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Frontiers in Education (FIE) Conference

作者： C.A.P.S. Martins M.B. Carvalho C.V. Pousa D.O. Penha Computer Science Department and Graduate Program in Electrical Engineering (PPGEE) Computational and Digital System Laboratoty (LSDC) Pontifical Catholic University of Minas Gerais Belo Horizonte Minas Gerais Brazil PUC-Minas PPGEE LSDC Belo Horizonte Minas Gerais Brazil Computer Science Department LSDC PUC-Minas Belo Horizonte Minas Gerais Brazil

In this paper we analyze the use of research activities as learning instrument in electrical engineering and computer science. This pedagogic approach was applied in undergraduate disciplines, undergraduate teaching assistance and undergraduate research projects. Our main goals are optimize the learning process using research and motivate the use of research activities as learning instrument.

关键词： Instruments computer science Education Performance analysis Electrical engineering Learning systems Proposals Humans Microprocessors Cache memory

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Server of quality system for video on demand over ATM

Server of quality system for video on demand over ATM

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IEEE International Conference on ATM

作者： R.M. Silveira W.V. Ruggiero LARC-Laboratory of Computer Architecture and Networks PCS-Department of Computer and Digital System Engineering EPUSP Polytechnic School University of Sao Paulo Sao Paulo Brazil

ISBN: (纸本)0780370937

Considering video transmission over an ATM network for a video on demand system, we propose a server of quality (SoQ) that has the main function of fitting the video transmission rate to the available network bandwidth. The SoQ uses a "backpropagation" neural network to fit the MPEG quantization coefficients in a nonlinear way. Here are shown the SoQ specification and the results obtained from its main module implementation.

关键词： Video on demand Asynchronous transfer mode Bit rate Network servers Bandwidth Neural networks Quality of service Quantization Telecommunication traffic Backpropagation

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Effect of ground guard fence with via and ground slot on radiated emission in multi-layer digital printed circuit board

Effect of ground guard fence with via and ground slot on rad...

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IEEE International Symposium on Electromagnetic Compatibility (EMC)

作者： H. Lee Jonghoon Kimi Seungyoung Ahn Jung-Gun Byun Deog-Soo Kang Cheol-Seung Choi Hae-Jin Hwang Joungho Kim Department of Electrical Engineering and Computer Science Korea Advanced Institute of Science and Technology Kusong Taejon Korea Korea Advanced Institute of Science and Technology Daejeon Daejeon KR System R&D Group Digital Media Business Samsung Electronics Co. Ltd. Suwon Korea

In high-speed digital printed circuit board (PCB), the ground guard fence is often used to reduce the radiated emission and the crosstalk. Moreover, it is quite useful for the presence of the ground slot under the signal trace to avoid the reflection and the radiated emission. In this paper, the effects of the guard fence are studied by experimental measurement and numerical electromagnetic simulation. It is found that the ground guard fence acts efficiently as the shielding wall against the signal trace, which results in the significant reduction of the radiated emission. Also, its inherent low radiation property works well at presence of the ground slot under the signal trace.

关键词： Microstrip Printed circuits Circuit testing digital printing Electromagnetic radiation Electromagnetic shielding Numerical simulation digital circuits Dielectric substrates Research and development

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A dual rail circuits synthesis environment for the implementation of multiple output boolean functions

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International Journal of Circuit Theory and Applications 1999年第4期26卷

作者： Theodore Karoubalis George Ph. Alexiou Nick Kanopoulos Computer Technology Institute 26221 Patras & Department of Computer Engineering and Informatics University of Patras 26500 Patras Greece Center for Digital System Engineering Research Triangle Institute Research Triangle Park NC 27709 U.S.A.

This paper presents an integrated CAD system for synthesizing high-performance dual rail circuits using DCVS logic. The proposed techniques exploit ROBDDs to provide efficient DCVS trees that fulfill the design rules and constraints. Sharing of common transistor structures is examined to decrease further the overall device count and chip area by improving the wirability of DCVS circuits. This is accomplished by generating a common variable ordering that permits identification of common subcircuits and simplification of routing procedures by enhancing straight-line wiring of input signals. The paper also presents the integration steps that are undertaken for importing the developed tools into Alliance CAD system, in order to provide a complete and consistent DCVS circuits synthesis environment and methodology. Moreover, experimental results showed that the proposed algorithms, which are time and memory efficient, produce near optimal device counts improving placement and routing procedures. The integrated design framework, which is available for academic and research purposes, has been employed to synthesize, simulate and layout a programmable 16-bit serial/parallel multiplier as a complete DCVS circuit synthesis example. © 1998 John Wiley & Sons, Ltd.

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A mixed norm image restoration

A mixed norm image restoration

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IEEE International Conference on Image Processing

作者： Min-Cheol Hong T. Stathaki A.K. Katsaggelos Department of Electrical and Computer Engineering Northwestern University Evanston IL USA Signal Processing and Digital System Section Imperial College London UK

In this paper, we propose an iterative mixed norm image restoration algorithm. A functional which combines the least mean squares (LMS) and the least mean fourth (LMF) functionals is proposed. A function of the kurtosis is used to determine the relative importance between the LMS and the LMF functionals. An iterative algorithm is utilized for obtaining a solution and its convergence is analyzed. Experimental results demonstrate the capability of the proposed approach.

关键词： Image restoration Least squares approximation Degradation Signal processing algorithms Iterative algorithms Algorithm design and analysis Gaussian noise Adaptive filters Additive noise digital signal processing

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An iterative mixed norm image restoration algorithm

An iterative mixed norm image restoration algorithm

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IEEE Signal Processing Workshop on Higher-Order Statistics

作者： Min-Cheol Hong T. Stathaki A.K. Katsaggelos Department of Electrical & Computer Engineering Northwestern University Evanston IL USA Signal Processing and Digital System Section Imperial College London UK

关键词： Image restoration Iterative algorithms Least squares approximation Degradation Signal processing algorithms Gaussian noise Algorithm design and analysis Adaptive filters Additive noise Gaussian distribution

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Wavelet and entropy analysis combination to evaluate diffusion and correlation behaviours

Wavelet and entropy analysis combination to evaluate diffusi...

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Brazilian Symposium on computer Graphics and Image Processing (SIBGRAPI)

作者： R.C.H. Chiou M.A.G.V. Ferreira C.T. Silva A.E. Kaufman Center for Visual Computing State University of New York Stony Brook Stony Brook NY USA Department of Computer and Digital System Engineering Polytechnic School of University of Sao Paulo Sao Paulo Brazil

Diffusion and correlation effects are two principal phenomena which have been studied for years and several visualization techniques have been proposed to help scientists to understand them. The analysis of these phenomena will help to extract important information from data sets. To understand these problems we combine wavelet and entropy analysis to evaluate the evolution of these behaviours through scale and time. We present image case studies to show several different kinds of behaviours of these effects. Some of them are fallible cases and not reliable, as the images do not show the desired information. We calculate entropy of smooth and detail coefficient sets, generated by wavelet transform of these sample images in each scale, to obtain measures that allow us to evaluate these behaviours according to the organization complexity. These measures can provide an indication about the quality of the rendered images.

关键词： Wavelet analysis Entropy Information analysis Wavelet transforms Multiresolution analysis Data visualization Rendering (computer graphics) digital systems systems engineering and theory Data mining

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Built in self testing for detection of coupling faults in semiconductor memories

Built in self testing for detection of coupling faults in se...

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1996 IEEE International Workshop on Memory Technology, Design and Testing, MTDT 1996

作者： Karpovsky, Mark G. Das, Debaleena Vardhan, Harsh Department of Electrical Computer and System Engineering Boston University 44 Cummington Street BostonMA02215 United States DAD Texas Instruments India Wind Tunnel Road Bangalore India Digital Semiconductor A Digital Equipment Corporation Business 77 Reed Road HLO2-2/B10 HudsonMA01749 United States

ISBN: (纸本)0818674687

In this work we investigate the problem of detection and location of single and unlinked multiple pattern sensitive faults in bit oriented RAMs and implementation of a built-in self-test (BIST) unit to test RAM chips in an efficient manner. Our fault model covers cross-talks between any k cells in RAMS. We have reduced the problem of memory testing to the problem of the generation of exhaustive back grounds. Exhaustive tests for detecting coupling faults for k up to 6 (which covers Type I neighborhood) and near exhaustive tests for k up to 9 (which covers Type II neighborhood) are constructed. The systematic nature of the tests constructed enables us to use BIST schemes, for RAMs, with low hardware over heads. We implemented the BIST units for a bit-oriented memory of size IM and calculated the hardware overhead in terms of transistors and area. © 1996 IEEE.

关键词： Random access storage

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Built in self testing for detection of coupling faults in semiconductor memories

Built in self testing for detection of coupling faults in se...

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IEEE International Workshop on Memory Technology, Design and Testing

作者： M.G. Karpovsky D. Das H. Vardhan Department of Electrical Computer and System Engineering Boston University Boston MA USA DAD Texas Instruments (India) Private Limited Bangalore India Digital Semiconductor Hudson MA USA

关键词： Automatic testing Fault detection Random access memory Read-write memory Built-in self-test Decoding system testing Logic arrays Electrical fault detection Semiconductor memory

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Optimal synthesis of differential cascode voltage switch (DCVS) logic circuits using ordered binary decision diagrams (OBDDs)

Optimal synthesis of differential cascode voltage switch (DC...

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European Design Automation Conference

作者： T. Karoubalis G.Ph. Alexiou N. Kanopoulos Computer Technology Institute Patras Greece Department of Computer Engineering and Informatics University of Patras Patras Greece Center for Digital System Engineering RTI International Inc. NC USA

This paper presents a method for near-optimum synthesis of Differential Cascade Voltage Switch (DCVS) logic circuits using Ordered Binary Decision Diagrams (OBDD). The method presented produces efficient DCVS circuit structures in terms of transistor count which positively affects the circuit area and performance. The proposed method is also very practical because it produces results with short run-times on a design workstation. The paper presents experimental results that demonstrate the use and the efficiency of the proposed DCVS synthesis method. This method is the basis for a CAD tool that allows automatic synthesis of fault secure circuits based on the DCVS technology.

关键词： Switches Voltage Circuit synthesis Switching circuits Logic circuits Data structures Boolean functions Runtime Workstations Design automation

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