This paper begins with a brief overview of realistic fault models for multi-port SRAMs with p ports, divided into p classes: single-port faults, two-port faults,..., p-port faults. Except for single-port faults, all o...
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ISBN:
(纸本)0769513786
This paper begins with a brief overview of realistic fault models for multi-port SRAMs with p ports, divided into p classes: single-port faults, two-port faults,..., p-port faults. Except for single-port faults, all other fault classes cannot be detected with the conventional (single-port) memory tests; they require special tests. Next, the paper presents a set of three linear single-addressing tests for unique multi-port memory faults (p > 2) that will be merged into a single test.
This paper presents the experimental investigations into skin effect influences on current distortion and increase in loss for 20 kHz PWM-VSI-fed slotless PMSM drives. At first, the relation between the current distor...
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This paper presents the experimental investigations into skin effect influences on current distortion and increase in loss for 20 kHz PWM-VSI-fed slotless PMSM drives. At first, the relation between the current distortion and the skin effect of lamination steels caused by high frequency component of flux is examined. Secondly, the relation between the increase in loss and the skin effect of coils caused by high frequency component of current is investigated. Finally, the machine design aspects of reducing the current distortion and the associated losses are examined.
Presents a complete analysis, at the electrical level, of address decoder faults caused by resistive opens, and by capacitive-coupling between address lines. Several authors have demonstrated the importance of this cl...
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ISBN:
(纸本)0769513786
Presents a complete analysis, at the electrical level, of address decoder faults caused by resistive opens, and by capacitive-coupling between address lines. Several authors have demonstrated the importance of this class of faults. New test conditions, and new march tests are derived to detect the resulting faults; and industrial results, applied to DRAMS, show the effectiveness of the new tests.
A fast procedure for classifying a given test pattern to one of its possible classes using both the K-NN decision rule and concepts of the fuzzy set theory is described in this paper. The method is divided into two st...
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Systematic design, user centered implementation and testing to requirements can contribute significantly to assuring quality of design support tools. The problem is that disorganized requirements elicitation and testi...
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In this paper a new morphological technique suitable for colour image skeleton extraction is presented. Vector morphological operations are defined by means of a new ordering of vectors of the HSV colour space, which ...
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We present a methodology for performing morphological operations using coordinate logic ones. Coordinate logic operations are simple and fast because they are logic operations among the corresponding binary values of ...
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We present a methodology for performing morphological operations using coordinate logic ones. Coordinate logic operations are simple and fast because they are logic operations among the corresponding binary values of the image pixels. Coordinate logic (CL) filters are a family of fast non-increasing, non-linear filters, which are based on coordinate logic operations. CL filters exhibit analogous properties to those of the morphological filters but due to their different definition they display slightly different response. This is revoked in this paper by using appropriate image gray level quantization. Based on this approach some fast efficient realizations of morphological filters using CL operators are proposed.
In this paper we present a methodology for performing morphological operations using coordinate logic *** logic operations are simple and fast because they are logic operations among the corresponding binary values of...
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In this paper we present a methodology for performing morphological operations using coordinate logic *** logic operations are simple and fast because they are logic operations among the corresponding binary values of the image *** logic(CL) filters are a family of fast non-increasing,non-linear filters,which are based on coordinate logic *** filters exhibit analogous properties to those of the morphological filters but due to their different definition they display slightly different response. This is revoked in this paper by using appropriate image gray level *** on this approach some fast efficient realizations of morphological filters using CL operators are proposed.
In this paper a new morphological technique suitable for colour image skeleton extraction is presented. Vector morphological operations are defined by means of a new ordering of vectors of the HSV colour space, which ...
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In this paper a new morphological technique suitable for colour image skeleton extraction is presented. Vector morphological operations are defined by means of a new ordering of vectors of the HSV colour space, which is a combination of conditional and partial sub-ordering. Then, these are used to extract skeletons of colour images in terms of erosions and openings. The proposed method was tested with a variety of images and such experimental results are provided. Its applications include image compression and recognition problems.
This paper describes the results of testing 50 single inline memory modules (SIMMs) each containing 16 16 Mbit DRAM chips (DUTs); 39 SIMMs failed, and of the 800 DUTs, 116 failed. In total 54 different test algorithms...
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This paper describes the results of testing 50 single inline memory modules (SIMMs) each containing 16 16 Mbit DRAM chips (DUTs); 39 SIMMs failed, and of the 800 DUTs, 116 failed. In total 54 different test algorithms have been applied, using up to 168 different stress combinations for each test. The results show that GAL9R is the best test. Furthermore, it is shown that burst mode tests detect a completely different class of faults as compared with traditional word mode tests, and that tests with address scrambling enabled the detection of more faults.
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