检索结果-内蒙古大学图书馆

IEEE International Conference on Semiconductor Electronics (ICSE)

作者： P.T. Lai X. Zeng G.Q. Li W.T. Ng Department of Electrical & Electronic Engineering University of Hong Kong Hong Kong China Department of Applied Physics South China University of Technology China Department of Electrical & Computer Engineering University of Toronto Canada

Low-energy (550 eV) argon-ion beam was used to bombard directly the backsurface of n-MOSFET's with nitrided gate dielectric after the completion of all conventional processing steps. The sub-threshold characteristics, saturation drain current and electrical stability under hot-carrier stress of the MOS devices were shown to be improved under suitable treatments. The mechanism of stress relief at the Si/oxynitride interface was proposed to account for the improvements.

关键词： MOSFET circuits Dielectrics Stress Argon Hot carriers Nitrogen Temperature Rapid thermal annealing MOS capacitors Degradation

来源：评论

学校读者我要写书评

暂无评论

Intracavity quantum-well photodetection of a vertical-cavity surface-emitting laser

Intracavity quantum-well photodetection of a vertical-cavity...

引用

IEEE International Semiconductor Laser Conference

作者： S.F. Lim G.S. Li W. Yuen C.J. Chang-Hasnain Department of Physics University of Stanford Stanford CA USA Department of Electrical Engineering and Computer Science University of California Berkeley Berkeley CA USA Department of Applied Physics University of Stanford Stanford CA USA Department of Electrical Engineering University of Stanford Stanford CA USA

We demonstrate the first intracavity InGaAs quantum-well photodetector within a VCSEL laser diode. Effective responsivity is as high as 0.23 A/W; dark current is less than 1 nA, limited by our noise floor. In this work, we present experimental results of the first VCSEL with an intracavity quantum-well photodetector. The quantum well with its embedded position prevents stray light from interfering with the power detection and monitoring while its thin active region minimizes the dark current.

关键词： Vertical cavity surface emitting lasers Quantum well lasers Surface emitting lasers Detectors Dark current Distributed Bragg reflectors Photodetectors Monitoring Stray light Quantum well devices

来源：评论

学校读者我要写书评

暂无评论

Optimal-availability placement of replicated data in distributed systems

Optimal-availability placement of replicated data in distrib...

引用

International Phoenix Conference on computers and Communications (IPCCC)

作者： D.M. Lazoff A.B. Stephens Applied Physics Laboratory Johns Hopkins University Laurel MD USA Department of Computer Science and Electrical Engineering University of Maryland Baltimore County Baltimore MD USA

We investigate the problem of placing data in a distributed system in order to maximize data availability in the presence of network failures. In particular, we consider optimal placements of non-replicated and replicated data in networks with small probability of link failure. We show that an optimal location for non-replicated data must lie within a weighted median of the component tree composed of network bridges and 2-edge-connected components. We show that optimal placements of replicated data for read requests must allocate copies to the leaves of a k-tree core of the component tree. We show that optimal placements for write requests must be solutions to a packing optimization problem on the component tree.

关键词： Access protocols Control systems Availability Intelligent networks physics Laboratories Bridges Communication system control Content addressable storage computer science

来源：评论

学校读者我要写书评

暂无评论

Design of an agile manufacturing workcell for light mechanical applications

Design of an agile manufacturing workcell for light mechanic...

引用

IEEE International Conference on Robotics and Automation (ICRA)

作者： R.D. Quinn G.C. Causey F.L. Merat D.M. Sargent N.A. Barendt W.S. Newman V.B. Velasco A. Podgurski Ju-Yeon Jo L.S. Sterling Yoohwan Kim Department of Mechanical and AeroSpace Engineering Case Western Reserve University Cleveland OH USA Department of Electrical Engineering and Applied Physics Case Western Reserve University Cleveland OH USA Department of Computer Engineering and Science Case Western Reserve University Cleveland OH USA

This paper introduces a design for agile manufacturing workcells intended for light mechanical assembly of products made from similar components (i.e. parts families). We define agile manufacturing as the ability to accomplish rapid changeover from the assembly of one product to the assembly of another product. Rapid hardware changeover is made possible through the use of robots, flexible part feeders, modular grippers and modular assembly hardware. The flexible feeders rely on belt feeding and binary computer vision for Dose estimation. This has a distinct advantage over non-flexible feeding schemes such as bowl feeders which require considerable adjustment to changeover from one part to another. Rapid software changeover is being facilitated by the use of a real-time, object-oriented software environment, modular software, graphical simulations for off-line software development, and an innovative dual VMEbus controller architecture. These agile features permit new products to be introduced with minimal downtime and system reconfiguration.

关键词： Agile manufacturing Robotic assembly Hardware Group technology Grippers Belts computer vision Computational modeling Object oriented modeling programming

来源：评论

学校读者我要写书评

暂无评论

On the effects of test compaction on defect coverage

On the effects of test compaction on defect coverage

引用

VLSI Test Symposium

作者： S.M. Reddy I. Pomeranz S. Kajihara Dept. of Electr. & Comput. Eng. Iowa Univ. Iowa City IA USA Electrical and Computer Engineering Department University of Iowa IA USA Applied Physics Department Osaka University Suita Japan

We study the effects of test compaction on the defect coverage of test sets for modeled faults. Using a framework proposed earlier, defects are represented by surrogate faults. Within this framework, we show that the defect coverage does not have to be sacrificed by test compaction, if the test set is computed using appropriate test generation objectives. Moreover, two test sets, one compacted and one non-compacted, generated using the same test generation objectives, typically have similar defect coverages, even if the compacted one is significantly smaller than the uncompacted one. Test generation procedures and experimental results to support these claims are presented.

关键词： Compaction Circuit faults Fault detection Circuit testing Cities and towns electrical fault detection physics computing Delay Voltage Test pattern generators

来源：评论

学校读者我要写书评

暂无评论

Velocity matching for field-induced electrooptic modulators

Velocity matching for field-induced electrooptic modulators

引用

Microwave, MTT-S International Symposium

作者： F. Masot K.A. Remley R.T. Kollipara A. Weisshaar V.K. Tripathi Department of Applied Physics University of Seville Seville Spain Department of Electrical and Computer Engineering Oregon State University Corvallis OR USA Oregon State University Corvallis OR US Dept. of Electr. & Comput. Eng. Oregon State Univ. Corvallis OR USA

A capacitively loaded structure is proposed for synchronizing the microwave and optical signals in a field-induced multiple quantum well traveling-wave electrooptic modulator. The design procedure for the modulating s... 详细信息

关键词： Electrooptic modulators Microstrip Optical modulation Optical waveguides High speed optical techniques Capacitance Quantum well devices Periodic structures Gallium arsenide Impedance

来源：评论

学校读者我要写书评

暂无评论

Book reviews

引用

Minds and Machines 1996年第2期6卷 239-285页

作者： Abbott, Barbara Herskovits, Annette Peterson, Philip L. Mele, Alfred R. Cole, David J. Crevier, Daniel Pelletier, Francis Jeffry Berkeley, Istvan S. N. Kitts, Brendan J. Brown, Mike Paliouras, George Department of Linguistics and Languages Michigan State University East Lansing USA Department of Philosophy Michigan State University East Lansing USA Program in Applied Linguistics Boston University Boston USA Department of Philosophy Syracuse University Syracuse USA Department of Philosophy Davidson College Davidson USA Department of Philosophy University of Minnesota Duluth USA Department of Electrical Engineering École de Technologie Supérieure Université du Québec Montréal Canada Department of Philosophy University of Alberta Edmonton Canada Department of Computing Science University of Alberta Edmonton Canada Biological Computation Project University of Alberta Edmonton Canada Center for Complex Systems Brandeis University Waltham USA Department of Computer Science University of Manchester Manchester U.K.

来源：评论

学校读者我要写书评

暂无评论

Degradation mechanism of contact resistance during window formation

引用

ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS 1996年第1期79卷 93-100页

作者： Sekine, M Kakuhara, Y Kikkawa, T Nonmember NEC ULSI Device Development Laboratory Sagamihara Japan 229 Graduated in 1985 from Department of Metal Materials Osaka University where he received his Master's degree in 1988. He joined NEC in 1988. Graduated in 1984 from the Department of Electrical Engineering Aoyama Gakuin University and she received her Master's degree from Shinshu University in 1986. She joined NEC in 1986. She is a member of the Applied Physics Society. Graduated in 1974 from the Department of Electrical Engineering Shizuoka University where he received his Master's degree in 1976. He received his Ph.D. degree from Tokai University. He joined NEC in 1976. He is engaged in research and development of semiconductor LSI device and process. He was a Visiting Researcher at MIT from 1983 to 1984. He is currently a director of multilayer wire formation program ULSI Device Development Institute. He is a member of IEEE ICS and Applied Physics Society.

This paper describes a contact degradation mechanism during window formation followed by selective tungsten chemical vapor deposition (W-CVD). Contact resistances by using selective W-CVD were increased as the overetching rate increased. Surface analysis made it clear that the Si surface at the bottom of contact was damaged and oxygen atoms from dielectrics were introduced during window etching. These damage and oxygen atoms break Si-Si bonds and make Si-O bonds after additional ion implantation. The Si-O bonds degrade the valence-band density of states of the Si surface. Such a damaged surface will not react with WF6. This inactivation is the reason for contact degradation. Controlling the Si surface state by using the chemical dry etching (CDE) technique solves this problem.

关键词： selective W-CVD contact chemical dry etch

来源：评论

学校读者我要写书评

暂无评论

Correction to "Theory for Passive Mode-Locking in Semiconductor Laser Structures Including the Effec

引用

IEEE Journal of Quantum Electronics 1996年第11期32卷 2017-2017页

作者： R.G.M.P. Koumans R.A. Salvatore D. Eliyahu R. van Roijen Department of Electrical Engineering California Institute of Technology Pasadena CA USA Electrical and Computer Engineering Department University of California Santa Barbara CA USA Department of Applied Physics California Institute of Technology CA USA Philips Laboratories Briarcliff Manor NY USA

来源：评论

学校读者我要写书评

暂无评论

Affordability, logistics R&D and fleet systems

引用

NAVAL ENGINEERS JOURNAL 1996年第3期108卷 199-213页

作者： Schulte, DP Skolnick, A He has supported the development and operation of several naval systems including advanced component selection for Trident II fire control and navigation systems. He served as branch manager of the Surface Ship ASW Combat System Branch which acted as the acquisition engineering agent for the AN/SQQ-89 Surface Ship Anti-Submarine Warfare Weapon System. He was then selected to manage the Module Engineering Department which provided engineering support to numerous naval systems including the AN/BSY-1 Submarine Combat System and the Trident II fire control and navigation system. He then served as the deputy program manager for NAVSEA Progressive Maintenance (2M/ATE). He holds a B.S. degree in Electrical Engineering from Purdue University and currently is pursuing a Maste's degree in Public Environmental Affairs at Indiana University—Purdue University Indianapolis. He served at Applied Physics Laboratory/The Johns Hopkins University in missile development then aboard USS Boston (CAG-1) and played leading roles in several weapon system developments (Regulus Terrier Tartar Talos) inertial navigation (Polaris) deep submergence (DSRV) and advanced ship designs (SES). He later was director Combat System Integration Naval Sea Systems Command and head Combat Projects Naval Ship Engineering Center. He led the Navy's High Energy Lasers and Directed Energy Weapons development efforts. He was vice president advanced technology at Operations Research Inc. and vice president maritime engineering at Defense Group Inc. before starting SSC in 1991. Dr. Skolnick holds a B.S. degree in Mathematics and Economics Queens College an M.A. degree in Mathematics and Philosophy Columbia University an M.S. degree in Electrical/Aeronautical Engineering U.S. Naval Postgraduate School and a Ph.D. in Electrical Engineering and Applied Mathematics from Polytechnic University in New York. He is the author of many published papers on engineering design issues source selection procedures and large-scale complex technology problems

The Fleet continues to require high performance systems that can operate with dependability in the seas' unforgiving environments and under hostile action. Those demands are not new. What has changed is the urgent priority formerly assigned to national defense issues. The arguments for continued superpower military strength are now roiled in politics along with unsettled budgets and uncertain force level projections. Current expectations revolve about indefinite fiscal and operational issues (difficult funding constraints and broadband threats). In the actual event of ''doing more with less,'' a practical response is to apply the creative power available from sound engineering judgement and the crucible of experience to the immediate needs of the Fleet. The attempt to shorten the path between advanced development effort and Fleet use has been tried occasionally in the past, often, without exemplary results. The Sustainable Hardware and Affordable Readiness Practices (SHARP) program, is a generic R&D effort under OpNav sponsorship that has been working steadily on sensible solutions to product engineering problems. Armed today with fast-time, large-scale computation abilities and modern tools for technical problem solving coupled with specialized engineering knowledge, it has been refreshed and is underway satisfying existing Fleet needs. The relationship between fully responsive engineering services and current operational needs is always demanding. The connection between advanced engineering development (6.3 category funds) and immediate Fleet usage brings added complexity and challenge, both technical and organizational. Illustrative examples of affordable engineering solutions to ''retain, revise, replace or retire'' questions are presented within the context of both Fleet realities and budgetary limitations. The discussion covers legacy system support, civil/military considerations and Fleet maintenance issues. It describes the substantial and critical payoffs i

关键词： Warships

来源：评论

学校读者我要写书评

暂无评论

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

请选择保存的检索档案：

请选择收藏分类：

通借通还

建议与咨询 留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

时间限定

文献类型

馆藏选择

核心期刊

语言

文献类型

帮助

文字说明：

检索规则说明：

检索范例：

分类表

所选分类

限定检索结果

文献类型

馆藏范围

日期分布

学科分类号

主题

机构

作者

语言

请选择保存的检索档案： 新增检索档案 确定 取消

请选择收藏分类： 新增自定义分类 确定 取消

通借通还

建议与咨询留下您的常用邮箱和电话号码，以便我们向您反馈解决方案和替代方法

请选择保存的检索档案：

请选择收藏分类：