Institute India IBM Quantum IBM India Research Lab India
Error syndromes for heavy hexagonal code and other topological codes such as surface code have typically been decoded by using Minimum Weight Perfect Matching (MWPM) based methods. Recent advances have shown that topo... 详细信息
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A Framework for Analyzing Resource Allocation Policies for Multi-Access Edge computing
A Framework for Analyzing Resource Allocation Policies for M...
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IEEE International Conference on Edge computing (EDGE)
作者: Kaustabha Ray Ansuman Banerjee Advanced Computing and Microelectronics Unit Indian Statistical Institute
Multi-Access Edge computing (MEC) is a promising new paradigm enabling low-latency access to services deployed on edge servers. This helps to avert network latencies often encountered in accessing cloud services. The ... 详细信息
来源: 评论
Efficient and Fault-Tolerant Memristive Neural Networks with In-Situ Training
SSRN
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SSRN 2025年
作者: Prajapati, Santlal Mondal, Manobendra Nath Sur-Kolay, Susmita Indian Statistical Institute Advanced Computing and Microelectronics Unit West Bengal Kolkata700108 India UPES School of Computer Science Uttarakhand Dehradun248007 India Ashoka University Department of Computer Science Haryana Sonipat131029 India
In an artificial neural network (ANN), the most frequent and demanding operations are matrix-vector multiplication, vector-vector outer product, and weight matrix updates. These operations require parallel and in-memo... 详细信息
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Optimal Gathering over Weber Meeting Nodes in Infinite Grid
arXiv
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arXiv 2022年
作者: Bhagat, Subhash Chakraborty, Abhinav Das, Bibhuti Mukhopadhyaya, Krishnendu National Institute of Science Education and Research HBNI Bhubaneswar India Advanced Computing and Microelectronics Unit Indian Statistical Institute Kolkata India
The gathering over meeting nodes problem requires the robots to gather at one of the predefined meeting nodes. This paper investigates the problem with respect to the objective function that minimizes the total number... 详细信息
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On the Span of l Distance Coloring of Infinite Hexagonal Grid
arXiv
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arXiv 2022年
作者: Ghosh, Sasthi C. Koley, Subhasis Advanced Computing and Microelectronics Unit Indian Statistical Institute 203 B. T. Road Kolkata700108 India
For a graph G(V, E) and l ∈ , an l distance coloring is a coloring f : V → {1, 2, · · ·, n} of V such that ∀u, v ∈ V, u ≠ v, f(u) ≠ f(v) when d(u, v) ≤ l. Here d(u, v) is the distance between u an... 详细信息
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Optimal L(1,2)-edge Labeling of Infinite Octagonal Grid
arXiv
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arXiv 2022年
作者: Koley, Subhasis Ghosh, Sasthi C. Advanced Computing and Microelectronics unit Indian Statistical Institute 203 B. T. Road Kolkata700108 India
For two given non-negative integers h and k, an L(h, k)-edge labeling of a graph G = (V(G),E(G)) is a function f0 : E(G) −→ {0,1,···,n} such that ∀e1,e2 ∈ E(G), |f0(e1) − f0(e2)| ≥ h when d0(e1,e2) =... 详细信息
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Stitch-avoiding Global Routing for Multiple E-Beam Lithography
Stitch-avoiding Global Routing for Multiple E-Beam Lithograp...
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International Conference on VLSI Design
作者: Kritanta Saha Sudipta Paul Pritha Banerjee Susmita Sur-Kolay Advanced Computing and Microelectronics Unit Indian Statistical Institute Kolkata India Department of Computer Science and Engineering University of Calcutta Kolkata India
In Multiple E-Beam Lithography (MEBL), a layout of an IC is partitioned into vertical stripes whose boundaries are called stitch-lines. Routing patterns in each stripe are written by different beams and/or in differen...
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An RIS Deployment Strategy to Overcome Static Obstacles in Millimeter Wave D2D Communication
An RIS Deployment Strategy to Overcome Static Obstacles in M...
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IEEE International Symposium on Network computing and Applications
作者: Souvik Deb Sasthi C. Ghosh Advanced Computing & Microelectronics Unit Indian Statistical Institute Kolkata India
Use of millimeter waves for short range device to device (D2D) communication is one of the most promising ways to provide high data rates. But millimeter waves are susceptible to blockages due to high penetration loss... 详细信息
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An Energy Efficient Component Carrier Selection Mechanism for LTE-NR Dual Connectivity
An Energy Efficient Component Carrier Selection Mechanism fo...
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IEEE International Symposium on Network computing and Applications
作者: Shankar K. Ghosh Sasthi C. Ghosh Advanced Computing & Microelectronics Unit Indian Statistical Institute Kolkata India
In recent past, a new dual connectivity (DC) mechanism has been standardized to deal with two different radio access technologies, namely long term evolution advanced (LTE-A) and new radio (NR). The DC mechanism calls... 详细信息
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