Dexterous manipulation, which refers to the ability of a robotic hand or multi-fingered end-effector to skillfully control, reorient, and manipulate objects through precise, coordinated finger movements and adaptive f...
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This paper describes the progress in the development of virtual and remote laboratories at department of informationengineering and processcontrol, FCFT STU in Bratislava. Article is the overview of technical soluti...
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Multiple-partite networks exist in the real world,such as engineering constructions consisted of workers and *** build up random multiple-partite network models and show their topological properties by means of well-k...
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ISBN:
(纸本)9781509001668
Multiple-partite networks exist in the real world,such as engineering constructions consisted of workers and *** build up random multiple-partite network models and show their topological properties by means of well-known methods appeared in the Barab ′asi-Albert *** find some new characters of the Barab ′asi-Albert model and BA-type models,and show a connection between the degree distribution P(k) and the cumulative distribution Pcum(k),and discuss the velocities of the models for the goal of classifying network models.
The paper presents an approach to PI controller design for systems with varying time delay, which can be interpreted as systems with interval parametric uncertainty. The transfer function of the controlled system is m...
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ISBN:
(纸本)9783902661715
The paper presents an approach to PI controller design for systems with varying time delay, which can be interpreted as systems with interval parametric uncertainty. The transfer function of the controlled system is modified by approximation of the time delay term by its Pade expansion or Taylor expansion in the numerator. PI controllers, that are able to assure robust stability of the feedback closed loop with the modified controlled system are found by the graphical method. Then the pole-placement method is used to specify those controller parameters, which assure certain quality of the control performance. Designed PI controllers are implemented using PLC SIMATIC S7-300 and tested by experiments on a laboratory electronic equipment with varying time delay.
Active infrared thermography is an important non-destructive testing method used for revealing defect structures in materials. In many applications, thermographic data processing is necessary to extract defect feature...
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An agile software development approach for embedded systems has been transferred to automation and processcontrol. With using UML 1.4, an approach was developed, which allows to generate IEC 61131-3 code from an UML-...
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A novel heuristic model-based optimal scheduling algorithm is proposed in this paper to operate heating and cooling type home appliances connected to smart grids where the price of the electrical energy is known in ad...
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The contribution is focused on the design of optimal LQ (Linear Quadratic) controller when the YK (Youla{Kučera) controller parameterisation is used. We provide a procedure for computing a deterministic optimal SISO (...
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The trigger voltage walkin effect has been investigated by designing two different laterally diffused metal-oxide-semiconductor (LDMOS) transistors with an embedded silicon controlled rectifier (SCR). By inserting...
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The trigger voltage walkin effect has been investigated by designing two different laterally diffused metal-oxide-semiconductor (LDMOS) transistors with an embedded silicon controlled rectifier (SCR). By inserting a P+ implant region along the outer and the inner boundary of the N+ region at the drain side of a conventional LDMOS transistor, we fabricate the LDMOS-SCR and the SCR-LDMOS devices with a different triggering order in a 0.5/zm bipolar-CMOS-DMOS process, respectively. First, we perform transmission line pulse (TLP) and DC-voltage degradation tests on the LDMOS-SCR. Results show that the trigger voltage walk-in effect can be attributed to the gate oxide trap generation and charge trapping. Then, we perform TLP tests on the SCR-LDMOS. Results indicate that the trigger voltage walk-in effect is remarkably reduced. In the SCR-LDMOS, the embedded SCR is triggered earlier than the LDMOS, and the ESD current is mainly discharged by the parasitic SCR structure. The electric potential between the drain and the gate decreases significantly after snapback, leading to decreased impact ionization rates and thus reduced trap generation and charge trapping. Finally, the above explanation of the different trigger voltage walk-in behavior in LDMOS-SCR and SCR-LDMOS devices is confirmed by TCAD simulation.
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