Prediction of machining errors and compensation for these enors during the tool path generation stage can improve the product quality significantly. A traditional approach would be machining a few parts, followed by a...
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PVD-TixSiyNz films formed by reactive RF-magnetron co-sputtering of Ti and Si in Ar/N2 are evaluated as a diffusion barrier between Cu and Si. A complete range of compositions are obtained by Ti targets inlaid with Si...
PVD-TixSiyNz films formed by reactive RF-magnetron co-sputtering of Ti and Si in Ar/N2 are evaluated as a diffusion barrier between Cu and Si. A complete range of compositions are obtained by Ti targets inlaid with Si. Film composition is controlled by the target ratio of titanium to silicon and N2 partial pressure. Electrical results versus thermal history for films of ∼6-18% Si as well as the composition and microstructure as determined by Rutherford back scattering (RBS), TEM and electron diffraction are reported. These films are an amorphous matrix with imbedded nanocrystals of titanium nitride as-deposited and undergo phase separation to yield titanium nitride and silicon nitride after a 1000r.C anneal. As-deposited compositions which lie above the TiN-Si3N4 phase line yield crystals of TiN. Compositions below the TiN-Si3N4 phase line yield crystals of Ti2N. Bulk resistivity as-deposited (<400µΩ-cmµ) is acceptable for use as a contact liner/barrier material and improves with annealing. Si pn-diodes metallized with 20nm Ti40Si15N45 and Cu show no significant increase in reverse leakage current at anneal temperatures below 700r.C.
We use a near-field scanning optical microscope (NSOM) to investigate microstructural defects at the fusion boundaries of SrTiO3 bicrystal substrates. The optical transmission across the fusion boundary shows circular...
We use a near-field scanning optical microscope (NSOM) to investigate microstructural defects at the fusion boundaries of SrTiO3 bicrystal substrates. The optical transmission across the fusion boundary shows circular dark spots with diameters varying from 0.1 to 1 fum that are distributed non-uniformly along the boundary. After detailed characterization of the substrates, a thin YBa2Cu3O7 (YBCO) film (∼ 40 nm) was deposited on a 24° bicrystal. Combining NSOM and scanning force microscopy, we show that these substrate defects can cause the grain boundary of a YBCO thin film grown on the bicrystal to wander up to 0.8 micron in the film. Strain fields associated with these substrate defects are attributed to their influence on YBCO growth. The relation between these structural defects and the electrical characteristics of YBCO grain boundary junctions are also discussed.
The relationship of the test results between the vibratory and cavitating jet methods was clarified experimentally. Six types of metallic specimens which were made of aluminum alloy, superduralumin, high-strength bras...
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The microstructural and luminescence properties of europium doped yttrium oxide (Y2O3:Eu) thin films deposited by metallorganic chemical vapor deposition are presented in this work. It was found that surface morpholog...
The microstructural and luminescence properties of europium doped yttrium oxide (Y2O3:Eu) thin films deposited by metallorganic chemical vapor deposition are presented in this work. It was found that surface morphology, crystallinity and photoluminescent emission properties are strongly dependent on substrate temperature during deposition. The depositions were carried out in a stainless steel chamber using yttrium and europium 2,2,6,6,-tetramethyl-3,5-heptanedionates as volatile precursors and O2 as the reactant gas. Post-annealing increased the crystallite size and decreased the lattice parameter, resulting in an increased photoluminescent emission intensity.
Phase equilibria were established in the ternary system Mn-Y-Zr for an isothermal section at 800 °C by use of X-ray powder diffraction, light optical microscopy and quantitative EPMA. No ternary compounds were ob...
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In fertilizer production, storage and handling, corrosion inhibitors play a very important role in ensuring the durability of the equipment and plant structures. The plants handle very corrosive raw materials and seve...
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In order to reduce production costs, it is of great interest to use longitudinal seam welds when manufacturing large diameter pipes. The cost reduction can be as high as 30%. However, severe inservice accidents for th...
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In order to reduce production costs, it is of great interest to use longitudinal seam welds when manufacturing large diameter pipes. The cost reduction can be as high as 30%. However, severe inservice accidents for this type of pipes working in the creep regime have occurred mainly due to mismatch match in weldment creep properties. In many cases, creep tests of cross-weld specimens, taken from the seam weld, are used to predict the behaviour of the seam weld assuming that the creep behaviour of specimen and weldment is equivalent. Experiences of this procedure indicate that further knowledge is required before translation between specimen and component can be made. In the present paper, both full scale seam welded pipes and cross-weld specimens are studied with the damage mechanics concept using finite element, FE, technique. The same mechanical model of multiple material zones is used for the two components. Both the influence of differences in creep properties between the weldment constituents and the size effect of the cross-weld specimen, are studied. It is found that the cross-weld test results can not directly be translated to the full scale component. Factors such as the creep properties and the relative geometry of the weldment constituents and the size of the cross-weld specimen have to be considered when performing creep life assessment.
Quantitative evaluation of selected sets of critical temperature and lattice parameter data for the orthorhombic compounds YBa2CU3O7-x and YBa2(Cu1-yFey)3O7-x reveals a strongly anisotropic dependence of the critical ...
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Quantitative evaluation of selected sets of critical temperature and lattice parameter data for the orthorhombic compounds YBa2CU3O7-x and YBa2(Cu1-yFey)3O7-x reveals a strongly anisotropic dependence of the critical temperature on these parameters, especially for YBa2Cu3O7-x. This method of deriving the relationship between critical temperature and changes in lattice constants is termed chemical pressure analysis (CPA). The signs of the anisotropic chemical pressure coefficients, k(i), for the critical temperature of YBa2Cu3O7-x are found to be opposite to those determined for anisotropically applied physical (mechanical) pressure and of greatly increased magnitude. One explanation for these differences may be that physical pressures do not alter chemical bonds in the same manner as do chemical pressures. For pressures below 4 GPa, both CPA and physical pressure results indicate that increasing hydrostatic pressure increases T(c), but chemical pressures are found to be more effective at increasing critical temperature than are physical pressures. Hydrostatic pressures above 4 GPa, however, decrease T(c). Since the fracture strength of real crystals limits the magnitude of the anisotropic physical stresses that can be applied, only CPA appears capable of yielding the anisotropic dependence of critical temperature on individual lattice parameters in the ultrahigh stress regime above 4 GPa.
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