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检索条件"机构=Department of Engineering Systems and Automation and Architecture and Computer Technology"
1195 条 记 录,以下是1081-1090 订阅
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A robust method for unknown forms analysis
A robust method for unknown forms analysis
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International Conference on Document Analysis and Recognition
作者: Li Xingyuan D. Doermann Weon-Geun Oh Wen Gao Department of Computer Science and Engineering Harbin Institute of Technology Harbin China Center for Automation Research University of Maryland College Park MD USA Computer Vision Laboratory Systems Engineering Research Institute Taejon South Korea
This paper proposes a strategy for analyzing unknown, filled forms. First, horizontal and vertical line segments are detected, extracted and filtered. A recursive splitting and merging algorithm eliminates overlapping... 详细信息
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Port interference faults in two-port memories
Port interference faults in two-port memories
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IEEE International Test Conference
作者: S. Hamdioui A.J. Van De Goor Intel Corporation Santa Clara CA USA Section Computer Architecture & Digital Technique Department of Electrical Engineering Faculty of Information Technology and Systems Delft University of Technnology Delft Netherlands
A two-port memory contains two similar ports, which can be accessed separately and independent of each other. In this paper, logical fault models are derived for the effect of shorts between the ports. The result is a... 详细信息
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Superconducting processors for HTMT: issues and challenges
Superconducting processors for HTMT: issues and challenges
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Frontiers of Massively Parallel Computation
作者: K.B. Theobald G.R. Gao T.L. Sterling Computer Architecture and Parallel Systems Laboratory Department of Electrical and Computer Engineering University of Delaware Newark DE USA NASA Jet Propulsion Laboratory /Center for Advanced Computing Research California Institute of Technology Pasadena CA USA
The Hybrid technology Multi-Threading project is a long-term study of the feasibility of combining several emerging technologies to reach 1 petaFLOPS within ten years. HTMT will combine high-speed superconductor proce... 详细信息
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Industrial evaluation of DRAM tests
Industrial evaluation of DRAM tests
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Design, automation and Test in Europe Conference and Exhibition
作者: A.J. van de Goer J. de Neef Dept. of Electr. Eng. Delft Univ. of Technol. Netherlands Faculty of Information Technology and Systems Department of Electrical Engineering Section Computer Architecture and Digital Technique Delft University of Technnology Delft Netherlands
This paper presents the results of 44 well known memory tests applied to 1896 1M*4 DRAM chips, using up to 96 different stress combinations with each test. The results show the importance of selecting the right stress... 详细信息
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A low-risk approach to mobile robot path planning  11th
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11th International Conference on Industrial and engineering Applications of Artificial Intelligence and Expert systems, IEA-1998-AIE
作者: Kruusmaa, Maarja Svensson, Bertil Chalmers University of Technology Department of Computer Engineering GothenburgS-412 96 Sweden Halmstad University Centre for Computer Systems Architecture Box 823 HalmstadS-30 118 Sweden
This paper presents a self-organizing approach for mobile robot path planning problems in dynamic environments by using case-based reasoning together with a more conventional method of grid-map based path planning. Th... 详细信息
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Editorial
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Real-Time systems 1998年 第3期14卷 217-218页
作者: Wikander, Jan Svensson, Bertil Department of Machine Design Mechatronics Lab Royal Institute of Technology Stockholm Sweden Department of Computer Engineering Chalmers University of Technology Gothenburg Sweden Centre for Computer Systems Architecture Halmstad University Halmstad Sweden
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The VEGA moderately parallel MIMD, moderately parallel SIMD, architecture for high performance array signal processing
The VEGA moderately parallel MIMD, moderately parallel SIMD,...
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International Symposium on Parallel Processing
作者: M. Taveniku A. Ahlander M. Jonsson B. Svensson Ericsson Microwave Systems AB Molndal Sweden Department of Computer Engineering Chalmers University of Technology Gothenburg Sweden Centre for Computer Systems Architecture Halmstad University Halmstad Sweden
In array radar signal processing applications, the processing demands range from tens of GFLOPS to several TFLOPS. To address this, as well as the, size and power dissipation issues, a special purpose "array sign... 详细信息
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Consequences of port restrictions on testing address decoder faults in two-port memories
Consequences of port restrictions on testing address decoder...
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Asian Test Symposium (ATS)
作者: S. Hamdioui A.J. van de Goor Faculty of Information Technology and Systems Department of Electrical Engineering Section of Computer Architecture & Digital Technique Delft University of Technnology Delft Netherlands
Testing two-port memories requires the use of single-port tests as well as special two-port tests; the test strategy determines which tests have to be used. Many two-port memories have ports which are read-only or wri... 详细信息
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Kinematic manipulability of general constrained rigid multibody systems
Kinematic manipulability of general constrained rigid multib...
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IEEE International Conference on Robotics and automation (ICRA)
作者: J.T. Wen L.S. Wilfinger Center for Advanced Technology in Automation Robotics & Manufacturing Department of Electrical Computer & Systems Engineering Rensselaer Polytechnic Institute RPI Troy NY USA
Extends the kinematic manipulability concept commonly used for serial manipulators to general constrained rigid multibody systems. Examples of such systems include multiple cooperating manipulators, multiple fingers h... 详细信息
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Consequences of port restrictions on testing two-port memories
Consequences of port restrictions on testing two-port memori...
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IEEE International Test Conference
作者: S. Hamdioui A.J. van de Goor Faculty of Information Technology and Systems Department o Electrical Engineering Section Computer Architecture & Digital Technique Delft University of Technnology Delft Netherlands
Testing two-port memories requires the use of single-port tests as well as special two-port tests; the test strategy determines which tests to be used. Many two-port memories have ports which are read-only or write-on... 详细信息
来源: 评论