CHAOS is a C‐based program on SUN workstations, designed for studying nonlinear dynamics. It furnishes easy access to graphical and numerical procedures through the SUN windowing system. Among the graphical tools of ...
CHAOS is a C‐based program on SUN workstations, designed for studying nonlinear dynamics. It furnishes easy access to graphical and numerical procedures through the SUN windowing system. Among the graphical tools of CHAOS are the drawing of basins, basin boundaries, bifurcation diagrams, unstable manifolds, and point sets. The program can plot in 2D and 3D as well as on the surface of a cylinder, sphere, or torus. On the numerical side, CHAOS can compute fractal and correlation dimensions, Lyapunov exponents, Poincaré maps, power spectra, and periodic orbits. The program allows for the quick and easy addition of new systems of equations.
Simulations of field-ion-microscope images for the icosahedral phase of Al-Mn, based on new structural models, are presented and compared to the experimentally observed image features. Closest agreement thus far is fo...
Simulations of field-ion-microscope images for the icosahedral phase of Al-Mn, based on new structural models, are presented and compared to the experimentally observed image features. Closest agreement thus far is found for a cubic model having a 3·32 nm unit cell edge and containing a MacKay-icosahedron inner motif, with all of the manganese sublattice and only some of the aluminum atoms contributing to the computed images. An octahedral-motif decoration of a perfect three-dimensional Penrose tiling has also been constructed for comparison.
A denotational, hence, compositional semantics for a subset of Concurrent Prolog is developed and related to an operational semantics. The denotational semantics makes divergence and the resultant substitutions of fin...
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A denotational, hence, compositional semantics for a subset of Concurrent Prolog is developed and related to an operational semantics. The denotational semantics makes divergence and the resultant substitutions of finite computations together with the termination mode-success, failure, or deadlock-observable. Relative to this notion of observation it is proved that the denotational semantics is fully abstract in the sense that it records the minimal amount of extra information beyond the observables to make it compositional. Full abstraction is an important property because it quantifies the information that one needs in order to reason about individual program-parts independently. This is believed to be the first such result in the area of concurrent logic programming.< >
The concepts of grey, white, and black systems are formally introduced and developed into logic testing area, i.e. the area of error detection and fault isolation, to find a direction to establish more efficient test ...
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The concepts of grey, white, and black systems are formally introduced and developed into logic testing area, i.e. the area of error detection and fault isolation, to find a direction to establish more efficient test schemes for testing digital systems at a reasonable cost. A probabilistic isolation strategy realized by a heuristic and decision-making algorithm is presented to isolate faults in grey systems efficiently in terms of computation space and time.< >
作者：
S.Y.H. SuH. MaDepartment of Computer Science
Research Group on Design Automation and Fault-tolerant Computing Thomas J. Watson School of Engineering Applied Science and Technology State University of New York Binghamton Binghamton NY USA Department of Electrical Engineering
Research Group on Design Automation and Fault-tolerant Computing Thomas J. Watson School of Engineering Applied Science and Technology State University of New York Binghamton Binghamton NY USA
Novel concepts of designs for diagnosability and reliability are defined and developed. A diagnosable design of VLSI system is presented, in which fault isolation is realized by minimal additional hardware instead of ...
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Novel concepts of designs for diagnosability and reliability are defined and developed. A diagnosable design of VLSI system is presented, in which fault isolation is realized by minimal additional hardware instead of traditional software diagnostic procedures such that the computation space and time for fault isolation are saved. The presented fault-tolerant design uses online fault detection and isolation techniques, yields higher reliability with minimized hardware overhead of no more than 125% as opposed to over 200% in classical redundancy fault-tolerant designs. Using this scheme, the ability to isolate intermittent faults is a significant improvement over existing fault isolation methods because faults could be isolated right after they are detected.< >
作者：
Pratt, M.J.Cranfield Inst of Technology
Dep of Applied Computing & Mathematics Cranfield Engl Cranfield Inst of Technology Dep of Applied Computing & Mathematics Cranfield Engl
Although the Initial Graphics Exchange Specification is not without its imperfections and critics, it is widely considered to be the best format currently available for the exchange of CAD data. However, IGES is seen ...
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Although the Initial Graphics Exchange Specification is not without its imperfections and critics, it is widely considered to be the best format currently available for the exchange of CAD data. However, IGES is seen as an interim measure, eventually to be superseded by a new international standard. This article reviews the present state of IGES and considers likely future trends in CAD data exchange.
Functional testing is becomilng more important due to the increasing complexity in digital LSI/VLSI devices. Various functional testing approaches have been proposed to meet this urgent need in LSI/VLSI testing. This ...
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ISBN:
(纸本)9780818605420
Functional testing is becomilng more important due to the increasing complexity in digital LSI/VLSI devices. Various functional testing approaches have been proposed to meet this urgent need in LSI/VLSI testing. This paper presents the basic ideas behind deterministic functional testing and concisely overviews eight major functional testing techniques. Comparisons among these techniques and suggestions for future development are made to meet the challenges in this fast growing testing field.
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