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A device simulation of the BBT effect in flash memory cells and implications for the development of high-reliability memory cells

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ELECTrONICS ANd COMMUNICATIONS IN JAPAN PArT II-ELECTrONICS 1996年第11期79卷 51-57页

作者： Hayashi, T Fukuda, K Ohno, M Nishi, K Kita, A VLSI R&D Center OKI Electric Industry Company Ltd. Hachioji-shi Japan 193 Graduated from the Science University of Tokyo Dept. of Applied Physics in 1986 and joined Oki Electric. Since then he has been engaged in research on the reliability of MOS transistors and silicon oxide films. Since 1994 he has been engaged in the development of flash memory. He is a member of the Applied Physics Society. Graduated from the University of Tokyo Dept. of Applied Physics in 1983 and joined Oki Electric in 1985. Since then he has been engaged in research on the semiconductor process and device simulation. In 1990 he participated in joint research at the Technical University of Aachen. He is a member of the Applied Physics Society. Graduated from the Tokyo University of Agriculture and Technology Dept. of Electrical Engineering in 1980 and completed an MS course in 1983. In 1986 he completed the doctoral course at Shizuoka University. He then joined Oki Electric where he has been engaged in research on ULSI processes. He is now a manager responsible for flash memory at the VLSI R&D Center. He holds a doctorate in engineering. He is a member of the Applied Physics Society. Graduated from the University of Tokyo Dept. of Applied Physics in 1973 and joined Oki Electric. He was engaged in the development of integrated circuit logic simulation technology and bipolar process technology and since 1980 he has been engaged in research on process/device simulation and modeling. Presently he is a senior manager at the VLSI R&D Center. In 1982–1984 he was a Visiting Scholar at MIT. He holds a doctorate in engineering. He is a member of the Applied Physics Society and a senior member of IEEE. Graduated from Tokyo Institute of Technology Dept. of Chemical Engineering in 1978 and completed the MS program in 1930. In that year he joined Oki Electric. Since then he has been engaged in CMOS process design for DRAM and flash memory. He is now a manager at the VLSI R&D Center. He is a member of the Applied Physics Society.

In order to analyze the BBT (band-to-band tunneling) phenomenon in flash memory cells by simulation, a new model is proposed, which improves on the BBT model by introducing the concept of ''average electric field.'' This model agrees well with the measured results in a wide drain N-concentration range. Using this model, the reliability of memory cells is analyzed. It is found that the difference of the amount of BBT generation does not directly affect the endurance characteristics but does affect the disturb characteristics. The same model can be used to analyze problem points of the present cells and to estimate the BBT current of next-generation devices accurately.

关键词： band-to-band tunneling flash memory simulation endurance characteristics

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ZCS-ZVS mixed mode PWM resonant converter for snubber energy recovery of 3-level GTO inverter

ZCS-ZVS mixed mode PWM resonant converter for snubber energy...

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Annual IEEE Conference on Power Electronics Specialists (PESC)

作者： H.H. Seong d.J. Kim G.H. Cho Buchun R&D Center Samsung Electronics Company Limited Germany Department of Electrical Engineering Korea Advanced Institute of Science and Technology South Korea

In this paper, a new type of PWM series resonant converter is proposed. One pole of the proposed converter is switching at zero-current and the other is switching at zero-voltage. By introducing an auxiliary inductor, zero-voltage switching is possible even at no load. The proposed converter is suitable for a high-voltage dC/dC converter because the voltage stresses of switching devices are minimized.< >

关键词： Pulse width modulation Pulse width modulation converters resonance Snubbers Switching converters Inductors Zero voltage switching dC-dC power converters Stress

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robust control of an automatic transmission system for passenger vehicles

Robust control of an automatic transmission system for passe...

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IEEE Conference on Control technology and Applications (CCTA)

作者： Furukawa Hagiwara Fujita Uchida Tochigi R&d Center Honda Research and Development Company Limited Haga Tochigi Japan School of Information Science Japan Advanced Institute of Science and Technology Tatsunokuchi Ishikawa Japan Department of Electrical Engineering Waseda University Shinjuku Tokyo Japan

In recent years, electronic control of automatic transmissions, which provides an effective means of satisfying increasingly strict fuel efficiency requirements and improving drivability and shift quality, is applied to an increasing number of automobile models, and increasingly larger sections of automatic transmissions are electronically controlled. A new automatic transmission control theory which ensures high robustness and sufficient control performance has been developed through application of the H/sub /spl infin// control theory in order to make HONdA automatic transmissions more marketable. This paper reports that their control performance was favorable. This was verified by tests with actual vehicles, and the main processes to which it was applied.< >

关键词： robustness road vehicle control road vehicles H-infinity control

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I-V kink in InAlAs/InGaAs MOdFETs due to weak impact ionization process in the InGaAs channel

I-V kink in InAlAs/InGaAs MODFETs due to weak impact ionizat...

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Indium Phosphide and related Materials Conference

作者： Guo-Gang Zhou A. Fischer-Colbrie J.S. Harris Microwave Technol. Div. Hewlett-Packard Co. Santa Rosa CA USA Circuit Technology R&D Hewlett Packard Company Palo Alto CA USA Department of Electrical Engineering University of Stanford CA USA

InAlAs-In/sub 0.53/Ga/sub 0.47/As-InP MOdFETs on InP substrates have demonstrated superior high frequency performance in recent years. However, the devices with sub-half-micron gate lengths often exhibit a detrimental "kink effect" in the I-V curves, which is a sudden increase in the saturated drain current with respect to drain bias. The devices also suffer from high output conductance, G/sub 0/, with value as high as 100 mS/mm compared to 30 mS/mm for the GaAs based MOdFETs with the same geometry. This excessive G/sub 0/ value degrades the voltage gain G/sub mG/sub 0/, and consequently the power gain and f/sub max/. Another serious problem for the device is the low drain to source breakdown voltage, which imposes a severe limitation on its power applications. Although the anomalous characteristics have been studied extensively, the original cause is still controversial. The speculative theories range from field de-ionization of trapped electrons in the InAlAs buffer layer to buffer layer conduction due to deconfinement of 2dEG from the InGaAs channel. The trap related theory contradicts the fact that when the narrow band gap InGaAs channel layer is replaced by a wider band material such as InGaAsP or InP, while keeping the same InAlAs as the buffer layer, the G/sub 0/ value of the device is much lower and the I-V kink is absent. The buffer conduction theory agrees well to the normally low G/sub 0/ value for the GaAs based MESFETs and MOdFETs, but does not explain the excessive G/sub 0/ observed on InP based InAlAs/InGaAs MOdFETs. Based on the facts that (i) the value of the G/sub 0/ is proportional to the electric field in the region near the drain side of the gate edge, and (ii) light emission was observed from the device with high G/sub 0/, we believed that the excessive G/sub 0/ and I-V kink for this device were related to weak impact ionization process in the InGaAs channel. In order to clearly understand the actual mechanism causing the I-V kink and excessive

关键词： Indium compounds Indium gallium arsenide MOdFETs HEMTs Impact ionization Buffer layers Indium phosphide Gallium arsenide Electron traps Narrowband

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MAKING PIPING SYSTEMS FIrE-SAFE - SIMPLE SOLUTIONS FOr PrEVENTING A dISASTEr

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NAVAL ENGINEErS JOUrNAL 1994年第3期106卷 285-295页

作者： BHASIN, V NILSEN, L GUPTA, K CONrOY, d Vinod Bhasin P.E.:is a fellow engineer with the Westinghouse Electric Corporation machinery technology division Pittsburgh Pa. He has more than 19 years of experience in the supervision design application and testing of valves and actuators and has taught courses in solids mechanics for 10 years at Illinois Institute of Technology Chicago Il. Mr. Bhasin has written articles for the valve industry where he has been active in standards societies. He holds BS and MS degrees in mechanical engineering and an MS in industrial engineering. Mr. Bhasin is a member of the American Society of Mechanical Engineers (ASME) and the American Society for Testing and Materials (ASTM). He is co-chairman of the shipbuilding piping component subcommittee ASTM F25.13 and is also chairing three other task groups under ASTM F25. Lloyd Nilsen P.E.:is the piping components branch head for NavSea. His career with NavSea includes 33 years of ship design construction and repair experience. He has held various positions in the power piping design division human factors manning and controls integration branch and submarine machinery systems branch. He has a BS degree in marine engineering from N.Y. State Maritime. Mr. Nilsen is also a member of the NavSea Association of Scientists and Engineers and a registered licensed professional engineer in Virginia and Washington D.C. Karan Gupta P.E.:is a senior engineer with the Westinghouse Electric Corporation Machinery Technology Division Pittsburgh Pa. Prior to joining Westinghouse he was employed by Elliott Company Jeannette Pa. for 12 years as a metallurgical engineer. He has more than 25 years experience in metallurgical engineering including material selection and brazing and welding of piping pressure vessels and turbines. Mr. Gupta has BS and MS degrees in metallurgical engineering. He is a member of the American Welding Society (AWS) and is active in AWS filler metal subcommittee A5A. He is also a member of ASM International. Dennis Conroy: is a chemical engineer

Loss of life and property losses totaling tens of billions of dollars have piping engineers scrambling to specify ''fire-safe'' components in fire-prone locations: on board ships, and in power plants, refineries, and other perilous applications. Fire-safe valves, the first line of defense in containing a fire, were introduced some 25 years ago, with fire-safe actuators following soon afterwards. Little attention has been given, however, to designing and selecting the other piping components such as flanges, gaskets, bolting, and fittings to ensure their integrity in a fire. Just like in an electric circuit where, if a single component in series fails, the flow of electricity stops;likewise, the failure of a single piping component could result in a fire of catastrophic proportions. This paper discusses the availability of critical fire-safe components for Navy shipboard piping systems and provides some simple solutions which, if implemented, could prevent such a disaster. discussion is provided on how a fire starts and how it reaches catastrophic proportions, the definitions of survivability and fire-safe components, materials of construction, component design, fire-safe valves and actuators, gaskets, pipe flanges, flange bolting, pipe fittings and unions, brazing and welding, insulation, composite piping materials, and other related subjects. details are also provided on 78 fires that have occurred on Navy surface ships in the last ten years and their causes.

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High performance deep submicron buried channel PMOSFET using P/sup +/ poly-Si spacer induced self-aligned ultra shallow junctions

High performance deep submicron buried channel PMOSFET using...

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International Electron devices Meeting (IEdM)

作者： Chang Kohyama Kakuma Sudo Asao Kumagai Matsuoka Ishiuchi Sawada Circuit Technology R&D Silicon Process Laboratory Hewlett Packard Company Palo Alto CA USA Semicondutor Device Engineering Laborotary Toshiba Corporation Kawasaki Japan Semicond. Device Eng. Lab. Toshiba Corp. Kawasaki Japan

A new buried channel PMOSFET structure by forming P+ poly-Si sidewall spacers next to the main N+ poly-Si gate electrode is proposed and developed for deep submicron applications. By using this new device structure, the current drivability of a 0.3 mu m PMOSFET is increased by about 40%. This significant increase in current drivability can be attributed to the parasitic resistance reduction due to the formation of P-type inversion layers under the two P+ poly-Si sidewall spacers. Because of the work function difference between the N+ poly-Si gate electrode and the P+ poly-Si spacers, the Si surface under the P+ poly-Si spacers is always more inverted than the channel. As a result, the parasitic resistance is always much lower than the channel resistance. Furthermore, those induced inversion layers act as ultra shallow junctions ( >

关键词： Insulated gate FETs Inversion layers Work function

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CAd CAM GOES TO SEA - THE SAAr-5 dESIGN ANd CONSTrUCTION

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NAVAL ENGINEErS JOUrNAL 1992年第3期104卷 148-155页

作者： LINdGrEN, Jr SOLITArIO, WA MOOrE, AP STrEIFF, MA John R. Lindgren Jr:. is vice president for engineering at Ingalls Shipbuilding Inc. a Division of Litton Industries in Pascagoula Miss. He joined Ingalls in 1958 and has held various positions in the Engineering Division and participated in the design of numerous merchant ships drill rigs submarines and surface combatants and auxiliary support ships. Mr. Lindgren is a 1958 graduate of the University of Southwest Louisiana. His degree is in mechanical engineering and he is also a licensed professional engineer. William A. Solitario:is the director of advanced technology at Ingalls Shipbuilding Inc. in Pascagoula Miss. He received his B.S. degree in chemical engineering from the City University of New York and has 28 years experience in marine engineering and design. His current responsibilities include the direction of Ingalls' IRAD programs and several Navy-funded R&D programs to improve ship's performance and reduce ship's operating costs. He is a member of the Society of Naval Architects and Marine Engineers and past chairman of the Gulf Section East Area. Arnold P. Moore:is the director design engineering at Ingalls Shipbuilding where he is responsible for all new construction design and engineering activities. Prior to promotion to his current position Mr. Moore served as chief naval architect at Ingalls. He has 24 years experience in ship design construction and repair. Mr. Moore holds the professional degree of ocean engineer as well as a master's degree in naval architecture and marine engineering from MIT. He also earned a bachelor's degree in naval science from the U.S. Naval Academy and is a registered professional engineer. Mr. Moore served as an engineering duty officer in the U.S. Navy and is currently a captain in the Naval Reserve. He is a past chairman of the Gulf Section of the Society of Naval Architects and Marine Engineers and a member of the American Society of Naval Engineers and Sigma Xi. Michel A. Streiff:is the manager of CAD/CAM applications at Ingalls Shipbuilding Inc. His

The SA'Ar-5 Corvette Program is the first major warship construction to be entirely accomplished using a 3-dimensional, interference checked computer based design. This paper discusses the organization and approach used to create the design models which form the basis for interference checking as well as the source of extracted production data. The design or product model is the nucleus of the computer data base that defines the configuration of the entire ship. The data base includes geometry, weight, and material, as well as production control data. The ability of the computer to link such diverse information is the key to maintaining configuration control during the course of the design and construction. The ease with which formatted manufacturing data (both N.C. fabrication and installation) can be extracted enables the preparation of detailed packages containing the desired geometry as well as the associated material and sequencing data, thus assuring the producibility of the design. The SA'Ar-5 design is CAd/CAM's state of the art in U.S. shipbuilding.

关键词： Warships

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design optimization for deep-submicron CMOS device at low temperature operation

Design optimization for deep-submicron CMOS device at low te...

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International Electron devices Meeting (IEdM)

作者： M. Kakumu d. Peters H.Y. Liu K.Y. Chiu Silicon Process Laboratory Circuit Technology R&D Hewlett Packard Company Palo Alto CA USA Semiconductor Device Engineering Toshiba Corporation Japan

design optimization for 0.3 mu m channel CMOS technology at liquid-nitrogen temperature. (77 K) is described. The trade-off between circuit performance and reliability of deep submicrometer CMOS devices at low-temperature operation is theoretically and experimentally examined. A simulator has been developed which selects power-supply voltage and process/device parameters for low-temperature operation. Based on the simulated results, design optimization for low-temperature operation has been proposed to determine power-supply voltage and various process and device parameters. This scaling guideline has been applied to a 0.3 mu m CMOS device. Excellent device characteristics and a functional ring oscillator circuit have been obtained at 77 K.< >

关键词： design optimization CMOS technology Circuit simulation Voltage Temperature Circuit optimization reliability theory Guidelines ring oscillators

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COMPArATIVE STrUCTUrAL LIFE ASSESSMENT OF PATrOL BOAT BOTTOM PLATING

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NAVAL ENGINEErS JOUrNAL 1990年第3期102卷 253-262页

作者： AYYUB, BM WHITE, GJ BELLWrIGHT, TF PUrCELL, ES Bilal M. Ayyub:is currently an associate professor of civil engineering at the University of Maryland. He received his B.S. degree in civil engineering from the University of Kuwait in 1980. He completed both his M.S. (1981) and Ph.D. (1983) in civil engineering at the Georgia Institute of Technology. Dr. Ayyub has an extensive background in risk-based analysis. He is engaged in research work involving structural reliability marine structures and mathematical modeling using the theories of probability statistics and fuzzy sets. His research work has been sponsored by the National Transportation Safety Board National Science Foundation U.S. Coast Guard Department of Defense State of Maryland and University of Maryland. He is the author of more than 100 publications in national and international journals conference proceedings and reports. Dr. Ayyub was a recipient of the ASNE “Jimmie” Hamilton Award for 1985 the ASCE “Outstanding Research Oriented Paper” in theJournal of Water Resources Planning and Managementfor 1987 and Edmund Friedman Young Engineer Award for Professional Achievement from ASCE for 1989. Gregory J. White:is an associate professor of naval architecture at the U.S. Naval Academy. He received his B.S. degreein engineering mechanics from Vanderbilt University in 1975 an M.E. degree in naval architecture from the University of California Berkeley in 1981 and a Ph.D. in civil engineering (structures) from the University of Maryland in 1986. Dr. White served on active duty with the U.S. Navy from 1975 to 1979 as a junior officer in the engineering and operations departments of Pacific Fleet destroyers. Prior to coming to the Naval Academy he worked at Mare Island Naval Shipyard in the scientific code and in the R&D division of Exxon International company's Tanker Department. Dr. White is the author of more than two dozen technical articles and reports and is one of the U.S. representatives to the International Ship and Offshore Structures Congress (ISSC). His research interests lie in t

The estimation of an absolute life expectancy of a structure is a complex process and the results are expected to have relatively large levels of uncertainty. In this study, a comparative analysis is undertaken between two different patrol boats. This is an approach which results in a higher confidence level because certain factors common to both boats can be eliminated by assuming them to be at constant normal levels. The study is limited to the critical forward bottom plating and takes into account the differences in material, plate dimensions, operational profile, structure and loading of the two vessels. Two failure modes, plastic plate deformation and fatigue, are considered, and a novel approach to plate wastage is included. Many factors affect the structural life of a vessel. They include structural type, operational profile, structural details, loads, inspection and maintenance, design methods, safety factors, corrosion, and environmental factors. There are three types of uncertainty associated with these factors; namely, physical randomness, statistical uncertainties, and model uncertainties. The method described is designed to address these uncertainties. The objective of the paper is to present the reliability-based structural life assessment method, and then to use it to evaluate and compare the structural performance of the forward bottom plating of the two patrol boats. The results of the evaluation are presented in the form of graphs and tables in order to facilitate the comparative evaluation. The method is performed within a computer-based format which allows parametric sensitivity analysis of several variables including the size of the plating panel, thickness, operational profile and loading. The sensitivity of the structural life expectancy of the forward bottom plating to variations in these parameters is evaluated.

关键词： Naval Vessels

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ESTIMATION OF STrUCTUrAL SErVICE LIFE OF SHIPS

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NAVAL ENGINEErS JOUrNAL 1989年第3期101卷 156-166页

作者： AYYUB, BM WHITE, GJ PUrCELL, ES P.E. Bilal M. Ayyub:is currently an associate professor of civil engineering at the University of Maryland. He received his B.S. degree in civil engineering from the University of Kuwait in 1980. He completed both his M.S. (1981) and Ph.D. (1983) in civil engineering at the Georgia Institute of Technology. Dr. Ayyub has an extensive background in risk-based analysis and design simulation and construction engineering. He is engaged in research work involving structural reliability bridges marine structures and mathematical modeling using the theories of probability statistics and fuzzy sets. His research work is sponsored by the National Transportation Safety Board the National Science Foundation the U.S. Coast Guard the State of Maryland and the University of Maryland. Dr. Ayyub is a member of ASNE the American Society of Civil Engineers (ASCE) the American Concrete Institute (ACI) the Committee on Forensic Engineering of ASCE and the Committee on Structural Safety of ACI. He is the author of more than three dozen publications in national and international journals conference proceedings and reports. Dr. Ayyub received the ASNE “Jimmie” Hamilton Award for 1985 and the ASCE “Outstanding Research Oriented Paper” in the Journal of Water Resources Planning and Management for 1987. Gregory J. White:is an associate professor of naval architecture at the U.S. Naval Academy. He received his B.S. degree in engineering mechanics from Vanderbilt University in 1975 an M.E. degree in naval architecture from the University of California Berkeley in 1981 and a Ph.D. in civil engineering (structures) from the University of Maryland in 1986. Dr. White served on active duty with the U.S. Navy from 1975 to 1979 as a junior officer in the engineering and operations departments of Pacific Fleet destroyers. Prior to coming to the Naval Academy he worked at Mare Island Naval Shipyard in the scientific code and in the R&D division of Exxon International Company's Tanker Department. Dr. White is a lieutenant commande

A methodology for the structural life assessment of a ship's structure is suggested. The methodology is based on probabilistic analysis using reliability concepts and the statistics of extremes. In this approach, the estimation of structural life expectancy is based on selected failure modes. All possible failure modes of the ship must be investigated and the most likely paths to structural failure identified. For the purpose of illustration two failure modes are considered in this study. They are plate plastic deformation and fatigue cracking. Structural life based on these two failure modes is determined for an example vessel. The methodology determines the probability of failure of the ship's structural components according to the identified failure modes as a function of time. The results can be interpreted as the cumulative probability distribution function (CdF) of structural life. due to the unknown level of statistical correlation between failure modes, limits or bounds on the CdF of the structural life are established. The limits correspond to the extreme cases of fully correlated and independent failure modes. The CdFs of structural life are determined for two inspection strategies; namely, inspection every year and inspection every two years with a warranty inspection at the end of the first year. The meaning of the results for the case investigated in this study is that, for example, given an inspection strategy of two years and a desired life of 15 years, there is a 72% chance that the vessel will not experience enough partial damage‘ in the failure modes identified to constitute reaching the “end of structural life” as defined.

关键词： Ships

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