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检索条件"机构=Departments of Electrical and Computer Engineering and Systems Design Engineering"
1271 条 记 录,以下是1181-1190 订阅
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Refinement of noisy correspondence using feedback from 3D motion
Refinement of noisy correspondence using feedback from 3D mo...
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Conference on computer Vision and Pattern Recognition (CVPR)
作者: Y.C. Kim K. Price Institute for Robotics and Intelligent Systems Departments of Computer Science and Electrical Engineering University of Southern California Los Angeles CA USA
In automated feature-based motion analysis of multiple frames, correspondence data are usually noisy and fragmented. A technique that gradually refines the initial noisy correspondence data and links fragments of a si... 详细信息
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A physical model for MOSFET output resistance
A physical model for MOSFET output resistance
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International Electron Devices Meeting (IEDM)
作者: Huang Liu Jeng Ko Hu Department of Electrical Engineering and Computer Sciences University of California Berkeley CA USA Cadence Design Systems Inc. Santa Clara CA USA
The output resistance (R/sub out/) most important device parameters for analog applications. However, it has been difficult to model R/sub out/ correctly. In this paper, we present a physical and accurate output resis... 详细信息
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A comparative study of bearing designs and operational environments for harmonic side-drive micromotors
A comparative study of bearing designs and operational envir...
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IEEE International Conference on Micro Electro Mechanical systems
作者: V.R. Dhuler M. Mehregany S.M. Phillips J.H. Lang Electronics Design Center Department of Electrical Engineering & Applied Physics Case Western Reserve University Cleveland OH USA Laboratory of Electromagnetic & Electronic Systems Department of Electrical Engineering & Computer Science Massachusetts Institute of Technology Cambridge MA USA
The authors report the development of flange bearing harmonic side-drive (referred to as wobble) micromotors and the results from a comparative study of the operation of flange and center-pin bearing micromotors in di... 详细信息
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DEGREES OF CYCLOSTATIONARITY AND THEIR APPLICATION TO SIGNAL-DETECTION AND ESTIMATION
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SIGNAL PROCESSING 1991年 第3期22卷 287-297页
作者: ZIVANOVIC, GD GARDNER, WA Computer Systems Design Laboratory “Boris Kidrič” Institute Vinča P.O. Box 522 11001 Belgrade Yugoslavia Signal Processing Group Department of Electrical Engineering & Computer Science University of California Davis CA 95616 USA
The problem of defining an appropriate measure of the degree of nonstationarity for stochastic processes that exhibit cyclostationarity is addressed. After discussing several candidate measures of degree of nonstation... 详细信息
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Analog Electronics For A High-speed High-precision electrical Impedance Tomograph
Analog Electronics For A High-speed High-precision Electrica...
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Annual International Conference of the IEEE engineering in Medicine and Biology Society (EMBC)
作者: D.G. Gisser J.C. Newell G. Saulnier C. Hochgraf R.D. Cook J.C. Goble Departments of Electrical Computer and Systems Engineering Biomedical Engineering and Computer Science Rensselaer Polytechnic Institute Troy NY USA
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A Phase Sensitive Voltmeter For A High-speed, High-precision electrical Impedance Tomograph
A Phase Sensitive Voltmeter For A High-speed, High-precision...
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Annual International Conference of the IEEE engineering in Medicine and Biology Society (EMBC)
作者: R.D. Cook G.J. Saulnier J.C. Goble Departments of Biomedical Engineering Electrical Computer and Systems Engineering and Computer Science Rensselaer Polytechnic Institute Troy NY USA
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A High-speed, High-precision electrical Impedance Tomograph
A High-speed, High-precision Electrical Impedance Tomograph
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Annual International Conference of the IEEE engineering in Medicine and Biology Society (EMBC)
作者: G.J. Saulnier R.D. Cook D.G. Gisser J.C. Goble C.G. Hochgraf D. Isaacson J.C. Newell Departments of Electrical Computer and Systems Engineering Biomedical Engineering Computer Science and Mathematics Rensselaer Polytechnic Institute Troy NY USA
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Efficient test generation for built-in self-test boundary-scan template
Efficient test generation for built-in self-test boundary-sc...
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1991 IEEE VLSI Test Symposium: Chip-to-System Test Concerns for the 90''s, VTEST 1991
作者: Nagvajara, P. Karpovsky, M.G. Levitin, L.B. Dept. of Electr. and Comput. Eng. Drexel Univ. PhiladelphiaPA United States Research Laboratory for Design and Testing of Computer and Communication Systems Department of Electrical Computer and System Engineering Boston University United States
An analysis and design of a pseudorandom pattern generator, (PRPG), based on a linear recurrence, for built-in self-test (BIST) boundary scan design is presented. The authors present for the case when r≥s, a design o... 详细信息
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Bridging, transition, and stuck-open faults in self-testing CMOS checkers
Bridging, transition, and stuck-open faults in self-testing ...
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International Symposium on Fault-Tolerant Computing (FTCS)
作者: S.D. Millman E.J. McCluskey Center For Reliable Computing Computer Systems Laboratory Departments of Electrical Engineering and Computer Science University of Stanford Stanford CA USA
The consequences of bridging, transition, and stuck-open faults in self-testing checkers designed only for single stuck-at faults are examined. A methodology for design that guarantees that the checkers will be self-t... 详细信息
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REFINED BOUNDS ON SIGNATURE ANALYSIS ALIASING FOR RANDOM TESTING
REFINED BOUNDS ON SIGNATURE ANALYSIS ALIASING FOR RANDOM TES...
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IEEE International Test Conference
作者: N.R. Saxena P. Franco E.J. McCluskey Center for Reliable Computing Computer Systems Laboratory Departments of Electrical Engineering and Computer Science University of Stanford Stanford CA USA
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