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2021 International Conference on Networking, Communications and Information Technology, NetCIT 2021

作者： Deng, Hongyu Guo, Taipeng Gong, Linbo Wang, Wentao Liu, Yaohui Xiangnan University School of Computer and Artificial Intelligence Chenzhou42300 China Chenzhou Stroke Artificial Intelligence Technology Research and Development Center Hunan42300 China Hunan Engineering Research Center of Advanced Embedded Computing and Intelligent Medical Systems Hunan42300 China

ISBN: (纸本)9781665400701

For segmenting the target lesions accurately in CT images of cerebral hematoma, this paper proposes a spatial and multi-scale neural network segmentation model (MSHA-Unet). The model fuses the semantic information of the top and bottom layers of images in the same level by multi-kernel convolution, and fuses the attention mechanism in multi-scale feature images by jumping connection, so as to accurately locate and segment cerebral hematoma in medical CT images. To verify the effectiveness of the model, the experiment was carried out on 3716 CT images of 81 cases of cerebral hemorrhage, and the model was compared with six neural network models. The experimental results were measured by various evaluation standards, and showed that the model was superior to other network models. © 2021 IEEE.

关键词： Semantics

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Silicon wafer defect pattern detection using machine learning

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Materials Today: Proceedings 2023年

作者： Jariya, Mayank Kumar, Parveen Devi, Rekha Singh, Balwinder Center for Development of Advanced Computing Punjab Mohali160 071 India Chandigarh University Punjab Mohali140 413 India

A silicon integrated circuit has been created on silicon wafers by diffusing doping materials on the surface of the same. The silicon wafer is a thin disk made from semiconductor material (mostly ultrapure silicon). Silicon chip fabrication is an industrial process;hence defects occur on silicon wafers caused by unclean factory environment, production machine errors and fabrication process errors. The accurate classification of wafer defects provides information for engineers through regular patterns in the processes. Manual inspection of every chip is not economically feasible. In this study, WM-811k is used as the dataset. This is one of the most extensive wafer bin map dataset available open source on kaggle. It was created by MIRLABS. The dataset was compiled by taking the test data on 811,457 silicon wafer, in which each wafer map image was collected from real-world fabrication. A CNN and DNN model is used to classify the defect patterns. © 2023

关键词： Deep neural networks

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Secure and Fault-tolerant advanced Metering Infrastructure

Secure and Fault-tolerant Advanced Metering Infrastructure

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International Conference on Power System Technology (POWERCON)

作者： Dodla Sidhartha Lagineni Mahendra Katta Jagan Mohan R.K. Senthil Kumar B.S. Bindhumadhava Cente for Development of Advanced Computing Knowledge Park No 1 Old Madras Road Byappanahalli Bangalore INDIA Center for Development of Advanced Computing Knowledge Park No 1 Old Madras Road Byappanahalli Bangalore INDIA

ISBN: (数字)9781728163505

ISBN: (纸本)9781728163512

A Smart grid consists of many digital operations that bring the grid into an intelligent system. One of the key components in the smart grid is the advanced metering infrastructure (AMI). AMI helps to acquire the data from Interface Energy Meters (IEMs), which are geographically dispersed across substations. AMI includes Interface Energy Meters, data concentrator units, IT infrastructure and various communication mediums for meter data transfer like Power-line communication carries (PLCC), Fiber Optics, Very Small Aperture Terminal (VSAT), GSM/GPRS/3G/4G, etc. Instantaneous profile, event profile, load profile and billing profile of meter data is used for load and renewable energy forecasting, scheduling, outage management, power system planning and efficient management of power grid. Any fault/error in AMI components leads to data unavailability. The Communication between the IEMs and control center is vulnerable for various communication channel attacks like meter spoofing attack, authentication attacks, Man-In-The-Middle (MITM) attacks, reply attacks, etc. High availability, reliability and integrity of meter data are a need of the hour for efficient management of power systems operations. The proposed solution helps to achieve fault-tolerant AMI with high-secure data communication between IEMs and control centers by retaining interoperability.

关键词： Meters Fault tolerance Renewable energy sources Substations Fault tolerant systems Smart grids Stakeholders

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Augmented Reality Based Interactive Text Book: An Assistive Technology for Students with Learning Disability

Augmented Reality Based Interactive Text Book: An Assistive ...

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Symposium on Virtual Reality (SVR)

作者： K.P. Vinumol Ashsish Chowdhury Radhika Kambam V. Muralidharan Center for Dev. of Adv. Comput. Hyderabad India Center for Development of Advanced Computing Hyderabad India

Statistics based on research reveals that India has approximately ninety million people with varying degrees of Learning Disabilities (LD) and an average class in schools has about five students with learning disabilities. Epidemiological studies of learning disabilities in India are burdened by problems ranging from identification, assessment, to socio-cultural factors unique to India. Therefore, it is believed that number of children with LD may be much larger than five to a class of fifty students. Hence it is necessary for us to develop suitable technologies to assist the education of these learning disabilities children. This paper presents a PROTYPE called Interactive Text book for assisting students with learning disability. Here the book will be same as normal text book with out any special markers and identifiers. Once the children focus on a text, the 3D images, audio and videos that explains the text more graphically will be augmented on that page. This enhances the students understanding and makes the learning process easier for them.

关键词： Videos Optical character recognition software Augmented reality Text recognition Educational institutions Databases

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Design of a humidity sensor with PVT variations using AMI C5 CMOS technology

Design of a humidity sensor with PVT variations using AMI C5...

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International Conference on Recent Advances in Microwave Theory and Applications, MICROWAVE

作者： Kanhu Charan Ajit K. Panda Arti Noor Shruti Sabharwal Center for development of advanced computing Noida India National Institute of Science and Technology Berhampur Orissa India

Humidity sensor can be defined as a device, which consists of plastic material whose characteristics change as per the amount of humidity present in the air. Its various application areas include controlling of the climate, storage of food articles, domestic applications etc. The reference paper implemented the humidity sensor uses post-CMOS processing of CMOS fabricated chips to obtain suspended and thermally isolated diodes. However, the paper does not include the read out circuit and the design of op-amp. Industry however always considers the design under PVT (process, voltage & temperature) variations to make it commercial. This paper aims in designing op-amp, which is used in the read out circuit of the CMOS humidity sensor based on PVT variation (process, voltage and temperature variation). The design issues for switch capacitor used in the humidity sensor are also described. The thermal design equations for the sensor diode model have also been considered and presented.

关键词： CMOS technology Humidity Ambient intelligence Sensor phenomena and characterization Temperature sensors Thermal sensors CMOS process Diodes Circuits Operational amplifiers

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Effective TARO pattern generation

Effective TARO pattern generation

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VLSI Test Symposium

作者： Intaik Park A. Al-Yamani E.J. McCluskey Center of Reliable Computing University of Stanford USA TNT Advanced Development LSI Logic Corporation USA

TARO test patterns are transition fault test patterns that sensitize each transition fault to all of the outputs that can be reached from the fault location. We were not able to identify any ATPG tool that can generate TARO test patterns directly. This paper describes a technique to use an existing transition fault ATPG tool to efficiently generate TARO test patterns. This technique was used to generate TARO patterns for the ELF35 test chip. When these patterns were applied to the ELF35 chips, all of the defective chips were discovered (no test escapes).

关键词： Fault detection Automatic test pattern generation Test pattern generators Logic testing Flip-flops Large scale integration Fault location Ground penetrating radar Geophysical measurement techniques Writing

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A Theoretical Review: Risk Mitigation Through Trusted Human Framework for Insider Threats

A Theoretical Review: Risk Mitigation Through Trusted Human ...

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2019 International Conference on Cybersecurity, ICoCSec 2019

作者： Apau, Mohd Nazer Sedek, Muliati Ahmad, Rabiah Information Security and Network Research Group Center for Advanced Computing Technology Faculty of Information and Communication Technology Universiti Teknikal Malaysia Melaka Department of Computer Science Department of Language and Human Development Durian Tunggal Melaka76109 Malaysia

ISBN: (纸本)9781728156576

This paper discusses the possible effort to mitigate insider threats risk and aim to inspire organizations to consider identifying insider threats as one of the risks in the company's enterprise risk management activities. The paper suggests Trusted Human Framework (THF) as the on-going and cyclic process to detect and deter potential employees who bound to become the fraudster or perpetrator violating the access and trust given. The mitigation's control statements were derived from the recommended practices in the 'Common Sense Guide to Mitigating Insider Threats' produced by the Software Engineering Institute, Carnegie Mellon University (SEI-CMU). The statements validated via a survey which was responded by fifty respondents who work in Malaysia. © 2019 IEEE.

关键词： Surveys

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Evaluation of some English-Hindi MT systems

Evaluation of some English-Hindi MT systems

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International Conference on Advances in computing, Communications and Informatics (ICACCI)

作者： Nisheeth Joshi Iti Mathur Hemant Darbar Ajai Kumar Priyanka Jain Department of Computer Science Banasthali University Rajasthan India Center for Development of Advanced Computing Pune India

ISBN: (纸本)9781479930814

MT evaluation is a very important activity in MT system development. Evaluation of MT systems can help MT developers in understanding the short-comings of their systems and clear focus on the problem areas, so that systems performance can increase. In this paper we have discussed evaluation of some English-Hindi MT engines. For this, we have applied human as well as automatic evaluations of these systems. Automatic evaluation metrics across linguistic levels have been used to perform this study.

关键词： Measurement Engines Equations Mathematical model Pragmatics NIST Correlation

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Platform broker architectutre: A framework for programmable smart spaces

Platform broker architectutre: A framework for programmable ...

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IEEE International Conference on Computational Intelligence and computing Research

作者： P Govind Raj Subrat Kar Hari M Gupta Center for Development of Advanced Computing Noida India Department of Electrical Engineering IIT New Delhi India

Designing Smart Spaces involves handing physical spaces with abundance of computing devices with variety of resources, capabilities, services and policies. This paper presents a framework, called Platform Broker, that can be used for designing and developing programmable smart spaces. Programmable smart spaces can be considered as a second generation of smart space which allows “smart space programmers” to extend and program the smart space to incorporate newer applications and incorporate new devices into the smart space infrastructure. Platform Broker provides a mechanism for exporting, system resources in a smart space as synthetic file system. It has been designed and developed over the Android Mobile Platform.

关键词： File systems Humanoid robots Androids Cameras Middleware Space technology

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A robust & secure system for performing engineering analysis and design in a distributed environment

A robust & secure system for performing engineering analysis...

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Collect. of Pap. - 45th AIAA/ASME/ASCE/AHS/ASC Struct., Struct. Dyn. and Mater. Conf.;12th AIAA/ASME/AHS Adapt. Struct. Conf.;6th AIAA Non-Deterministic Approaches Forum;5th AIAA Gossamer Spacecraft Forum

作者： Liao, Li Talya, Shashishekara S. Kolonay, Raymond M. GE Global Research Center 1 Research Circle Schenectady NY 12301 Struct. Des. and Development Branch Air Force Research Laboratory Air Vehicles Directorate WPAFB OH 45433 Advanced Computing Technologies

In today's fast paced economy product design is becoming increasingly complex and requires tighter integration of the engineering and business processes not only within the individual businesses, but also across enterprises. This high demand for real-time business-to-business collaboration across enterprises requires a robust and secure channel not only for data exchange but also for process interaction. This paper presents a robust and secure collaborative environment to enable engineers to perform complex design analysis such as CAD, CAE, PDM, optimization, cost modeling, etc. across the network and Business firewalls. However, maintaining the secure communication protocol and close monitoring of the distributed computing process across network can present itself as a significant challenge. A multi-level security approach is developed to prevent any potential security and/or communication failure. This paper presents a typical engineering design scenario between General Electric (GE) and one of its vendors. In particular it will demonstrate how this environment can facilitate the communication of both data and applications across enterprise boundaries to tightly integrate a vendor into the GE's Design for Six Sigma process. Copyright © 2004 General Electric Company.

关键词： Distributed computer systems

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