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检索条件"机构=Advanced Manufacturing Process Control Project"
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An integrated approach to process monitoring and data analysis
An integrated approach to process monitoring and data analys...
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IEEE/CHMT(CPMT) International Electronics manufacturing Technology Symposium
作者: K.Y. Wong J.J. Daudenarde C.S. Yeh I. Cheung E. Ruble G. Rabier Advanced Manufacturing Process Control Project IBM Storage Systems Product Division Almaden Research Center San Jose CA USA
The authors describe two architectures: the Automated process Monitoring (APROM) System, which examines a large combination of trend charts and shows the symptoms of problems to the engineers by sending a high level m... 详细信息
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