咨询与建议

限定检索结果

文献类型

  • 788 篇 期刊文献
  • 753 篇 会议

馆藏范围

  • 1,541 篇 电子文献
  • 0 种 纸本馆藏

日期分布

学科分类号

  • 959 篇 工学
    • 301 篇 计算机科学与技术...
    • 255 篇 软件工程
    • 189 篇 电气工程
    • 166 篇 电子科学与技术(可...
    • 157 篇 化学工程与技术
    • 149 篇 控制科学与工程
    • 130 篇 核科学与技术
    • 116 篇 仪器科学与技术
    • 116 篇 材料科学与工程(可...
    • 109 篇 信息与通信工程
    • 105 篇 动力工程及工程热...
    • 96 篇 机械工程
    • 82 篇 冶金工程
    • 73 篇 光学工程
    • 59 篇 力学(可授工学、理...
    • 46 篇 生物工程
    • 44 篇 航空宇航科学与技...
    • 44 篇 安全科学与工程
    • 42 篇 生物医学工程(可授...
    • 30 篇 土木工程
  • 807 篇 理学
    • 429 篇 物理学
    • 237 篇 数学
    • 171 篇 化学
    • 138 篇 地球物理学
    • 104 篇 统计学(可授理学、...
    • 64 篇 生物学
    • 63 篇 系统科学
    • 29 篇 天文学
  • 117 篇 管理学
    • 94 篇 管理科学与工程(可...
  • 39 篇 医学
    • 31 篇 临床医学
  • 23 篇 农学
  • 19 篇 经济学
  • 8 篇 法学
  • 7 篇 教育学
  • 6 篇 文学
  • 2 篇 军事学
  • 2 篇 艺术学

主题

  • 31 篇 gamma rays
  • 27 篇 dark matter
  • 27 篇 cosmic rays
  • 26 篇 particle dark ma...
  • 21 篇 neural networks
  • 20 篇 automation
  • 19 篇 simulation
  • 19 篇 educational inst...
  • 18 篇 feature extracti...
  • 18 篇 dark matter dete...
  • 16 篇 predictive model...
  • 16 篇 accuracy
  • 15 篇 computational mo...
  • 14 篇 data models
  • 12 篇 weakly interacti...
  • 11 篇 neutrons
  • 10 篇 fault diagnosis
  • 10 篇 deep learning
  • 10 篇 convolution
  • 10 篇 control systems

机构

  • 224 篇 college of nucle...
  • 193 篇 school of physic...
  • 146 篇 school of automa...
  • 137 篇 college of physi...
  • 132 篇 school of physic...
  • 120 篇 school of physic...
  • 114 篇 university of sc...
  • 113 篇 university of ch...
  • 109 篇 department of en...
  • 101 篇 hebei normal uni...
  • 101 篇 state key labora...
  • 99 篇 tianfu cosmic ra...
  • 96 篇 yunnan observato...
  • 95 篇 center for astro...
  • 94 篇 key laboratory f...
  • 93 篇 moscow institute...
  • 92 篇 school of physic...
  • 91 篇 institute of fro...
  • 90 篇 national space s...
  • 87 篇 school of astron...

作者

  • 90 篇 axikegu
  • 78 篇 liu d.
  • 77 篇 fang j.
  • 77 篇 feng c.f.
  • 77 篇 bastieri d.
  • 77 篇 jiang k.
  • 77 篇 kuleshov d.
  • 77 篇 liu s.m.
  • 76 篇 chen m.j.
  • 75 篇 huang d.h.
  • 75 篇 dai h.l.
  • 74 篇 guo y.q.
  • 74 篇 danzengluobu
  • 73 篇 li xin
  • 73 篇 bao y.w.
  • 73 篇 hu h.b.
  • 70 篇 li cheng
  • 70 篇 min z.
  • 70 篇 liu b.
  • 69 篇 liu h.d.

语言

  • 1,448 篇 英文
  • 46 篇 中文
  • 42 篇 其他
检索条件"机构=College of Nuclear Technology and Automation Engineering Chengdu University of Technology"
1541 条 记 录,以下是1471-1480 订阅
排序:
Experiment and Simulation of Transistor Level Fault Model of IDDT Test
Experiment and Simulation of Transistor Level Fault Model of...
收藏 引用
2009 International Conference on Applied Superconductivity and Electromagnetic Devices(应用超导与电磁装置技术国际会议 ASEME 2009)
作者: Dajin Yu Shuyan Jiang Yongle Xie Gang Luo School of Automation Engineering University of Electronic Science and Technology of China Chengdu C Mechanical Engineering Department Chengdu Electromechanical College Chengdu China
Fault and fault model is the fundament of IC diagnosis. Fault model based on IDDT and its test is the hot issue of modern IC fault diagnosis at present. Open and short fault models of inverter, NAND gate, and SRAM of ... 详细信息
来源: 评论
Development of Driving Program of Wiring Harness Based on S3C44B0
Development of Driving Program of Wiring Harness Based on S3...
收藏 引用
2009国际通信电路与系统学术会议(ICCCAS 2009)(2009 International Conference on Communications,Circuits and Systems)
作者: Shuyan Jiang Gang Luo School of Automation Engineering University of Electronic Science and Technology of China Chengdu Mechanical Department Chengdu Electromechanical College Chengdu 610054 China
Now 32 bit embedded RISC microprocessor is used more largely with the development of IC industry. ARM microprocessor is a good choice for an embedded system. It provides many different kinds of interfaces for special ... 详细信息
来源: 评论
Research on the Characteristic Test of Via Holes in Microwave Circuits
Research on the Characteristic Test of Via Holes in Microwav...
收藏 引用
IEEE Circuits and Systems International Conference on Testing and Diagnosis, ICTD
作者: Yu Tian Yu Liu Ling Tong Jinxian Liu College of Automation Engineering University of Electronic Science and Technology Chengdu China National Key Laboratory for Electronic Measurement Technology Qingdao China
The detailed design and analysis for measuring characteristics of via holes in microwave circuits are presented, including the design of devices under test(DUT) and the test fixtures. Then the methodology of de-embedd... 详细信息
来源: 评论
Transmit power of interrogations controlling method in TCAS
Transmit power of interrogations controlling method in TCAS
收藏 引用
2009 Chinese Control and Decision Conference, CCDC 2009
作者: Yunsong, Lin Liangfu, Peng College of Automation University of Electronic Science and Technology of China Chengdu 610054 China College of Electrical Information Engineering Southwest University for Nationalities Chengdu 610041 China
The methods of controlling the transmit power of integration to limit the interferences which are resulted from air-to-air communication in the Traffic alert Collision Avoidance System are proposed. The dynamic contro... 详细信息
来源: 评论
A Soil Sampling Intelligent System Based on Elastic Algorithm and GIS
A Soil Sampling Intelligent System Based on Elastic Algorith...
收藏 引用
International Conference on Natural Computation (ICNC)
作者: Chen Yunping Wang Xiu Zhao Chunjiang Technology in Agricultural National Engineering Research Center for Information Security Beijing China College of Automation University of Electronic Science and Technology Chengdu China
The fast and low-cost soil sampling methods is the key for precision agriculture (PA) to be applied widely. In this paper, a general framework of an intelligent system for soil sampling has been constructed. Five modu... 详细信息
来源: 评论
Symmetrical 2DLDA Using Different Measures in Face Recognition
Symmetrical 2DLDA Using Different Measures in Face Recogniti...
收藏 引用
International Workshop on Knowledge Discovery and Data Mining (WKDD)
作者: Jicheng Meng Li Feng College of Automation Engineering University of Electronic Science and Technology Chengdu China Sichuan Province Inspection Test Bureau of Electronic Produces Chengdu China
Facial symmetry can be regarded as a not absolute but useful and natural feature. In this paper, this symmetrical feature is applied to two-dimensional linear discriminant analysis (2DLDA) for face image feature extra... 详细信息
来源: 评论
Denoising of Electric Power System Signals by ICA Based on EMD Virtual Channel
Denoising of Electric Power System Signals by ICA Based on E...
收藏 引用
IEEE PES Asia-Pacific Power and Energy engineering Conference (APPEEC)
作者: Hong Li Huangqiang Li College of Automation University of Electronic Science and Technology Chengdu China School of Electrical Engineering Wuhan University of China Wuhan China
The method integrated by independent component analysis (ICA) and empirical mode decomposition (EMD) is proposed in this paper, which can separate the signal from white noise. We used this method to eliminate the whit... 详细信息
来源: 评论
Research on HV-Power Equipment Diagnosis by Infrared Image Edge Detection
Research on HV-Power Equipment Diagnosis by Infrared Image E...
收藏 引用
IEEE PES Asia-Pacific Power and Energy engineering Conference (APPEEC)
作者: Huangqiang Li Yunlian Sun Hong Li School of Electrical Engineering Wuhan University of China Wuhan China College of Automation University of Electronic Science and Technology Chengdu China
As a method of fault diagnosis and state monitoring for HV-power equipments, infrared image analysis has been applied while edge detection is a crucial step of this image application. In this paper, a novel edge detec... 详细信息
来源: 评论
A Method on Analog Circuit Fault Diagnosis with Tolerance
A Method on Analog Circuit Fault Diagnosis with Tolerance
收藏 引用
IEEE Circuits and Systems International Conference on Testing and Diagnosis, ICTD
作者: Yanjun Li Houjun Wang Rueywen Liu College of Automation University of Electronic Science and Technology Chengdu China Department of Electrical Engineering University of Notre Dame South Bend IN USA
In this paper, it is proved that the direction of the node-voltage difference vector, which is the difference between the node-voltage vector at faulty state and the one at the nominal state, is determined only by the... 详细信息
来源: 评论
Analog circuit fault diagnosis using bagging ensemble method with cross-validation
Analog circuit fault diagnosis using bagging ensemble method...
收藏 引用
IEEE International Conference on Mechatronics and automation
作者: Hong Liu Guangju Chen Guoming Song Tailin Han School of Automation Engineering University of Electronic Science and Technology of China Chengdu China School of Computer Science and Technology Changchun University of Science and Technology Changchun China College of Electronic Science and Engineering Changchun University of Science and Technology 130022 China
Neural Network (NN) ensemble approach has been an appealing topic in the field of analog circuit fault diagnosis lately. In this paper, a new method for fault diagnosis of analog circuits with tolerance based on NN en... 详细信息
来源: 评论