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检索条件"机构=Advanced Process Control Research and Development Group"
175 条 记 录,以下是91-100 订阅
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Robust spin-on glass gap-fill process technology for sub-30nm interlayer dielectrics
Robust spin-on glass gap-fill process technology for sub-30n...
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IEEE International Conference on Interconnect Technology
作者: Kyung-Mun Byun Deok-Young Jung Jun-Won Lee Seungheon Lee Hyongsoo Kim Mun-Jun Kim Eunkee Hong Mansug Gang Seok-Woo Nam Joo-Tae Moon Chilhee Chung Jung-Hoo Lee Hyo-Sug Lee Process Development Team Semiconductor Research and Development Center USA Manufacturing Technology Team Infra Technology Service Center Semiconductor Business Samsung Electronics Company Limited Hwasung Gyeonggi South Korea Material Application Group Materials Research Center Samsung Advanced Institute of Technology Samsung Electronics Company Limited Yongin si Gyeonggi South Korea
A highly robust gap-fill process technology of spin-on glass (SOG) was developed for the interlayer dielectric (ILD) in sub-30 nm devices. We revealed that the filling behavior of SOG within gaps during spin-coating i... 详细信息
来源: 评论
Life cycle strain mapping of composite airframe structures for health monitoring by using FBG sensors
Life cycle strain mapping of composite airframe structures f...
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作者: Takahashi, Ichiya Sekine, Kazushi Takeya, Hajime Iwahori, Yutaka Minakuchi, Shu Takeda, Nobuo Koshioka, Yasuhiro Advanced Technology R and D Center Mitsubishi Electric Corporation 8-1-1 Tsukaguchi-Hommachi Amagasaki Hyogo 661-8661 Japan Advanced Composite Group Aerospace Research and Development Directorate Japan Aerospace Exploration Agency 6-13-1 Osawa Mitaka Tokyo 181-0015 Japan Graduate School of Frontier Sciences University of Tokyo 5-1-5 Kashiwanoha Kashiwa Chiba 277-8561 Japan Materials Process Technology Center 3-5-8 Shibakoen Minato-ku Tokyo 105-0011 Japan
The purpose of this research is to develop structural health monitoring technology based on the strain mapping of composite airframe structures through their life cycles. We conducted the evaluation tests for damage d... 详细信息
来源: 评论
SCR calibration using design of experiments
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MTZ worldwide 2010年 第6期71卷 24-28页
作者: Seabrook, Justin Rebhan, Martin He, Yongsheng Battiston, Paul A. He, Xin Calibration Process Ricardo UK Ltd. Shoreham-by-Sea Great Britain Performance and Calibration Department Ricardo Deutschland GmbH Schwäbisch Gmünd Germany GM Global Research & Development Warren USA Advanced Engineering Department GM Powertrain Warren USA CIDI Engine Group GM Powertrain Systems Research Lab Warren USA
NOx catalysts play a key role in reducing oxides of nitrogen. Further degrees of freedom are introduced into the calibration process when a selective catalytic reduction (SCR) system is incorporated. Ricardo and Gener...
来源: 评论
Robust spin-on glass gap-fill process technology for sub-30nm interlayer dielectrics
Robust spin-on glass gap-fill process technology for sub-30n...
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2010 IEEE International Interconnect Technology Conference, IITC 2010
作者: Byun, Kyung-Mun Jung, Deok-Young Lee, Jun-Won Lee, Seungheon Kim, Hyongsoo Kim, Mun-Jun Hong, Eunkee Gang, Mansug Nam, Seok-Woo Moon, Joo-Tae Chung, Chilhee Lee, Jung-Hoo Lee, Hyo-Sug Process Development Team Semiconductor R and D Center Samsung Electronics Co. Ltd. Hwasung-City Gyeonggi-Do 445-701 Korea Republic of Manufacturing Technology Team Infra Technology Service Center Samsung Electronics Co. Ltd. San#16 Banwol-Dong Hwasung-City Gyeonggi-Do 445-701 Korea Republic of Material Application Group Materials Research Center Samsung Advanced Institute of Technology San#14 Nongseo-Dong Giheung-Gu Yongin-City Gyeonggi-Do 449-712 Korea Republic of
A highly robust gap-fill process technology of spin-on glass (SOG) was developed for the interlayer dielectric (ILD) in sub-30nm devices. We revealed that the filling behavior of SOG within gaps during spin-coating is... 详细信息
来源: 评论
A NEW NON-INVASIVE METHOD FOR VALVE STICTION DECTION USING WAVELET TECHNOLOGY
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Journal of Electronics(China) 2009年 第5期26卷 673-680页
作者: Xu Zhanyang Charles Zhan Zhang Shunyi Institute of Information Network Technology Nanjing University of Posts & Telecommunications Nanjing 210003 China Department of Computer Sciences~ Nanjing University of Information Science and Technology Nanjing 210044 China Advanced Process Control Research and Development Group Honeywell Process Solutions Phoenix AZ 85027 USA
In this letter, we present a novel approach of valve stiction detection using wavelet technology. A new non-invasive method is developed with the closed-loop normal operating data. The redundant dyadic discrete wavele... 详细信息
来源: 评论
The Effect of Tuning in Multiple-Model Adaptive controllers: A Case Study
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IFAC Proceedings Volumes 2009年 第11期42卷 560-565页
作者: Ehsan Peymani Alireza Fatehi Ali Khaki Sedigh Advanced Process Automation & Control (APAC) Research Group K. N. Toosi University of Technology Tehran Iran
In this paper, two types of multiple-model adaptive controllers are practically evaluated on a laboratory-scale pH neutralization process. The first one is supervisory switching multiple-model adaptive controller (SMM... 详细信息
来源: 评论
Enhancement of Multi-Objective control Performance via Switching
Enhancement of Multi-Objective Control Performance via Switc...
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2009中国控制与决策会议
作者: Laven Soltanian Ali Khaki Sedigh Omid Namaki-Shoushtari Advanced Process Automation & Control(APAC) Research Group K.N.Toosi University of TechnologyTehranIran Control Engineering Department K.N.Toosi University of TechnologyTehranIran
control system design for a complex system encompasses the optimization of different and often conflicting objectives leading to a multiple objective design *** this paper,a switching strategy is proposed to solve the... 详细信息
来源: 评论
development of Low-Power-Consumption IC Chipset for SFP+
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SEI Technical Review 2009年 第69期 86-91页
作者: Tanaka, Keiji Moto, Akihiro Fujita, Hayato Sato, Shunsuke Oomori, Hiroyasu Tanaka, Hiromi Ishibashi, Hiroto Uesaka, Katsumi Advanced Circuit Design RandDDepartment Transmission Devices RandD Laboratories Japan Lightwave Development Department Optical Components Division Sumitomo Electric Device Innovation Inc. Firmware and Digital Control Design Group Lightwave Development Department Optical Components Division Integrated Device Process RandD Department Transmission Devices RandD Laboratories Japan
For small form-factor pluggable plus (SFP+), the authors have successfully developed chipset composed of transceiver IC equipped with Vertical-Cavity Surface-Emitting Laser (VCSEL) driver and shunt-driver IC. This pap... 详细信息
来源: 评论
Identification, Prediction and Detection of the process Fault in a Cement Rotary Kiln by Locally Linear Neuro-Fuzzy Technique
Identification, Prediction and Detection of the Process Faul...
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International Conference on Computer and Electrical Engineering, ICCEE
作者: Masoud Sadeghian Alireza Fatehi Department of Mechatronics Engineering Sharif University of Technology International Campus Kish Island Iran Advanced Process Automation and Control (APAC) Research group Faculty of Electrical Engineering K.N. Toosi University of Technology Tehran Iran
In this paper, we use nonlinear system identification method to predict and detect process fault of a cement rotary kiln. After selecting proper inputs and output, an input-output model is identified for the plant. To... 详细信息
来源: 评论
Identification of Nonlinear Predictor and Simulator Models of a Cement Rotary Kiln by Locally Linear Neuro-Fuzzy Technique
Identification of Nonlinear Predictor and Simulator Models o...
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International Conference on Computer and Electrical Engineering, ICCEE
作者: Masoud Sadeghian Alireza Fatehi Department of Mechatronics Engineering International Campus Sharif University of Technology Kish Island Iran Advanced Process Automation and Control (APAC) Research group Faculty of Electrical Engineering K.N. Toosi University of Technology Tehran Iran
One of the most important parts of a cement factory is the cement rotary kiln which plays a key role in quality and quantity of produced cement. In this part, the physical exertion and bilateral movement of air and ma... 详细信息
来源: 评论