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检索条件"机构=Computer Architecture and Technology Section Computer Science Department"
2405 条 记 录,以下是2261-2270 订阅
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Software agents and workflows meet CCISs interoperability
Software agents and workflows meet CCISs interoperability
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1999 Workshop on Knowledge and Data Engineering Exchange, KDEX 1999
作者: Maamar, Zakaria Defence Research Establishment Valcartier Information System Technology Section Interoperability Group 2459 Pie-XI Blvd North Val-BélairQCG3J1X5 Canada Computer Science Department and Research Center in Geomatics Laval University United States
A command-and-control information system (CCIS) is a military application that provides information to be used by a commander. The use of a single CCIS is rather easy. However, the operation becomes much more complex ... 详细信息
来源: 评论
Port interference faults in two-port memories
Port interference faults in two-port memories
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IEEE International Test Conference
作者: S. Hamdioui A.J. Van De Goor Intel Corporation Santa Clara CA USA Section Computer Architecture & Digital Technique Department of Electrical Engineering Faculty of Information Technology and Systems Delft University of Technnology Delft Netherlands
A two-port memory contains two similar ports, which can be accessed separately and independent of each other. In this paper, logical fault models are derived for the effect of shorts between the ports. The result is a... 详细信息
来源: 评论
Software agents and workflows meet CCISs interoperability
Software agents and workflows meet CCISs interoperability
收藏 引用
Workshop on Knowledge and Data Engineering Exchange
作者: Z. Maamar Interoperability Group Information System Technology Section Defence Research Establishment Val-Belair QUE Canada Computer Science Department and Research Center in Geomatics Laval University Canada
A command-and-control information system (CCIS) is a military application that provides information to be used by a commander. The use of a single CCIS is rather easy. However, the operation becomes much more complex ... 详细信息
来源: 评论
Industrial evaluation of DRAM tests
Industrial evaluation of DRAM tests
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Design, Automation and Test in Europe Conference and Exhibition
作者: A.J. van de Goer J. de Neef Dept. of Electr. Eng. Delft Univ. of Technol. Netherlands Faculty of Information Technology and Systems Department of Electrical Engineering Section Computer Architecture and Digital Technique Delft University of Technnology Delft Netherlands
This paper presents the results of 44 well known memory tests applied to 1896 1M*4 DRAM chips, using up to 96 different stress combinations with each test. The results show the importance of selecting the right stress... 详细信息
来源: 评论
Software agents for collaborative information sources
Software agents for collaborative information sources
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1999 International Conference on Information Intelligence and Systems, ICIIS 1999
作者: Maamar, Zakaria Interoperability Group Information System Technology Section Defence Research Establishment Valcartier 2459 Pie-XI Blvd North Val-BélairQCG3J 1X5 Canada Computer Science Department and Research Center in Geomatics Laval University Ste-FoyQCG1K 7P4 Canada
The main issue addressed in this paper is how to simultaneously involve several information sources (ISs) to satisfy users' needs. These ISs are distributed on networks and may present several incompatibilities at... 详细信息
来源: 评论
FACET: PC-parallel architecture for cost-efficient telemetry processing
FACET: PC-parallel architecture for cost-efficient telemetry...
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1998 IEEE Aerospace Conference, AERO 1998
作者: El-Ghazawi, Tarek Chalermwat, Prachya Piamsa-Nga, Punpiti Ozkaya, Armagan Speciale, Nick Wilson, Donald Computer Engineering and Computer Science Florida Institute of Technology MelbourneFL312901-6975 United States Parallel Architecture Laboratory Department of Electrical Engineering and Computer Science George Washington University WashingtonDC20052 United States NASA GSFC GreenbeltMD20771 United States
NASA's Mission to Planet Earth (MTPE) is planning to launch the Earth Observing System (EOS) starting in 1998. The large number of planned remote sensing satellites will bring 500 Gigabytes of information per day.... 详细信息
来源: 评论
Iterative blind image restoration using local constraints  9
Iterative blind image restoration using local constraints
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9th European Signal Processing Conference, EUSIPCO 1998
作者: May, Kaaren Stathaki, Tania Katsaggelos, Aggelos Signal Processing and Digital Systems Section Imperial College of Science Technology and Medicine London United Kingdom Department of Electrical and Computer Engineering Northwestern University EvanstonIL United States
A new method of incorporating local image constraints into blind image restoration is proposed. The local mean and variance of the degraded image are used to obtain .in initial estimate of the pixel intensity bounds. ... 详细信息
来源: 评论
Automatic Test Case Generation of Wireless Interface Protocols for Next Generation Mobile Telecommunications
Automatic Test Case Generation of Wireless Interface Protoco...
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1998 International Conference on Communication technology, ICCT 1998
作者: Jang, Dong-Won Jeong, Sang-Kook Kim, Myung-Hee Kim, Han-Kyoung Electron./Telecom. Res. Institute Protocol Technology Section Yousung 305-600 Korea Republic of Department of Computer Science ChangWon National University 9 Sarim-dong ChangWon KyungNam 641-773 Korea Republic of
We, in this paper, generate test cases of the wireless protocol that is used as air interface in IMT-2000 by means of the test generation tool based on protocol specifications as Petri Nets. So, we can perform conform... 详细信息
来源: 评论
Consequences of port restrictions on testing address decoder faults in two-port memories
Consequences of port restrictions on testing address decoder...
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Asian Test Symposium (ATS)
作者: S. Hamdioui A.J. van de Goor Faculty of Information Technology and Systems Department of Electrical Engineering Section of Computer Architecture & Digital Technique Delft University of Technnology Delft Netherlands
Testing two-port memories requires the use of single-port tests as well as special two-port tests; the test strategy determines which tests have to be used. Many two-port memories have ports which are read-only or wri... 详细信息
来源: 评论
Consequences of port restrictions on testing two-port memories
Consequences of port restrictions on testing two-port memori...
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IEEE International Test Conference
作者: S. Hamdioui A.J. van de Goor Faculty of Information Technology and Systems Department o Electrical Engineering Section Computer Architecture & Digital Technique Delft University of Technnology Delft Netherlands
Testing two-port memories requires the use of single-port tests as well as special two-port tests; the test strategy determines which tests to be used. Many two-port memories have ports which are read-only or write-on... 详细信息
来源: 评论