作者:
BOHM, SELHAKEEM, AKMURTHY, KMSHACHICHA, MKADOCH, MDepartment of Electrical and Computer Engineering
Concordia University 1455 De Maisonneuve Blvd. West Montreal H3A 1M8 Canada Was born in Montreal
Canada on 14 September 1966. He received the B. Eng. degree in electrical engineering from Concordia University Montreal Canada in 1989. He is at present completing the M.A.Sc. degree in electrical engineering at Concordia University. (S'75–S'79–M'79–SM'86) received the Ph.D. degree from Southern Methodist University
Dallas TX in 1979. He spent the next two years working as a Visiting Professor in Egypt after which he moved to Ottawa Canada in 1982. He assumed teaching and research positions in Carleton and Manitoba Univerities and later moved to Concordia University Montreal Canada in 1983 where he is now a Professor in the Electrical and Computer Engineering Department. He has published numerous papers in IEEE and international journals in the areas of spread spectrum and networking. He is a well-known expert in these areas and serves as a consultant to many companies. His current research interests include wide-band metropolitan networks switching architectures and performance of on-board multibeam satellites acquisitionless CDMA networks code distribution and orthogonalization of CDMA signals responsive congestion control for ATM-based networks ARQ techniques and investigation of the novel SUGAR CDMA systems in fading channels. Dr. Elhakeem is a Senior Member of the Canadian Electrical Engineering Society and Armed Forces Association. He has chaired numerous technical sessions in IEEE Conferences was the Technical Program Chairman for IEEE Montech 1986 Montreal Canada. Dr. Elhakeem is the key guest editor of theIEEE Journal of Selected Areas in Communicationsfor the May June issues 1993 covering CDMA networks. Advanced Technology & Networks
VISTAR Telecommunications Inc. Ottawa Ontario K1G 3J4 Canada . He is ITU's Specialist Consultant and Chief Advisor for a number of ITU/UNDP projects including VSATs
Rural Networks Digital Broadc
In this paper, the performance of a new movable boundary accessing (MBA) technique for future integrated services multibeam satellite systems is studied. The multiservice environment considered includes both asynchron...
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In this paper, the performance of a new movable boundary accessing (MBA) technique for future integrated services multibeam satellite systems is studied. The multiservice environment considered includes both asynchronous and isochronous traffic consisting of video, voice, file transfer and interactive data. The movable boundary access technique proposed here will maximize the utilization of the up-link frame capacity. It is shown that the potential user population is substantially increased with the use of a moving boundary policy with minimal overhead.
It is well known that Cr sputtered on glass or NiP/Al substrates has either the (002) or (110) crystallographic texture (depending on the substrate temperature) and that the Co-alloy layers which are deposited on the ...
It is well known that Cr sputtered on glass or NiP/Al substrates has either the (002) or (110) crystallographic texture (depending on the substrate temperature) and that the Co-alloy layers which are deposited on the Cr underlayers have either the (1120) or (1011) textures respectively. However, the dependence of the crystallographic textures on other sputtering parameters is not clear. We report here on the study of the dependence of crystallographic textures of CoCrTa/Cr films on substrate bias. It is found that both Cr (110) and Cr (002) textures can form at elevated temperature, depending on the substrate bias. The development of the crystallographic texture is discussed with a model. It is also found that the epitaxy of CoCrTa layer depends on the sputtering conditions of both the Cr and the CoCrTa layers. The extrinsic magnetic properties (such as Hc, S and S*) of thin films with various textures are also presented. By controlling the sputtering procedure, the effects of crystallographic textures on magnetic properties were separated from the effects of film morphology.
In this paper we propose a new stability theorem for linguistic fuzzy model systems. The model used here is a continuous version of Tanaka and Sugeno's model by which nonlinear system can be identified precisely. ...
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In this paper we propose a new stability theorem for linguistic fuzzy model systems. The model used here is a continuous version of Tanaka and Sugeno's model by which nonlinear system can be identified precisely. This theorem enables us to check the stability of fuzzy model by solving certain simple matrix equations. A simple example is also included to illustrate an application of the method.
作者:
Markovié, M.L.Fraissler, W.F.Milorad L. Marković (1960) received the Dipl.-Ing. and M.Sc. degrees in electrical engineering from the University of Beognd in 1984 and 1990
respectively. From 1985 to 1991 he was at the Institute “Mihajlo Pupin” Beo-grad up to 1987 in the Operation Research group afterwards in the Power System group. In 1990/91 he spent a year at the Austrian Electricity Board (Verbundgesellschaft VG) in Vienna/Austria on a pilot project for expert-system application for operation scheduling. Since September 1991 he is a staff member of the central dispatching department of the VG. His research interests are application of the operations research methods and expert systems in power system control and operation. (Öster-reichische Elektrizitätswirtschafts-AG (Verbundgesellschaft) Hauptlastverteiler Am Hof 6a A-1010 Wien/Austria T +431/531 13 - 23 68 Fax +431/531 13 - 23 16) Walter F. Fraissler (1961) received the Dip1.-Ing. degree in 1984
and the Doctoral degree in 1988 both in Applied Mathematics from the University of Technology of Vienna/Austria. He started his professional experience 1984 as a research assistant at the Department of Economics of the University of Vienna. 1986/87 he attended the Institute for Advanced Studies in Vienna and in 1987 he joined the Austrian Electricity Board (Verbundgesellschaft) in its Electronic Data Processing department. His main interests are applications of econometric and Operations Research methods including expert system technology. (Österreichische Elektrizitätswirtschafts-AG (Verbundgesellschaft) Daten verarbeitung Am Hof 6a A-1010 Wien/Austria T +431/531 13 - 2948 Fax +431/531 13- 4191)
Short‐Term Load Forecast at Verbundgesellschaft (VG ‐ the Austrian Electricity Board) is presented. As the VG has only regional utilities and large industries as purchasers, classical forecast methods are not approp...
Accuracy requirements are usually determined as a percentage of the specification range of the measured part or process. Setting accuracy requirements in this manner results in a wide and unpredictable range of false ...
Accuracy requirements are usually determined as a percentage of the specification range of the measured part or process. Setting accuracy requirements in this manner results in a wide and unpredictable range of false rejection and acceptance probabilities. This causes extra costs due to either: 1) over specification of measurement systems accuracy requirements;2) time, effort, retesting, and resolution of false rejections;or 3) system degradation caused by false acceptance of out-of-specification parts. Achieving a consistent and known risk of false acceptance is only possible by considering the measured process C(pk), the process's mean in relation to the center of the specification range, and the measurement system error distribution. This paper presents a method for calculating the probabilities of false rejection and false acceptance for a normal process which is measured with, alternately, uniform and normally distributed error. It is shown that under most conditions uniform error causes 20% to 30% higher false rejection and acceptance probabilities. Thus, knowledge of measurement error distribution could provide lower total production cost.
The cross-sectional structure of CoNiCr/Cr bilayer and multilayer thin films is investigated by HRTEM. Results showed that the orientation relationship between CoNiCr and Cr and the crystallographic orientation of CoN...
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The cross-sectional structure of CoNiCr/Cr bilayer and multilayer thin films is investigated by HRTEM. Results showed that the orientation relationship between CoNiCr and Cr and the crystallographic orientation of CoNiCr is controlled by the orientation of the Cr column. Similar results are found for the multilayer film. The crystallographic orientation of the Cr interlayer and the second CoNiCr layer is identical to that of the Cr underlayer and the first CoNiCr layer. The misfit at the interface is partially relieved by misfit dislocations and the rest remains as elastic strain.
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