Analyzing the dynamic faulty behavior in DRAMs is a severely time consuming task, because of the exponential growth of the analysis time needed with each memory operation added to the sensitizing operation sequence of...
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Analyzing the dynamic faulty behavior in DRAMs is a severely time consuming task, because of the exponential growth of the analysis time needed with each memory operation added to the sensitizing operation sequence of the fault. In this paper, a new fault analysis approach for DRAM cell defects is presented where the total infinite space of dynamic faulty behavior can be approximated within a limited amount of analysis time. The paper also presents the analysis results for some cell defects using the new approach, in combination with detection conditions that guarantee the detection of any detectable dynamic faults in the defective cell.
In any measuring system the categorization of the error generation factors leads to simplification of complex error problems and to higher suppression of the error. In this paper we categorize, quantify and analyze th...
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The way address sequences and data patterns appear on the outside of a memory may differ from their internal appearance; this effect is referred to as scrambling, which has a large impact on the effectiveness of the u...
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ISBN:
(纸本)0769514537
The way address sequences and data patterns appear on the outside of a memory may differ from their internal appearance; this effect is referred to as scrambling, which has a large impact on the effectiveness of the used tests. This paper presents an analysis of address and data scrambling for memory chips, at the layout and at the electrical level. A method is presented to determine the data backgrounds to be used for the different memory tests. It will be shown that the required data backgrounds are fault model, and hence, also test specific. Industrial results will show the influence of the used data backgrounds on the fault coverage of the tests.
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverage. The important class of dynamic faults, therefore, cannot be ignored any more. It is shown that conventional memo...
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The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverage. The important class of dynamic faults, therefore, cannot be ignored any more. It is shown that conventional memory tests constructed to detect static faulty behavior of a specific defect do not necessarily detect the dynamic faulty behavior. Indeed, dynamic faulty behavior can take place in the absence of static faults. The paper presents new memory tests derived to target the dynamic fault class.
It has always been assumed that fault modelsin memories are sufficiently precise for specifying the faultybehavior. This means that, given a fault model, it shouldbe possible to construct a test that ensures detecting...
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ISBN:
(纸本)9780769514710
It has always been assumed that fault modelsin memories are sufficiently precise for specifying the faultybehavior. This means that, given a fault model, it shouldbe possible to construct a test that ensures detecting themodeled fault. This paper shows that some faults, calledpartial faults, are particularly difficult to detect. For thesefaults, more operations are required to complete their faulteffect and to ensure detection. The paper also presentsfault analysis results, based on defect injection and simulation,where partial faults have been observed. The impactof partial faults on testing is discussed and a test to detectthese partial faults is given.
Most industrial memories have an external word-width of more than one ***, most published memory test algorithms assume 1-bit memories; they will not detect coupling faults between the cells of a *** paper improves up...
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ISBN:
(纸本)9780769514710
Most industrial memories have an external word-width of more than one ***, most published memory test algorithms assume 1-bit memories; they will not detect coupling faults between the cells of a *** paper improves upon the state of the art in testing word-oriented memories by presenting a new method for detecting state coupling faults between cells of the same word, based on the use of m-out-of-n *** result is a reduction in test time, which varies between 20 and 38%.
This paper describes a neural computation approach to independent component imaging of disease signatures. The novel feature is to separate mixed imagery sources blindly over an informative index subspace. The recover...
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ISBN:
(纸本)078037584X
This paper describes a neural computation approach to independent component imaging of disease signatures. The novel feature is to separate mixed imagery sources blindly over an informative index subspace. The recovery of patterns is achieved by independent component analysis, whose parameters are estimated using the infomax principle. We discuss the theoretic roadmap of the approach, and its applications to the partial volume correction in cDNA microarray expression and the neuro-transporter binding separation in positron emission tomography.
In a two or three-dimensional image array, the computation of Euclidean distance transform (EDT) is an important task. With the increasing application of 3D voxel images, it is useful to consider the distance transfor...
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Fault analysis of memory devices using defect injection and simulation is becoming increasingly important as the complexity of memory faulty behavior increases. In this paper this approach is used to study the effects...
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ISBN:
(纸本)0769509932
Fault analysis of memory devices using defect injection and simulation is becoming increasingly important as the complexity of memory faulty behavior increases. In this paper this approach is used to study the effects of opens and shorts on the faulty behavior of embedded DRAM (eDRAM) devices produced by Infineon Technologies. The analysis shows the existence of previously defined memory fault models, and establishes new ones. The paper also investigates the concept of dynamic faulty behavior and establishes its importance for memory devices. Conditions to test the newly established fault models are also given.
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