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检索条件"机构=Applied Nuclear Technology and Automation Engineering College of Chengdu University of Technology"
1573 条 记 录,以下是1571-1580 订阅
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A New Algorithm for Spectral Drift Calculation in a Gamma-ray Spectrometer
A New Algorithm for Spectral Drift Calculation in a Gamma-ra...
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The 2011 International Conference on Smart Materials and Nanotechnology in engineering (ICSMCE2011)
作者: Qin Zhangjian Ge Liangquan Wu Qifan Cheng Jianping School of Nuclear Technology and Automation Engineering Chengdu University of Technology Department of Engineering Physics Tsinghua University
Spectral drift of any origin consisting of detectors and nuclear electronics affects the long-term stability in a gamma-ray spectrometer, which is essential to maintaining the high quality of gamma energy spectraThe f... 详细信息
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Ion-beam-sputtering/mixing deposition of calcium phosphate coatings. I. Effects of ion-mixing beams
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Journal of Biomedical Materials Research Part B: applied Biomaterials 2001年 第4期55卷
作者: C.-X. Wang Z.Q. Chen M. Wang Z.Y. Liu P.L. Wang Department of Dental Materials College of Stomatology West China University of Medical Sciences Chengdu 610041 Sichuan China School of Mechanical and Production Engineering Nanyang Technological University Nanyang Avenue Singapore 639798 Singapore Laboratory of Radiation Physics and Technology Institute of Nuclear Science and Technology Sichuan University Chengdu 610064 Sichuan China
Ion-beam-sputtering/mixing deposition was used to produce thin calcium phosphate coatings on titanium substrate from the hydroxyapatite target. The mixing beam could be either Ar + or N + ions. It was found that as-de... 详细信息
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Research on fault tree of radar launch system based on fuzzy judgment
Research on fault tree of radar launch system based on fuzzy...
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2011 2nd Asia-Pacific Conference on Wearable Computing Systems (APWCS 2011);2011 International Conference on Intelligent Control and Information technology(ICICIT 2011)
作者: ZHENG Xian-ju ZHANG Wei XIE Chun LUO Hang Computer engineering dept.Chengdu Electromechanical College Automation engineering college University of Electronic Science and Technology of China
It is much more difficult to obtain failure probability of bottom-events of fault tree by means of traditional method if there has no enough or lack failure information of parts(or modules). In this a
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