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检索条件"机构=Computer Engineering Technology Section"
997 条 记 录,以下是911-920 订阅
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Detecting unique faults in multi-port SRAMs
Detecting unique faults in multi-port SRAMs
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Asian Test Symposium (ATS)
作者: S. Hamdioui A.J. Van de Goor D. Eastwick M. Rodgers Intel Corporation Santa Clara CA USA Faculty of Information Technology and Systems Section of Computer Engineering Delft University of Technnology Delft Netherlands
This paper begins with a brief overview of realistic fault models for multi-port SRAMs with p ports, divided into p classes: single-port faults, two-port faults,..., p-port faults. Except for single-port faults, all o... 详细信息
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Experimental investigations into skin effect influences on current distortion and increase in loss for 20 kHz PWM-VSI-fed slotless PMSM drives
Experimental investigations into skin effect influences on c...
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Conference Record of the IEEE Industry Applications Society Annual Meeting (IAS)
作者: T. Kosaka H. Hasegawa N. Matsui T. Shikayama R. Oguro Department of Electrical and Computer Engineering Nagoya Institute of Technology Nagoya Japan Motor Drives Research Section Yaskawa Electric Corporation Fukuoka Japan
This paper presents the experimental investigations into skin effect influences on current distortion and increase in loss for 20 kHz PWM-VSI-fed slotless PMSM drives. At first, the relation between the current distor... 详细信息
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Tests for resistive and capacitive defects in address decoders
Tests for resistive and capacitive defects in address decode...
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Asian Test Symposium (ATS)
作者: M. Klaus A.J. Van de Goor PE Department ProMOS Technologies Inc. Hsinchu Taiwan Faculty of Information Technology and Systems Section of Computer Engineering Delft University of Technnology Delft Netherlands
Presents a complete analysis, at the electrical level, of address decoder faults caused by resistive opens, and by capacitive-coupling between address lines. Several authors have demonstrated the importance of this cl... 详细信息
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A fast fuzzy K-nearest neighbour algorithm for pattern classification
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Intelligent Data Analysis 2000年 第3-4期4卷 275-288页
作者: Boutalis, Yiannis S. Andreadis, Ioannis T. Tambakis, George D. Section of Electronics and Information Systems Technology Department of Electrical and Computer Engineering Democritus University of Thrace GR-67100 Xanthi Greece
A fast procedure for classifying a given test pattern to one of its possible classes using both the K-NN decision rule and concepts of the fuzzy set theory is described in this paper. The method is divided into two st... 详细信息
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SOFTWARE TOOLS FOR ABSTRACT PROTOTYPING OF DESIGN SUPPORT TOOLS
SOFTWARE TOOLS FOR ABSTRACT PROTOTYPING OF DESIGN SUPPORT TO...
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ASME 2000 International Design engineering Technical Conferences and computers and Information in engineering Conference, IDETC-CIE 2000
作者: Opiyo, Eliab Z. Horváth, Imre Vergeest, Joris S.M. Delft University of Technology Faculty of Design Engineering and Production Department of Design Engineering Computer Aided Design and Engineering Section Jaffalaan 9 DelftNL-2628 BX Netherlands
Systematic design, user centered implementation and testing to requirements can contribute significantly to assuring quality of design support tools. The problem is that disorganized requirements elicitation and testi... 详细信息
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Colour image skeletonisation  10
Colour image skeletonisation
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2000 10th European Signal Processing Conference, EUSIPCO 2000
作者: Andreadis, Ioannis Vardavoulia, Maria I. Louverdis, Gerasimos Papamarkos, Nikolaos Section of Electronics and Information Systems Technology Department of Electrical and Computer Engineering Democritus University of Thrace XanthiGR-671 00 Greece
In this paper a new morphological technique suitable for colour image skeleton extraction is presented. Vector morphological operations are defined by means of a new ordering of vectors of the HSV colour space, which ... 详细信息
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Using simple coordinate logic operators to realize basic morphological operations
Using simple coordinate logic operators to realize basic mor...
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International Conference on Signal Processing Proceedings (ICSP)
作者: Y.S. Boutalis K. Tsirikolias B.G. Mertzios I.T. Andreadis Section of Electronics and Information Systems Technology Department of Electrical and Computer Engineering Democritus University of Thrace Xanthi Greece
We present a methodology for performing morphological operations using coordinate logic ones. Coordinate logic operations are simple and fast because they are logic operations among the corresponding binary values of ... 详细信息
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Using Simple Coordinate Logic Operators to Realize Basic Morphological Operations
Using Simple Coordinate Logic Operators to Realize Basic Mor...
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2000年第16届世界计算机大会
作者: Y.S.Boutalis K.Tsirikolias B.G.Mertzios I.T.Andreadis Section of Electronics and Information Systems Technology Department of Electrical and Computer Engineering Democritus University of Thrace GR-67100 XANTHIHELLAS
In this paper we present a methodology for performing morphological operations using coordinate logic *** logic operations are simple and fast because they are logic operations among the corresponding binary values of... 详细信息
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Colour image skeletonisation
Colour image skeletonisation
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European Signal Processing Conference (EUSIPCO)
作者: Ioannis Andreadis Maria I. Vardavoulia Gerasimos Louverdis Nikolaos Papamarkos Section of Electronics & Information Systems Technology Department of Electrical & Computer Engineering Democritus University of Thrace GR-671 00 Xanthi Greece
In this paper a new morphological technique suitable for colour image skeleton extraction is presented. Vector morphological operations are defined by means of a new ordering of vectors of the HSV colour space, which ... 详细信息
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Industrial evaluation of DRAM SIMM tests
Industrial evaluation of DRAM SIMM tests
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IEEE International Test Conference
作者: Ad.J. van de Goor A. Paalvast Faculty of Information Technology and Systems Department of Electrical Engineering Section Computer Architecture and Digital Technique Delft University of Technnology Delft Netherlands
This paper describes the results of testing 50 single inline memory modules (SIMMs) each containing 16 16 Mbit DRAM chips (DUTs); 39 SIMMs failed, and of the 800 DUTs, 116 failed. In total 54 different test algorithms... 详细信息
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