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IEEE Topical Meeting on electrical Performance of Electronic Packaging (EPEPS)

作者： S. Simovich S. Mehrotra P. Franzon M. Steer Z. Rakib G. Simpson PICOLAB Department of Electrical and Computer Engineering North Carolina State University NC USA Cadence Design Systems Inc.

A new methodology is presented in which the signal integrity engineer and the design engineer interact with automation tools to produce a printed circuit board (PCB) or multi-chip module (MCM) layout. The focus is on ... 详细信息

关键词： Packaging Signal design design engineering Circuit noise Contacts Logic design Driver circuits design automation Printed circuits Multichip modules

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Algorithmic synthesis of high level tests for data path designs

Algorithmic synthesis of high level tests for data path desi...

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International Symposium on Fault-Tolerant Computing (FTCS)

作者： N.R. Saxena R. Tangirala A. Srivastava HaL Computer Systems Inc. Campbell CA USA Cadence Design Systems Inc. CA USA Department of Electrical Engineering University of lowa IA USA

Algorithmic techniques are proposed to synthesize design verification programs for high level data path designs that target design defects as well as manufacturing defects. Some categories of design defects are identified. A methodology, based on localized checking experiments, is proposed to synthesize state machine controllers in data path designs that enhance manufacturing defect coverage using design verification programs. Some example designs are considered that demonstrate the effectiveness of the proposed techniques. A heuristic to generate universal tests for manufacturing defect coverage is proposed. This heuristic has been successfully applied for real design implementations of counters, adders, and comparators.

关键词： Algorithm design and analysis Manufacturing Automatic test pattern generation Very large scale integration Automatic testing Semiconductor device modeling Adders Circuit faults Circuit testing Integrated circuit synthesis

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A robust physical and predictive model for deep-submicrometer MOS circuit simulation

A robust physical and predictive model for deep-submicromete...

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Custom Integrated Circuits Conference (CICC)

作者： J.H. Huang Z.H. Liu M.C. Jeng P.K. Ko C. Hu Department of Electrical Engineering and Computer Science University of California Berkeley CA USA Cadence Design Systems Inc. Santa Clara CA USA

An efficient physical and predictive model (the Berkeley short-channel insulated-gate FET model, or BSIM3) for deep-submicrometer MOSFETs is presented with emphasis on both digital and analog applications. BSIM3 has extensive built-in dependences of important dimensional and processing parameters such as channel length, width, gate oxide thickness, junction depth, substrate doping concentration, and LDD (lightly doped drain) structures. The model is compact, and time-consuming functions are excluded. The ease of parameter extraction was a major consideration. The number of parameters is small (/spl sim/25), and every parameter has a physical meaning; the effects of parameters on output characteristics are very predictive. This feature of BSIM3 makes statistical study of the device fabrication process possible. BSIM3 has been implemented in SPICE3 and the divergence problem is also greatly improved.

关键词： Robustness Predictive models Circuit simulation Doping Threshold voltage Semiconductor process modeling MOSFETs Parameter extraction Poisson equations Application software

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Dynamic variable reordering for BDD minimization

Dynamic variable reordering for BDD minimization

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European design Automation Conference

作者： E. Felt G. York R. Brayton A. Sangiovanni-Vincentelli Department of Electrical Engineering and Computer Science University of California Berkeley CA USA Cadence Design Systems Cadence Laboratories San Jose CA USA

Binary Decision Diagrams (BDDs) are a data structure frequently used to represent complex Boolean functions in formal verification algorithms. An efficient heuristic algorithm for dynamically reducing the size of large reduced ordered BDDs by optimally reordering small windows of consecutive variables is presented. The algorithms have been fully integrated into the Berkeley and Carnegie Mellon BDD packages in such a way that the current variable order dynamically changes and is completely transparent to the user. Dynamic reordering significantly reduces the memory required for BDD-based verification algorithms, thus permitting the verification of significantly more complex systems than was previously possible. The algorithms exhibit a smooth tradeoff between CPU time and reduction in BDD size for almost all BDDs tested.< >

关键词： Binary decision diagrams Packaging Boolean functions Data structures Logic testing Formal verification Minimization Circuits Adders Problem-solving

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Theory, Analysis and Implementation of an On-Line BIST Technique

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VLSI design 1993年第1期1卷 9-22页

作者： Sharma, Rajiv Saluja, Kewal K. Test Products Group Cadence Design Systems Inc. Lowell Massachusetts United States Department of Electrical and Computer Engineering University of Wisconsin Madison Wisconsin United States

A Built-in Concurrent Self-Test (BICST) technique for testing combinational logic circuits concurrently with their normal operation is proposed. Concept of sharing the test hardware between identical circuits to reduce the overall area overhead is introduced. The method was implemented in the design of an ALU with on-line test capability in CMOS technology. The additional hardware used for a 12-bit ALU was 19% of the total chip area and it did not impose any timing overhead on the operation of the ALU. The overhead decreases with an increase in the size of the ALU. Following the description of the BICST technique, measures for evaluating the performance of the BICST technique are defined. Methods for the computation of the performance measures using analytical and simulation techniques are discussed and results of these methods are reported. Methods for detecting intermittent faults and for computing the transient fault coverage using BICST are also described. The impact of BICST on the system diagnostics and system maintenance is discussed. © 1993, Gordon and Breach Science Publishers S.A.

关键词： Built-in self test Concurrent testing Intermittent faults Test latency Transient faults VLSI Testing

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TLM MODELING USING AN SIMD computer

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INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS 1993年第4期6卷 299-304页

作者： TAN, CC FUSCO, VF The Queen's University of Belfast Department of Electrical & Electronic Engineering Ashby Building Stranmillis Road Belfast BT9 5AH U.K. Chun Chia Tan obtained a first-class honours degree from The Queen's University of Belfast. He was awarded an IEE prize for best final-year project. His current research interests include the modelling of electromagnetic fields using parallel processing techniques. At present Mr Tan is working as an electrical engineer in Malaysia. Vincent F. Fusco was educated at The Queen's University of Belfast where he obtained the degree of Ph.D. He has worked as a research engineer on short-range radar and radio telementry systems. Currently he is a Reader in Microwave Commnications in the School of Electrical Engineering and Computer Science The Queen's Univeristy of Belfast. His current research interests include non-linear microwave circuit simulation and concurrent programming techniques for electromagnetic field problems. He has acted as consultant to a number of major companies and has published numerous research papers in these areas. He is author of the bookMicrowave Circuits Analysis and Computer Aided Design(Prentice Hall 1987). Dr Fusco is a Chartered Electrical Engineer and a Member of the Institute of Electrical Engineers.

A major limitation of the transmission-line matrix (TLM) method used to solve Maxwell's equations is the long computation time required. The TLM scattering calculations involved can, however, be viewed as parallel in nature. This paper describes an effort to reduce computational time by using an SIMD, DAP multiprocessor computer employed to solve a two-dimensional TLM electromagnetic field formulation. A parallel algorithm based on the TLM scattering algorithm is designed and implemented using FORTRAN-PLUS Enhanced on an AMT DAP 510 machine. Here the connectivity of the DAP is exploited to simulate the intrinsic scattering behaviour on which the TLM algorithm relies. The results show that parallel processing on an SIMD machine such as the DAP is advantageous, especially for higher-order mesh sizes.

关键词： Electric lines

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CONCURRENT BOUNDARY-ELEMENT COMPUTATION

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INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS 1993年第2期6卷 83-98页

作者： MCDOWALL, DS LEE, TW FUSCO, VF Microwave Research Group Department of Electrical and Electronic Engineering The Queen's University of Belfast Ashby Building Stranmillis Road Belfast BT9 5AH Northern Ireland U.K. D. Stewart McDowall was born in Dublin epublic of Ireland in 1967. He received the M. Eng. degree in Electrical and Electronic Engineering from the Queen's University of Belfast in 1990. In the same year he was presented with a Distinction Award from the Department of Education of Northern Ireland and he is currently pursuing his Ph.D. in the Microwave Research Group at Q.U.B. His principal research area is the electromagnetic field mapping of microwave systems using concurrient programming. He is an Associate Member of the Institute of Electrical Engineers. Lee Thaim Wee was awarded the degree of B. Eng. in Electronics from the Queen's University of Belfast in July 1991. He is currently serving in the Malaysian Armed Forces. Vincent F. Fusco was educated at the Queen's Univeristy of Belfast where he obtained the degree of Ph.D. in 1982. He has worked as a research engineer on short-range radar and radio telementry systems. Currently he is a reader in Microwave Communications in the School of Electrical Engineering and Computer Science the Queen's Univeristy of Belfast. His current research interests include non-linear microwave circuit simulation and concurrent programming techniques for electromagnetic field problems with particular emphasis on EMC applications. He has published numerous research papers in these areas. He is the author of the bookMicrowave Circuits Analysis and Computer Aided Design Prentice-Hall 1987. Dr Fusco is a Chartered Electrical Engineer and a Member of the Institute of Electrical Engineers.

A major limitation of the boundary element method (BEM) for the solution of electrical potential problems is the long computational time required. However, a large portion of the calculations involved can be viewed as being parallel in nature and can therefore be computed concurrently. This paper makes an effort to increase the efficiency of the BEM process using transputer-based multiprocessor computing techniques. The algorithms developed may equally well be applied to any multiprocessor system. The application selected to demonstrate the technique is the solution of an electrostatic problem governed by a two-dimensional Laplace equation. A parallel algorithm for problem setup and field extraction using BEM is designed and implemented on a transputer array. Special attention is directed to the utilization of the parallel processors to achieve maximum efficiency. The analysis in this work concentrates on the communication strategies for passing data between processors as well as a consideration of the workload attributed to each processor. The parallel algorithms were implemented using 3L Parallel Fortran;however, the choice of topology for the overall BEM implementation was limited by the fact that certain parts of the algorithm could only utilize a pipeline configuration of processors. Comprehensive results for the parallel BEM algorithm are given and they are encouraging, indicating that parallel processing has much to offer when applied to the boundary element method.

关键词： Boundary element method

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Measurements of power and current components in unbalanced and distorted three‐phase systems

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European Transactions on electrical Power 1993年第1期3卷 75-83页

作者： Andria, G. Salvatore, L. Savino, M. Trotta, A. Dr. Gregorio Andria (1956) AEI received the M. S. degree in Electrical Engineering from the State University of Bari/Italy in 1981 and the Ph. D. degree in Electrical Engineering in 1987 from the same University. From 1981 to 1983 he was working in the Electrotechnics and Electronics Department of the University of Bari as a member of the research team on electrical measurements. From 1984 to 1986 he was a Doctoral Fellow and currently he is a researcher in the same department. His research interests are in the fields of electrical and electronic measurements on components and systems including digital measurements for the analysis of electrical quantities in non-sinusoidal systems and the design of integrated optical sensors for measurement and control of non-electrical physical quantities. (Department of Electrotechnics and Electronics Faculty of Engineering polytechnic of Bovia E. Orabona 4 1-70125 Bari. Italy T +3980/242266 Fax + 3980/242410) Prof. Luigi Salvatore (1945) AEI received the degree in electrical engineering from the University of Bari/Italy in 1970. Since 1976 he has worked in the Electrotechnical and Electronic Department of the same University as a member of the research team on electrical machines. From 1983 to 1987 he was a researcher of electrical machines in the same department. Since 1987 he has been an Associate Professor of electrical machines at the University of Bari. At the present time his research interests include the control monitoring and diagnostics of AC drives and the areas of signal processing anddigital measurements on power electronics systems. (Department of Electrotechnics and Electronics Faculty of Engineering Polytechnic of Bari via E. Orabona 4 I-70125 Bari Italy T + 3980/242258 Fax + 3980/242410) Prof. Mario Savino (1947) AEI received the degree in Electrical Engineering from the University of Barif Italy in 1971. Since then he has been working in the Electrotechnical Institute of Bari until 1973 as researcher from 1973 to 1982 as Assistant Profe

The paper deals with the instantaneous power theory in three‐phase circuits by using the instantaneous time phasors of voltage and current. Particularly it is shown that the instantaneous components of the current time‐phasor in a rotating reference frame p‐q, oriented in such a way that the instantaneous voltage time‐phasor points to the p‐axis direction, represent the active and reactive currents. These components give rise to instantaneous real and imaginary powers, respectively. The spectral analysis of the above‐mentioned time‐phasors gives the harmonic symmetrical components of positive and negative sequence of voltage and current three‐phase systems. The line‐by‐line product of the voltage sequence spectrum by the complex conjugate of the current sequence spectrum gives the DC components of the instantaneous real and imaginary powers. The paper shows also that the instantaneous active and reactive currents are different from those defined on grounds of the Fryze's theory, which can be determined from the voltage and current sequence spectra. Copyright © 1993 John Wiley & Sons, Ltd.

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A general solution to the harmonics summation problem

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European Transactions on electrical Power 1993年第4期3卷 293-297页

作者： Lehtonen, M. Matti Lehtonen (1959) received his degrees of Master of Science and Licenciate of Technology both in electrical engineering from the Helsinki University of Technology HelsinkiEinland in 1984 and 1989 respectively. From 1984 to 1987 he was with the Consulting Company Ekono planning industrial power systems and developing computer aided design systems. Since 1987 he has been with Technical Research Centre of Finland. His main areas of interest are harmonics reactive power compensation ground fault protection and automation in electrical distribution networks. (Technical Research Centre of Finland Otakaari 7B SF-02 150 Espoo Finland T+3580/4566455 Fax +3580/4566538)

A general solution is presented for the probability density function of the amplitude of the sum of a number of harmonics from different sources. In the solution, the phase angles and amplitudes of component vectors may vary randomly in any given range. If these variation ranges are the same for all the component vectors, then ‐ in addition to them ‐ only arithmetic and geometric sums of the maximum amplitudes need to be known in order to calculate the parameters of the probability density function. Copyright © 1993 John Wiley & Sons, Ltd.

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Interactive tools for signal processing education. The signal processing instructional facility (SPIF lab) at Washington State University

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computer Applications in engineering Education 1993年第6期1卷 517-517页

作者： Bamberger, R.H. Signal Processing Instructional Facility School of Electrical Engineering and Computer Science Washington State University Pullman WA 99164-2752 Dr. Roberto H. Bamberger:was born on January 30 1965 in Buenos Aires Argentina. He received his B.E.E and PhD from the Georgia Institute of Technology in 1986 and 1990 respectively. Currently Dr. Bamberger is an assistant professor in the School of Electrical Engineering and Computer Science at Washington State University. Dr. Bamberger's research program is focused on the design implementation and application of multidimensional multirate filter banks subband image and video compression analysis of nonstationary data and application of digital signal processing techniques in the design of analog and mixed-mode integrated circuits. Dr. Bamberger is the founder and director of the Signal Processing Instructional Facility (SPIF Lab) at Washington State University. The SPIF Lab features interactive multimedia-based tools for teaching concepts related to linear systems theory. Dr. Bamberger is active in developing multimedia-based instructional laboratories for a variety of other topics as well. In addition to his teaching and research programs Dr. Bamberger is an associate editor for theIEEE Transactions on Signal Processingand a member of the editorial board forComputer Applications in Engineering Education. Dr. Bamberger is also advisor to the WSU Student Branch of the IEEE and assistant director of the WSU Cougar Marching Band. Dr. Bamberger is a member of Phi Eta Sigma Eta Kappa Nu Tau Beta Pi and Kappa Kappa Psi.

The Signal Processing Instructional Facility (SPIF Lab) is an experiment in using in interactive multimedia for teaching concepts related to linear systems theory and signal processing. The goals of the SPIF lab are to augment, enhance, and interconnect sophomore, junior, and senior level courses with the common thread of linear systems and transforms by unifying the experimentation medium. In this fashion, physical phenomenon is returned to the forefront of engineering education. The laboratory features powerful Mathematica Notebooks (a form of hypertext) and interactive applications that use dedicated DSP microprocessors.

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