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2010 IEEE 11th International Conference on Probabilistic Methods Applied to Power Systems, PMAPS 2010

作者： Kolczynski, Jakub Tylman, Wojciech Anders, George J. Dept. Microelectronics and Computer Science Technical University Lodz Lodz Poland Dept. EE and CS University of Toronto Toronto ON Canada

ISBN: (纸本)9781424457236

This paper discusses application of continuous probabilistic networks to leak detection in high-pressure, fluid-filled (HPFF) cables. An existing system for leak detection, build on discrete network, has a number of drawbacks - mainly the probability specification is difficult and quantization of input data has to be performed. An approach using continuous functions is proposed in the paper, which overcomes some restrictions of continuous probabilistic networks found in the literature. It introduces an algorithm for efficient utilization of the nonlinear functions in continuous networks. The existing discrete network, for assessing leak probability, is replaced with a continuous one. Number of tests is performed to verify operation of the leak detection system with the new network type. © 2010 IEEE.

关键词： Leak detection

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Substrate current and its correlation with degradation of poly-Si thin film transistors

Substrate current and its correlation with degradation of po...

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17th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2010

作者： Lu, Lei Wang, Mingxiang Wong, Man Dept. of Microelectronics Soochow University China Dept. of Electronic and Computer Engineering Hong Kong Univ. of Science and Technology Hong Kong

ISBN: (纸本)9781424455973

Substrate current (Isub) in poly-Si thin film transistors (TFTs) is first investigated by considering their specific substrate contact configuration. When the substrate bias is very small, Isub is driven by the recombination process in the channel region and is related to the trap density (Dt) wherein. Controlled by the gate bias (Vg), the recombination region varies from the whole channel area to a localized region near the drain, source or substrate terminal. Based on such observation, Isub is used to monitor the hot carrier degradation in TFTs. The Isub-Vg curve is applied to sensitively reflect the location of the hot carrier-induced damage region and evaluate the local D increase wherein. © 2010 IEEE.

关键词： Hot carriers

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Characterization of hot carrier degradation in n-type poly-Si TFTs under dynamic drain pulse stress with DC gate bias

Characterization of hot carrier degradation in n-type poly-S...

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17th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2010

作者： Zhang, Meng Wang, Mingxiang Lu, Xiaowei Wong, Man Dept. of Microelectronics Soochow University Suzhou China Dept. of Electronic and Computer Engineering Hong Kong University of Science and Technology Kowloon Hong Kong

ISBN: (纸本)9781424455973

Degradation of n-type poly-Si TFTs under drain pulse stress is investigated. It is first found that under fixed drain pulse stress on-state current degradation is gradually enhanced with DC gate bias varying from positive value to negative value. Moreover, for positive gate biases, two-stage degradation is observed. A correlation between on-state and off-state degradation is observed. Based on experimental and simulation results, the non-equilibrium PN junction degradation model is discussed and developed. © 2010 IEEE.

关键词： Drain current

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Instability of p-channel poly-Si thin-film transistors under dynamic negative bias temperature stress

Instability of p-channel poly-Si thin-film transistors under...

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17th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2010

作者： Zhou, Jie Wang, Mingxiang Wong, Man Dept. of Microelectronics Soochow University Suzhou 215006 China Dept. of Electronic and Computer Engineering Hong Kong University of Science and Technology Kowloon Hong Kong

ISBN: (纸本)9781424455973

Degradation of p-channel poly-Si thin-film transistors (TFTs) under dynamic negative bias temperature (NBT) stress has been investigated. Two-stage degradation behavior is first observed. In the first stage, significant positive threshold voltage (Vth) shift occurs. The dynamic effect which is associated with pulse falling time (tf) and amplitude may be responsible for the instability. Short tf and high amplitude will introduce more significant dynamic effect. After a long time stress, "turnaround" behavior in the Vth is observed. Equivalent DC negative bias temperature instability is the dominate degradation mechanism. © 2010 IEEE.

关键词： Thin films

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A new method for series resistance extraction in poly-Si thin-film transistors

A new method for series resistance extraction in poly-Si thi...

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2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology

作者： Zhou, Yan Wang, Mingxiang Wong, Man Dept. of Microelectronics Soochow University Suzhou 215006 China Dept. of Electronic and Computer Engineering Hong Kong Univ. of Science and Technology Hong Kong Hong Kong

ISBN: (纸本)9781424457984

A new method for extraction of series resistance is proposed for poly-Si thin-film transistors. In this method, the extraction procedure is insensitive to the variation in effective channel length and device mobility, since both quantities are included in a single extracted parameter. The method has been successfully applied to a group of poly-Si TFTs with mask channel length from 2 to 30μm. Compared with the estimated series resistance, the extracted result is reasonable. ©2010 IEEE.

关键词： Extraction

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Characterization of self-aligned metal electrodes poly-Si TFTs with Schottky barrier contact

Characterization of self-aligned metal electrodes poly-Si TF...

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2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology

作者： Chen, Jie Wang, Mingxiang Lv, Ping Wong, Man Dept. of Microelectronics Soochow University Suzhou 215006 China Dept. of Electronic and Computer Engineering Hong Kong Univ. of Science and Technology Hong Kong Hong Kong

A new type of polycrystalline silicon (poly-Si) thin-film transistors (TFTs) with self-aligned metal electrodes (SAME) is systematically characterized. New device features different from conventional poly-Si TFTs are ... 详细信息

ISBN: (纸本)9781424457984

关键词： Thin film transistors

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Large-scale battery system modeling and analysis for emerging electric-drive vehicles 10

Large-scale battery system modeling and analysis for emergin...

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Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design

作者： Li, Kun Wu, Jie Jiang, Yifei Hassan, Zyad Lv, Qin Shang, Li Maksimovic, Dragan Dept. of Electrical Computer and Energy Engineering University of Colorado Boulder CO 80309 United States Dept. of Computer Science University of Colorado Boulder CO 80309 United States TNLIST Inst. of Microelectronics Tsinghua University Beijing 100084 China

ISBN: (纸本)9781450301466

Emerging electric-drive vehicles demonstrate the potential for significant reduction of petroleum consumption and green- house gas emissions. Existing electric-drive vehicles typi- cally include a battery system consisting of thousands of Lithium-ion battery cells. Therefore, large-scale battery- system modeling and analysis is essential for battery sys- tem performance analysis, next-generation battery system design, and transportation electrification. This paper presents a modeling and analysis framework for large-scale Lithium-ion battery systems. The proposed solution models major run-time and long-term battery ef- fects, and uses fast frequency-domain analysis techniques. It enables efficient and accurate characterization of large- scale battery system run-time charge-cycle energy efficiency and long-term cycle life. Our solution is validated against physical measurements using real-world user driving studies. Copyright 2010 ACM.

关键词： Lithium-ion batteries

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Real-time constrained task scheduling in 3D chip multiprocessor to reduce peak temperature

Real-time constrained task scheduling in 3D chip multiproces...

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International Workshop on Wireless Network Algorithm and Theory

作者： Li, Jiayin Qiu, Meikang Niu, Jianwei Zhu, Yongxin Chen, Tianzhou Dept. of Electrical and Computer Engineering University of Kentucky Lexington KY 40506 United States State Key Lab. of Software Develop. Environment Beihang University Beijing 100191 China School of Microelectronics Shanghai Jiaotong University Shanghai 200240 China College of Computer Science Zhejiang University Hangzhou 310027 China

ISBN: (纸本)9780769543222

Chip multiprocessor technique has been implemented in embedded systems due to the tremendous computation requirements. Three dimension chip multiprocessor architecture has been studied recently for integrating more functionalities and providing higher performance. The high temperature on chip is a critical issue for the 3D architecture. In this paper, we propose an online thermal prediction model for 3D chip. Using this model, we present a task scheduling algorithm based on rotation scheduling to reduce the peak temperature on chip. We consider the data dependencies, especially the inter-iteration dependencies which are not well considered in most of the current thermal-aware task scheduling algorithms. Our simulation result shows that our algorithm can efficiently reduce the peak temperature up to 10 °C. © 2010 IEEE.

关键词： Embedded systems

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Joint channel estimation and Markov Chain Monte Carlo detection for frequency-selective channels

Joint channel estimation and Markov Chain Monte Carlo detect...

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Sensor Array and Multichannel Signal Processing Workshop

作者： Hong Wan Rong-Rong Chen Jun Won Choi Andrew Singer James Preisig Behrouz Farhang-Boroujeny Département de Physique Théorique et appliquée Commissariat Energie Atomique Bruyeres-le-Cheitel France Dept. of Microelectronics Soochow University Suzhou China STMicroelectronics Crolles France Dept. of Electronic and Computer Engineering The Hong Kong University of Science and Technology Kowloon Hong Kong China

In this paper, we develop a novel approach for joint channel estimation and Markov Chain Monte Carlo (MCMC) detection for time-varying frequency-selective channels. First, we propose a sequential channel estimation (SCE) MCMC algorithm that combines an MCMC algorithm for data detection, and an adaptive least mean square (LMS) algorithm for channel tracking, in a sequential fashion. Then we develop a stochastic expectation maximization (SEM) MCMC algorithm that takes advantage of both the MCMC approach and the EM algorithm to find jointly important samples of the transmitted data and channel impulse response (CIR). The proposed algorithms provide a low-complexity means to approximate the optimal maximum a posterior (MAP) detection in a statistical fashion and are applicable to channels with long memory. Excellent behavior of the proposed algorithms is presented using both synthetic channels and real data collected from actual underwater acoustic experiments.

关键词： Channel estimation Detectors Least squares approximation Decoding Markov processes Joints Signal processing algorithms

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A self-circulation structure for pipeline control

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Journal of Harbin Institute of Technology(New Series) 2009年第6期16卷 771-775页

作者：王兵彭瑞华王琴 Dept. of Computer Science Shanghai Jiaotong University Shanghai Research Center AMD Corporation Institute of Microelectronics Shanghai Jiaotong University

This paper proposes a circuit structure which can be used for both synchronous and asynchronous pipeline control. It is a self-circulation structure with embedded delay network, and a pipeline can be controlled by this structure with the interconnection of adjacent stages. This paper first proposes a basic circuit structure, then a linear pipeline is designed with self-circulation structure. The performance of linear pipeline is analyzed, and a 16-bit digital signal processor (DSP) with the structure is designed to prove the validity of the structure. Results show that about 10%-15% power consumption is saved with self-circulation structure compared with synchronous counterpart, while almost the same performance is achieved.

关键词： pipeline self-circulation timing analysis asynchronous circuit

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