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检索条件"机构=Assembly and Test Technology Development"
129 条 记 录,以下是111-120 订阅
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Mm-wave rectangular slot loop antenna array for broad spatial coverage
Mm-wave rectangular slot loop antenna array for broad spatia...
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Antennas and Propagation Society International Symposium
作者: Helen K. Pan Bryce D. Horine Kranti K. Tantwai Intel Laboratory Intel Corporation Hillsboro OR USA Assembly Test and Technology Development Intel Corporation India
In this paper, a planar rectangular slot loop antenna is proposed that provides unique radiation pattern with broad beam pattern tilting toward the side. Other than typical broadside or endfire antenna array, the beam... 详细信息
来源: 评论
Cooling performance of piezoelectric fan in notebook system
Cooling performance of piezoelectric fan in notebook system
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34th International Electronics Manufacturing technology Conference, IEMT 2010
作者: Kar Mun, Ng Sauciuc, Ioan Wada, Hiroaki Tanaka, Nobuhira Intel Asia-Pacific Research and Development Ltd. Shanghai Zizhu Science Park No. 880 Zi Xing Road Shanghai 20041 China Assembly and Test Technology Development Intel Corporation 5000 W. Chandler Blvd Arizona United States Murata Manufacturing Company Ltd. 1-10-1 Higashikotari Nagaokakyo-shi Kyoto 617-8555 Japan
Thin form factor and high computing performance are the inevitable trend of notebook industry. Both vectors impose more stringent challenge on thermal solution design to maintain internal components and external chass... 详细信息
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Cooling performance of piezoelectric fan in notebook system
Cooling performance of piezoelectric fan in notebook system
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IEEE/CHMT(CPMT) International Electronics Manufacturing technology Symposium
作者: Ng Kar Mun Ioan Sauciuc Hiroaki Wada Nobuhira Tanaka Intel Asia-Pacific Research & Development Ltd. No. 880 Zi Xing Road Shanghai Zizhu Science Park 20041 China Assembly & Test Technology Development Chandler Arizona Murata Manufacturing Company Ltd. Kyoto Japan
Thin form factor and high computing performance are the inevitable trend of notebook industry. Both vectors impose more stringent challenge on thermal solution design to maintain internal components and external chass... 详细信息
来源: 评论
A compact 802.11 a/b/g/n WLAN Front-End Module using passives embedded in a flip-chip BGA organic package substrate
A compact 802.11 a/b/g/n WLAN Front-End Module using passive...
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Microwave, MTT-S International Symposium
作者: Telesphor Kamgaing Emile Davies-Venn Kaladhar Radhakrishnan Components Research Intel Corporation Chandler AZ USA Assembly and Test Technology Development Intel Corporation Chandler AZ USA
This paper discusses the design and implementation of a compact RF front-end-module for 802.11 a/b/g/n application. A high performance embedded passives technology has been developed by extending existing multilayer F... 详细信息
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A peer-to-peer approach to providing QoS monitoring for web service activities  9
A peer-to-peer approach to providing QoS monitoring for web ...
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9th ACM/IFIP/USENIX International Middleware Conference, Middleware 2008
作者: Karim, Fariaz Intel Corporation Assembly/Test Technology Development ChandlerAZ United States
Steady increases in the adoption of web services for automating critical business processes or activities demand that certain Quality of Service (QoS) metrics are met. Common approaches to QoS monitoring are primarily... 详细信息
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Characterization of halogen-free package materials using cavity resonators
Characterization of halogen-free package materials using cav...
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IEEE Topical Meeting on Electrical Performance of Electronic Packaging (EPEPS)
作者: Kemal Aygun Grace Hu Assembly and Test Technology Development Intel Corporation Chandler AZ USA
Dielectric properties of substrate materials have a significant impact on electrical performance of packages including signaling power loss, propagation delay and crosstalk. With the focus on halogen-free (HF) package... 详细信息
来源: 评论
Numerical Prediction of Socket Solder Joint Reliability during Shock
Numerical Prediction of Socket Solder Joint Reliability duri...
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IEEE Holm Conference on Electrical Contacts
作者: Yupeng Li Robert Atkinson Hong Xie Shijiang He Assembly Test Technology Development Intel Corporation Chandler AZ USA
This paper proposes a simulation methodology to assess the risk in solder joint reliability (SJR) of Pin Grid Array (PGA)/ Land Grid Array (LGA) Socket during Mechanical shock. One of the main challenges in simulation... 详细信息
来源: 评论
LC-based WiFi and WiMAX baluns embedded in a multilayer organic Flip-Chip Ball Grid Array (FCBGA) package substrate
LC-based WiFi and WiMAX baluns embedded in a multilayer orga...
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2008 58th Electronic Components and technology Conference, ECTC
作者: Davies-Venn, Emile Kamgaing, Telesphor Assembly and Test Technology Development Intel Corporation 5000 W. Chandler Blvd Chandler AZ 85226 United States Corporate Technology Group Intel Corporation 5000 W. Chandler Blvd Chandler AZ 85226 United States
Two lumped element baluns designed using embedded inductors and capacitors are discussed in this paper. The structures designed for WiFi and mobile WiMAX applications have very small form-factors with surface area of ... 详细信息
来源: 评论
LC-based WiFi and WiMAX Baluns embedded in a multilayer organic flip-chip ball grid array (FCBGA) package substrate
LC-based WiFi and WiMAX Baluns embedded in a multilayer orga...
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Electronic Components and technology Conference (ECTC)
作者: Emile Davies-Venn Telesphor Kamgaing Assembly and Test Technology Development Intel Corporation Chandler AZ USA Corporate Technology Group Intel Corporation Chandler AZ USA
Two lumped element baluns designed using embedded inductors and capacitors are discussed in this paper. The structures designed for WiFi and mobile WiMAX applications have very small form-factors with surface area of ... 详细信息
来源: 评论
In-situ characterization of moisture absorption and desorption in a thin BT core substrate
In-situ characterization of moisture absorption and desorpti...
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57th Electronic Components and technology Conference 2007, ECTC '07
作者: He, Yi Fan, Xuejun Intel Corporation Assembly Test and Technology Development 5000 W. Chandler Blvd. Chandler AZ 85226 United States
Bismaleimide-triazine (BT) resin/glass fiber laminates are commonly used as a substrate core material in microelectronic packaging. Their moisture absorption and diffusion behavior have a significant impact on package... 详细信息
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